Eindhoven
Netherlands
14
2025-02-27
The entities that hold a legal rights for patent applications filed by inventor Lazic Ivan:
Ivan Lazic from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
DIFFERENTIAL PHASE CONTRAST MICROANALYSIS USING ENERGY LOSS SPECTROMETERS
#2 | 2023-11-02Method and Scanning Transmission Charged-Particle Microscope
#3 | 2021-12-28System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy
#4 | 2020-03-31Multi-beam scanning transmission charged particle microscope
#5 | 2019-11-14Method of performing tomographic imaging in a charged-particle microscope
#6 | 2019-10-15Imaging technique in scanning transmission charged particle microscopy
#7 | 2019-09-26Intelligent pre-scan in scanning transmission charged particle microscopy
#8 | 2019-09-05Discriminative imaging technique in scanning transmission charged particle microscopy
#9 | 2017-01-26Method of ptychographic imaging
#10 | 2016-10-20Method of performing tomographic imaging in a charged-particle microscope
#11 | 2015-08-27Method of examining a sample in a charged-particle microscope
#12 | 2015-06-18Method of investigating the wavefront of a charged-particle beam
#13 | 2014-03-06Method of investigating and correcting aberrations in a charged-particle lens system
#14 | 2014-01-02Method of preparing and imaging a lamella in a particle-optical apparatus
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