Suwon
South Korea
10
2026-03-24
8
2026-03-24
These are the the leading inventors for applications assigned to Park Systems Corp.:
Park Systems Corp. based in Suwon, KR has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Measurement system with detection mechanism and method of operation thereof
#2 | 2026-03-24 ✅ Patent 12,584,942 granted on 2026-03-24Measurement system with detection mechanism and method of operation thereof
#3 | 2026-03-24 ✅ Patent 12,584,866 granted on 2026-03-24Measurement system with detection mechanism and method of operation thereof
#4 | 2011-11-10 ✅ Patent 8,402,560 granted on 2013-03-19Scanning probe microscope with drift compensation
#5 | 2010-08-26SCANNING PROBE MICROSCOPE CAPABLE OF MEASURING SAMPLES HAVING OVERHANG STRUCTURE
#6 | 2010-07-01 ✅ Patent 8,209,766 granted on 2012-06-26Scanning probe microscope capable of measuring samples having overhang structure
#7 | 2010-02-11 ✅ Patent 8,099,793 granted on 2012-01-17Scanning probe microscope with automatic probe replacement function
#8 | 2009-08-13SCANNING PROBE MICROSCOPE CAPABLE OF MEASURING SAMPLES HAVING OVERHANG STRUCTURE
#9 | 2008-06-26 ✅ Patent 7,709,791 granted on 2010-05-04Scanning probe microscope with automatic probe replacement function
#10 | 2008-03-27 ✅ Patent 7,514,679 granted on 2009-04-07Scanning probe microscope for measuring angle and method of measuring a sample using the same
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