Inventor profile of:

Bas Hulsken

City:

Eindhoven

Country:

Netherlands

Published Applications:

17

Last publication date:

2019-07-04

Top Assignees for applications by Bas Hulsken

The entities that hold a legal rights for patent applications filed by inventor Hulsken Bas:

Recent patent applications by Hulsken Bas

Bas Hulsken from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2019-07-04
US20190205332A1
Physics

STORING AND RETRIEVING SPATIAL DATA IN/FROM A DATABASE

#2 | 2019-03-07
US20190075247A1
Electricity

System for generating a synthetic 2D image with an enhanced depth of field of a biological sample

#3 | 2019-02-14
US20190052793A1
Electricity

APPARATUS FOR GENERATING A SYNTHETIC 2D IMAGE WITH AN ENHANCED DEPTH OF FIELD OF AN OBJECT

#4 | 2018-09-06
US20180255321A1
Electricity

Method and apparatus for fast and efficient image compression and decompression

#5 | 2018-08-09
US20180225872A1
Physics

Information transformation in digital pathology

#6 | 2018-07-12
US20180196249A1
Physics

Method for simultaneous capture of image data at multiple depths of a sample

#7 | 2017-11-23
US20170336618A1
Physics

Method for simultaneous capture of image data at multiple depths of a sample

#8 | 2016-12-22
US20160373678A1
Electricity

Scanning imaging system with a novel imaging sensor with gaps for electronic circuitry

#9 | 2013-04-18
US20130093874A1
Electricity

Determining a polar error signal of a focus position of an autofocus imaging system

#10 | 2013-04-11
US20130089249A1
Physics

Image processing method in microscopy

#11 | 2013-03-07
US20130057674A1
Physics

Autofocus imaging for a microscope

#12 | 2012-11-15
US20120287256A1
Physics

Sensor for microscopy

#13 | 2012-02-09
US20120034623A1
Physics

Up-concentration of organic microobjects for microscopic imaging

#14 | 2011-12-01
US20110292200A1
Physics

Scanning microscope

#15 | 2011-06-09
US20110134254A1
Physics

MEASURING AND CORRECTING LENS DISTORTION IN A MULTISPOT SCANNING DEVICE

#16 | 2011-02-03
US20110025837A1
Physics

METHOD OF IMAGING A SAMPLE

#17 | 2010-12-16
US20100314533A1
Physics

SCANNING MICROSCOPE AND METHOD OF IMAGING A SAMPLE

InventorID:

124616 ⎘