Assignee profile:

UNITEST INC.

City:

Gyeonggi-do

Country:

South Korea

Published Applications:

11

Last publication date:

2019-05-30

Patent Grants:

10

Last grant date:

2020-12-22

Top Inventors for applications by UNITEST INC.

These are the the leading inventors for applications assigned to UNITEST INC.:

Recent patent applications by UNITEST INC.

UNITEST INC. based in Gyeonggi-do, KR has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2019-05-30 ✅ Patent 10,871,288 granted on 2020-12-22
US20190162406A1
Mechanical engineering

Sealed plasma melting furnace for treating low- and intermediate-level radioactive waste

#2 | 2015-04-02 ✅ Patent 9,613,718 granted on 2017-04-04
US20150095723A1
Physics

Detection system for detecting fail block using logic block address and data buffer address in a storage tester

#3 | 2015-04-02 ✅ Patent 9,378,846 granted on 2016-06-28
US20150095712A1
Physics

Non-mounted storage test device based on FPGA

#4 | 2015-03-05 ✅ Patent 9,411,700 granted on 2016-08-09
US20150067418A1
Physics

Storage tester capable of individual control for a plurality of storage

#5 | 2015-02-05 ✅ Patent 9,378,845 granted on 2016-06-28
US20150039953A1
Physics

System for simultaneously determining memory test result

#6 | 2015-02-05 ✅ Patent 9,312,030 granted on 2016-04-12
US20150039951A1
Physics

Apparatus and method for acquiring data of fast fail memory

#7 | 2015-02-05
US20150039264A1
Physics

DEVICE FOR CALCULATING ROUND-TRIP TIME OF MEMORY TEST USING PROGRAMMABLE LOGIC

#8 | 2015-02-05 ✅ Patent 9,197,212 granted on 2015-11-24
US20150035561A1
Electricity

Apparatus and method for correcting output signal of FPGA-based memory test device

#9 | 2008-02-07 ✅ Patent 7,739,572 granted on 2010-06-15
US20080034266A1
Physics

Tester for testing semiconductor device

#10 | 2006-12-14 ✅ Patent 7,288,949 granted on 2007-10-30
US20060279305A1
Physics

Semiconductor test interface

#11 | 2006-05-25 ✅ Patent 7,285,967 granted on 2007-10-23
US20060109017A1
Physics

Probe card having deeply recessed trench and method for manufacturing the same

Also check out UNITEST INC.'s (Gyeonggi-do, South Korea) applicant profile with 7 patent applications submitted.

AssigneeID:

87266 ⎘