Bremen
Germany
50
2026-04-30
The entities that hold a legal rights for patent applications filed by inventor GRINFELD Dmitry:
Dmitry GRINFELD from Bremen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
QUADRUPOLE MASS FILTER
#2 | 2026-03-12MULTI-REFLECTION MASS SPECTROMETER
#3 | 2026-02-12Ion Transport between Ion Optical Devices at Different Gas Pressures
#4 | 2026-01-08High resolution multi-reflection time-of-flight mass analyser
#5 | 2025-12-04METHOD FOR DETERMINING ABUNDANCE OF IONS
#6 | 2025-11-27Ion accumulation control for analytical instrument
#7 | 2025-11-06ELECTROSTATIC ION TRAP CONFIGURATION
#8 | 2025-07-03MULTI-REFLECTION TIME-OF-FLIGHT MASS ANALYSER WITH INDEPENDENT TRAPPING REGION
#9 | 2025-02-20MULTI-REFLECTION MASS SPECTROMETER
#10 | 2024-11-28MULTI-REFLECTION MASS SPECTROMETER
#11 | 2024-11-28METHOD FOR CALIBRATING A TIME-OF-FLIGHT MASS ANALYSER AND TIME-OF-FLIGHT MASS ANALYSER
#12 | 2024-11-21CHARGE DETECTION MASS SPECTROMETRY UTILIZING HARMONIC OSCILLATION AND SELECTIVE TEMPORAL OVERVIEW OF RESONANT ION (STORI) PLOTS
#13 | 2024-11-07METHODS FOR PERFORMING CHARGE DETECTION MASS SPECTROMETRY WITH TEMPORAL RESOLUTION
#14 | 2024-10-03Ion Trap with Elongated Electrodes
#15 | 2024-09-19COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER
#16 | 2024-07-25Voltage Supply for a Mass Analyser
#17 | 2024-07-25Ion Beam Focusing
#18 | 2024-06-20INTERFACE ION GUIDE
#19 | 2024-03-14ANALYTICAL INSTRUMENT WITH ION TRAP COUPLED TO MASS ANALYSER
#20 | 2024-02-29Electrostatic Ion Trap Configuration
#21 | 2024-02-15TIME OF FLIGHT MASS ANALYSER AND METHOD OF TIME OF FLIGHT MASS SPECTROMETRY
#22 | 2023-11-09Charge detection for ion accumulation control
#23 | 2023-10-12ION MIRROR
#24 | 2023-10-12Disambiguation of cyclic ion analyser spectra
#25 | 2023-10-05Analysis of time-of-flight mass spectra
#26 | 2023-09-14High resolution multi-reflection time-of-flight mass analyser
#27 | 2023-09-07Ion accumulation control for analytical instrument
#28 | 2023-04-27Method for Correcting Mass Spectral Data
#29 | 2023-04-20Ion Transport between Ion Optical Devices at Different Gas Pressures
#30 | 2022-12-29TIME-OF-FLIGHT MASS ANALYSERS
#31 | 2022-12-08Voltage supply for a mass analyser
#32 | 2022-11-17Method of gain calibration
#33 | 2022-10-06Ion trap
#34 | 2022-07-28Ion injection to an electrostatic trap
#35 | 2020-11-26Ion Trap with Elongated Electrodes
#36 | 2020-11-12MASS SPECTROMETER AND METHOD FOR TIME-OF-FLIGHT MASS SPECTROMETRY
#37 | 2019-11-28Ion front tilt correction for time of flight (TOF) mass spectrometer
#38 | 2018-12-20Mass spectrometer and method for time-of-flight mass spectrometry
#39 | 2018-05-17Multi-reflection mass spectrometer with deceleration stage
#40 | 2017-12-07Ion injection to an electrostatic trap
#41 | 2017-09-28Multi-reflection mass spectrometer
#42 | 2016-10-27Method of producing a mass spectrum
#43 | 2016-08-04Ion ejection from a quadrupole ion trap
#44 | 2016-01-07Multi-reflection mass spectrometer
#45 | 2016-01-07Multi-reflection mass spectrometer
#46 | 2015-11-26Ion ejection from a quadrupole ion trap
#47 | 2015-08-13Ion guide
#48 | 2015-01-29Multi-reflection mass spectrometer
#49 | 2015-01-29Multi-reflection mass spectrometer
#50 | 2013-11-21Methods and apparatus for obtaining enhanced mass spectrometric data
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