Sacka
Germany
37
2011-01-20
25
2011-12-06
These are the the leading inventors for applications assigned to SUSS MicroTec Test Systems GmbH:
SUSS MicroTec Test Systems GmbH based in Sacka, DE has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Arrangement and method for focusing a multiplane image acquisition on a prober
#2 | 2010-11-25 ✅ Patent 8,402,848 granted on 2013-03-26Probe holder
#3 | 2010-11-18 ✅ Patent 8,497,693 granted on 2013-07-30Method for testing a test substrate under defined thermal conditions and thermally conditionable prober
#4 | 2010-04-29PROCESS FOR MEASURING THE IMPEDANCE OF ELECTRONIC CIRCUITS
#5 | 2010-02-25METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A SOLAR CELL
#6 | 2010-02-25PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL
#7 | 2010-02-04METHOD FOR IMPROVED UTILIZATION OF SEMICONDUCTOR MATERIAL
#8 | 2010-01-21APPARATUS AND METHOD FOR ASSEMBLING SEVERAL SEMICONDUCTOR DEVICES ONTO A TARGET SUBSTRATE
#9 | 2009-12-24 ✅ Patent 7,999,563 granted on 2011-08-16Chuck for supporting and retaining a test substrate and a calibration substrate
#10 | 2009-12-24METHOD FOR DETERMINATION OF ELECTRICAL PROPERTIES OF ELECTRONIC COMPONETS AND METHOD FOR CALIBRATION OF A MEASURING UNIT
#11 | 2009-07-16 ✅ Patent 7,932,737 granted on 2011-04-26Prober for testing devices in a repeat structure on a substrate
#12 | 2009-04-02 ✅ Patent 7,733,108 granted on 2010-06-08Method and arrangement for positioning a probe card
#13 | 2009-03-05 ✅ Patent 7,741,860 granted on 2010-06-22Prober for testing magnetically sensitive components
#14 | 2009-02-26MICROMANIPULATOR FOR MOVING A PROBE
#15 | 2009-01-22METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD
#16 | 2008-12-25 ✅ Patent 7,573,283 granted on 2009-08-11Method for measurement of a device under test
#17 | 2008-11-13Process for Measuring the Impedance of Electronic Circuits
#18 | 2008-08-14METHOD FOR DETERMINING MEASUREMENT ERRORS IN SCATTERING PARAMETER MEASUREMENTS
#19 | 2008-08-07 ✅ Patent 7,796,352 granted on 2010-09-14Device for rapidly changing objectives with the aid of threaded fastening
#20 | 2008-07-31 ✅ Patent 7,659,743 granted on 2010-02-09Method and apparatus for testing electronic components within horizontal and vertical boundary lines of a wafer
#21 | 2008-07-24 ✅ Patent 8,044,320 granted on 2011-10-25Method and apparatus for the correction of defective solder bump arrays
#22 | 2008-07-03ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBER
#23 | 2008-06-19 ✅ Patent 7,579,854 granted on 2009-08-25Probe station and method for measurements of semiconductor devices under defined atmosphere
#24 | 2008-05-29 ✅ Patent 7,769,555 granted on 2010-08-03Method for calibration of a vectorial network analyzer
#25 | 2008-05-29 ✅ Patent 7,579,849 granted on 2009-08-25Probe holder for a probe for testing semiconductor components
#26 | 2008-05-29 ✅ Patent 7,859,278 granted on 2010-12-28Probe holder for a probe for testing semiconductor components
#27 | 2008-05-29 ✅ Patent 7,768,271 granted on 2010-08-03Method for calibration of a vectorial network analyzer having more than two ports
#28 | 2008-05-22 ✅ Patent 8,278,951 granted on 2012-10-02Probe station for testing semiconductor substrates and comprising EMI shielding
#29 | 2008-05-22 ✅ Patent 7,652,491 granted on 2010-01-26Probe support with shield for the examination of test substrates under use of probe supports
#30 | 2008-05-22 ✅ Patent 7,560,942 granted on 2009-07-14Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus
#31 | 2008-02-21 ✅ Patent 7,671,615 granted on 2010-03-02Method and apparatus for controlling the temperature of electronic components
#32 | 2007-12-27 ✅ Patent 7,463,044 granted on 2008-12-09Adapter for positioning of contact tips
#33 | 2007-06-28 ✅ Patent 7,332,923 granted on 2008-02-19Test probe for high-frequency measurement
#34 | 2007-06-21 ✅ Patent 7,282,930 granted on 2007-10-16Device for testing thin elements
#35 | 2007-06-14 ✅ Patent 7,235,990 granted on 2007-06-26Probe station comprising a bellows with EMI shielding capabilities
#36 | 2007-03-22PROCESS FOR THE INSPECTION OF A VARIETY OF REPETITIVE STRUCTURES
#37 | 2006-09-21 ✅ Patent 7,265,536 granted on 2007-09-04Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station
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