Ithaca, New York
United States
25
2020-08-11
The entities that hold a legal rights for patent applications filed by inventor Chickermane Vivek:
Vivek Chickermane from Ithaca, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Devices and methods for test point insertion coverage
#2 | 2016-11-22Systems and methods for testing integrated circuit designs
#3 | 2016-10-11Systems and methods for testing integrated circuit designs
#4 | 2014-12-02Method and apparatus for low-pin count testing of integrated circuits
#5 | 2014-05-20Method and apparatus for automated extraction of a design for test boundary model from embedded IP cores for hierarchical and three-dimensional interconnect test
#6 | 2013-12-24Method and system for analyzing test vectors to determine toggle counts
#7 | 2013-11-26Method and apparatus to use physical design information to detect IR drop prone test patterns
#8 | 2013-11-12Testing to prescribe state capture by, and state retrieval from scan registers
#9 | 2013-08-20Method and mechanism for implementing electronic designs having power information specifications background
#10 | 2013-06-18Method and system for reducing switching activity during scan-load operations
#11 | 2013-05-07Method and apparatus to use physical design information to detect IR drop prone test patterns
#12 | 2013-03-05Method and apparatus to use physical design information to detect IR drop prone test patterns
#13 | 2012-12-18Method and apparatus to use physical design information to detect IR drop prone test patterns
#14 | 2012-10-23System and method for automated synthesis of circuit wrappers
#15 | 2012-10-23Fault modeling for state retention logic
#16 | 2012-10-09Method and apparatus to use physical design information to detect IR drop prone test patterns
#17 | 2011-08-16Scan testing architectures for power-shutoff aware systems
#18 | 2011-05-17Method and apparatus to detect manufacturing faults in power switches
#19 | 2011-02-08Testing to prescribe state capture by, and state retrieval from scan registers
#20 | 2011-01-25Method and apparatus to use physical design information to detect IR drop prone test patterns
#21 | 2010-04-06Low power scan test for integrated circuits
#22 | 2009-12-31Testing state retention logic in low power systems
#23 | 2009-05-07Distributed test compression for integrated circuits
#24 | 2008-03-20Test generation for low power circuits
#25 | 2007-10-18Method and mechanism for implementing electronic designs having power information specifications background
3941707 ⎘