YieldBoost Tech, Inc.

City:

San Jose, California

Country:

United States

Published Applications:

Last publication date:

2006-12-26

Patent Grants:

Last grant date:

2006-12-26

Top Inventors for applications by YieldBoost Tech, Inc.

These are the the leading inventors for applications assigned to YieldBoost Tech, Inc.:

Kyo Young Chung 12 San Jose, CA United States

Recent patent applications by YieldBoost Tech, Inc.

YieldBoost Tech, Inc. based in San Jose, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2006-12-26 ✅ Patent 7,154,292 granted on 2006-12-26

US10388481

Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same

#2 | 2006-06-20 ✅ Patent 7,064,572 granted on 2006-06-20

US10402948

System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process

#3 | 2006-05-30 ✅ Patent 7,053,645 granted on 2006-05-30

US10455359

System and method for detecting defects in a thin-film-transistor array

#4 | 2006-05-09 ✅ Patent 7,042,244 granted on 2006-05-09

US10876644

Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same

#5 | 2006-04-04 ✅ Patent 7,024,338 granted on 2006-04-04

US10642617

System and method for improving TFT-array manufacturing yields

#6 | 2006-02-07 ✅ Patent 6,996,446 granted on 2006-02-07

US10437056

System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process

#7 | 2005-11-01 ✅ Patent 6,960,927 granted on 2005-11-01

US10435060

System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process

#8 | 2005-09-27 ✅ Patent 6,949,944 granted on 2005-09-27

US10445876

System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process

#9 | 2005-05-03 ✅ Patent 6,888,368 granted on 2005-05-03

US10413521

System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process

#10 | 2005-03-01 ✅ Patent 6,862,489 granted on 2005-03-01

US10355059

System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process

#11 | 2005-02-01 ✅ Patent 6,850,086 granted on 2005-02-01

US10402967

System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process

#12 | 2005-01-06 ✅ Patent 6,982,556 granted on 2006-01-03

US20050001646A1

Physics

System and method for classifying defects in and identifying process problems for an electrical circuit

AssigneeID:

362115 ⎘