Mechelen
Belgium
15
2022-03-03
The entities that hold a legal rights for patent applications filed by inventor VANDERVORST Wilfried:
Wilfried VANDERVORST from Mechelen, BE has applied for patents for these inventions. The list has both pending applications and granted patents:
Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample
#2 | 2020-01-30Device for measuring surface characteristics of a material
#3 | 2020-01-02CHARACTERIZATION OF REGIONS WITH DIFFERENT CRYSTALLINITY IN MATERIALS
#4 | 2019-09-12Method for determining the shape of a sample tip for atom probe tomography
#5 | 2019-01-24Device and method for two dimensional active carrier profiling of semiconductor components
#6 | 2018-08-23Method and apparatus for transmission electron microscopy
#7 | 2017-06-22Method for differential heating of elongate nano-scaled structures
#8 | 2015-07-02Probe configuration and method of fabrication thereof
#9 | 2012-04-05Laser Atom Probe and Laser Atom Probe Analysis Methods
#10 | 2011-04-28Method of Forming Mono-Crystalline Germanium or Silicon Germanium
#11 | 2010-07-08Wavelength-sensitive detector comprising photoconductor units each having different types of elongated nanostructures
#12 | 2009-12-17Method for cost-efficient manufacturing diamond tips for ultra-high resolution electrical measurements and devices obtained thereof
#13 | 2009-10-29Wavelength-sensitive detector with elongate nanostructures
#14 | 2008-10-30Method for fabricating a high-K dielectric layer
#15 | 2006-11-07System and method for measuring properties of a semiconductor substrate in a non-destructive way
1213902 ⎘