Delft
Netherlands
5
2017-08-03
5
2020-05-12
These are the the leading inventors for applications assigned to DELMIC B.V.:
DELMIC B.V. based in Delft, NL has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope
#2 | 2016-12-29 ✅ Patent 10,132,753 granted on 2018-11-20Method and apparatus for determining a density of fluorescent markers in a sample
#3 | 2015-09-17 ✅ Patent 9,378,921 granted on 2016-06-28Integrated optical and charged particle inspection apparatus
#4 | 2015-04-23 ✅ Patent 9,715,992 granted on 2017-07-25Integrated optical and charged particle inspection apparatus
#5 | 2013-08-08 ✅ Patent 8,895,921 granted on 2014-11-25Inspection apparatus and replaceable door for a vacuum chamber of such an inspection apparatus and a method for operating an inspection apparatus
Also check out DELMIC B.V.'s (Delft, Netherlands) applicant profile with 3 patent applications submitted.
33378 ⎘