Inventor profile of:

Mustafa Badaroglu

City:

Leuven

Country:

Belgium

Published Applications:

31

Last publication date:

2024-03-21

Top Assignees for applications by Mustafa Badaroglu

The entities that hold a legal rights for patent applications filed by inventor Badaroglu Mustafa:

Recent patent applications by Badaroglu Mustafa

Mustafa Badaroglu from Leuven, BE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-03-21
US20240096790A1
Electricity

PORT LANDING-FREE LOW-SKEW SIGNAL DISTRIBUTION WITH BACKSIDE METALLIZATION AND BURIED RAIL

#2 | 2023-07-27
US20230238325A1
Electricity

Trench power rail in cell circuits to reduce resistance and related power distribution networks and fabrication methods

#3 | 2023-04-13
US20230115373A1
Physics

ACCUMULATOR FOR DIGITAL COMPUTATION-IN-MEMORY ARCHITECTURES

#4 | 2023-03-02
US20230065725A1
Physics

PARALLEL DEPTH-WISE PROCESSING ARCHITECTURES FOR NEURAL NETWORKS

#5 | 2023-02-16
US20230047364A1
Physics

PARTIAL SUM MANAGEMENT AND RECONFIGURABLE SYSTOLIC FLOW ARCHITECTURES FOR IN-MEMORY COMPUTATION

#6 | 2023-02-02
US20230037054A1
Physics

Digital compute in memory

#7 | 2023-02-02
US20230031841A1
Physics

FOLDING COLUMN ADDER ARCHITECTURE FOR DIGITAL COMPUTE IN MEMORY

#8 | 2023-01-26
US20230025068A1
Physics

HYBRID MACHINE LEARNING ARCHITECTURE WITH NEURAL PROCESSING UNIT AND COMPUTE-IN-MEMORY PROCESSING ELEMENTS

#9 | 2022-12-08
US20220392524A1
Physics

Digital compute-in-memory (DCIM) bit cell circuit layouts and DCIM arrays for multiple operations per column

#10 | 2018-04-26
US20180114848A1
Electricity

Semiconductor device having a gap defined therein

#11 | 2017-06-29
US20170186846A1
Electricity

Nanowire device with reduced parasitics

#12 | 2017-05-18
US20170140986A1
Electricity

Self-aligned metal cut and via for back-end-of-line (BEOL) processes for semiconductor integrated circuit (IC) fabrication, and related processes and devices

#13 | 2017-04-13
US20170104153A1
Electricity

Magnetic tunnel junction (MTJ) device array

#14 | 2017-04-13
US20170104088A1
Electricity

METHOD AND APPARATUS FOR SOURCE-DRAIN JUNCTION FORMATION IN A FINFET WITH IN-SITU DOPING

#15 | 2017-02-02
US20170033020A1
Electricity

Adjacent device isolation

#16 | 2016-10-06
US20160293485A1
Electricity

Self-aligned structure

#17 | 2016-09-01
US20160254261A1
Electricity

Adjacent device isolation

#18 | 2016-08-18
US20160240437A1
Electricity

Reduced height M1 metal lines for local on-chip routing

#19 | 2016-08-04
US20160225817A1
Electricity

Magnetic tunnel junction (MTJ) device array

#20 | 2016-06-23
US20160181161A1
Electricity

Sub-fin device isolation

#21 | 2016-05-26
US20160148936A1
Electricity

Contact wrap around structure

#22 | 2016-05-12
US20160133614A1
Electricity

SEMICONDUCTOR PACKAGE WITH INCORPORATED INDUCTANCE ELEMENT

#23 | 2016-03-24
US20160087070A1
Electricity

Method and apparatus for source-drain junction formation in a FinFET with in-situ doping

#24 | 2016-02-18
US20160049487A1
Electricity

DEVICE INCLUDING CAVITY AND SELF-ALIGNED CONTACT AND METHOD OF FABRICATING THE SAME

#25 | 2015-09-17
US20150262930A1
Electricity

Reduced height M1 metal lines for local on-chip routing

#26 | 2015-09-10
US20150255571A1
Electricity

Semiconductor device having a gap defined therein

#27 | 2013-01-03
US20130002272A1
Physics

Test circuit for testing through-silicon-vias in 3D integrated circuits

#28 | 2010-09-09
US20100225369A1
Electricity

Devices comprising delay line for applying variable delay to clock signal

#29 | 2008-01-31
US20080025386A1
Electricity

Method for determining a pulse position in a signal

#30 | 2007-02-15
US20070035428A1
Physics

Method and apparatus for minimizing the influence of a digital sub-circuit on at least partially digital circuits

#31 | 2005-09-06
US9809993
-

Method, apparatus and computer program product for determination of noise in mixed signal systems

InventorID:

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