Scan Technology Co., Ltd.

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2006-11-02

Patent Grants:

Last grant date:

2008-03-11

Top Inventors for applications by Scan Technology Co., Ltd.

These are the the leading inventors for applications assigned to Scan Technology Co., Ltd.:

Kiyoshi Yagita 3 Tokyo, Japan

Recent patent applications by Scan Technology Co., Ltd.

Scan Technology Co., Ltd. based in Tokyo, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2006-11-02 ✅ Patent 7,342,655 granted on 2008-03-11

US20060244959A1

Physics

Inspecting apparatus and method for foreign matter

#2 | 2005-07-05 ✅ Patent 6,914,672 granted on 2005-07-05

US10251234

Inspecting apparatus for foreign matter and inspecting mechanism thereof

#3 | 2005-06-28 ✅ Patent 6,911,653 granted on 2005-06-28

US10251259

Inspecting method and apparatus for foreign matter

AssigneeID:

403752 ⎘