Magnetic media capable of improving magnetic properties and thermal management for heat-assisted magnetic recording

Description

CROSS-REFERENCE TO RELATED APPLICATION

This application claims priority to provisional U.S. Patent Application Ser. No. 61/894,527, filed on Oct. 23, 2013, which is hereby incorporated by reference in its entirety.

BACKGROUND

Conventional magnetic recording disk drives include a slider attached to a suspension and a media such as a disk. The slider typically includes a magnetic read transducer (reader) and a magnetic write transducer (writer). The writer magnetically records data as bits along a tracks in the media. The reader reads data back from the media.

The trend in magnetic recording is to higher areal densities. For example, densities of 1 Tbit/in² and higher are desired. To read, write and store data at such areal densities, the reader, writer, and media have evolved. For example, tunneling magnetoresistance (TMR) sensors may be used to read higher density media with sufficiently high signals and heat assisted magnetic recording (HAMR) writers may utilize laser light to heat regions of the media to temperatures near and/or above the Curie temperature of the media. This allows the writer to magnetically record data to the media at lower magnetic fields. Similarly, magnetic media have been developed to store data at higher areal densities.

Although such conventional magnetic recording disk drives function, there are drawbacks. For example, for areal densities of 1 Tbit/in², an average grain size for a bit may be desired to be less than six nanometers. Media having the desired grain size, thermal stability and other magnetic properties are thus desired. Accordingly, what is needed is a system and method for improving the performance of a magnetic recording disk drive at higher areal densities.

BRIEF DESCRIPTION OF SEVERAL VIEWS OF THE DRAWINGS

FIG. 1 depicts a side view of a HAMR magnetic recording disk drive.

FIG. 2 depicts an exemplary embodiment of a magnetic recording media that may be usable in a HAMR disk drive.

FIG. 3 depicts another exemplary embodiment of a magnetic recording media that may be usable in a HAMR disk drive.

FIG. 4 depicts a flow chart of an exemplary embodiment of a method for providing magnetic recording media usable in a HAMR disk drive.

FIG. 5 depicts a flow chart of another exemplary embodiment of a method for fabricating a magnetic recording media usable in a HAMR disk drive.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

FIG. 1 depicts a side view of an exemplary embodiment of a portion of a HAMR disk drive 100 including a write transducer 120. For clarity, FIG. 2 is not to scale. For simplicity not all portions of the HAMR disk drive 100 are shown. In addition, although the HAMR disk drive 100 is depicted in the context of particular components other and/or different components may be used. For example, circuitry used to drive and control various portions of the HAMR disk drive 100 is not shown. For simplicity, only single components 102, 110, 120 and 150 are shown. However, multiples of each components 102, 110, 120, and/or 150 and their sub-components, might be used.

The HAMR disk drive 100 includes a slider 110, a HAMR transducer 120, a laser assembly 130 and media 150. Additional and/or different components may be included in the HAMR disk drive 100. Although not shown, the slider 110, and thus the laser assembly 130 and HAMR transducer 120 are generally attached to a suspension (not shown). The laser assembly 130 includes a submount 132 and a laser 134. The submount 132 is a substrate to which the laser 134 may be affixed for improved mechanical stability, ease of manufacturing and better robustness. The laser 134 may be a chip such as a laser diode.

The HAMR transducer 120 is fabricated on the slider 110 and includes an air-bearing surface (ABS) proximate to the media 150 during use. In general, the HAMR transducer 120 includes a write transducer and a read transducer. However, for clarity, only the write portion of the HAMR head 120 is shown. The HAMR head 120 includes a waveguide 122, write pole 124, coil(s) 126, near-field transducer (NFT) 128. The waveguide 122 guides light from the laser 134 to the NFT 128, which resides near the ABS. The NFT 128 utilizes local resonances in surface plasmons to focus the light to magnetic recording media 150. At resonance, the NFT 128 couples the optical energy of the surface plasmons efficiently into the media 150 with a confined optical spot which is much smaller than the optical diffraction limit. This optical spot can rapidly heat a region of the recording medium 150 to near or above the Curie point of the recording media layer (not explicitly depicted in FIG. 1). High density bits can be written on a high coercivity medium with the pole 124 energized by the coils 126 to a modest magnetic field. The write pole 124 is thus formed of high saturation magnetization material(s) such as CoFe. The media 150 is configured to be usable at higher recording densities and, in some embodiments, to be used in the HAMR disk drive 100.

FIG. 2 depicts an exemplary embodiment of the magnetic media 150 usable in a disk drive such as the disk drive 100. For clarity, FIG. 2 is not to scale. For simplicity not all portions of the magnetic recording media are shown. For example, a substrate on which the magnetic recording media 150 is fabricated is not shown. Referring to FIGS. 1-2, the magnetic recording media includes a magnetic recording layer 152, a crystalline underlayer 154 and a crystalline heat sink layer 156. The crystalline heat sink layer is closer to the substrate (not shown) than the crystalline underlayer 154. The crystalline underlayer 154 is between the recording layer 152 and the crystalline heat sink layer 156. In other embodiments other and/or additional layers may be present. For example, although not shown in FIG. 2, an overcoat layer is generally used. The overcoat layer would reside on the magnetic recording layer 152 and between the magnetic recording layer 152 and the slider 110. Other layer(s) may also reside between the layers 152, 154 and 156 shown. However, the relationships between the layers 152, 154 and 156 may be preserved. Stated differently, the crystalline heat sink layer 156 is closer to the substrate than the crystalline underlayer 154. Similarly, the crystalline underlayer 154 is closer to the substrate than the magnetic recording layer 152. The magnetic recording layer 152 is also closer to the slider 110 than the layers 154 and 156.

The magnetic recording layer 152 stores magnetic data recorded by the transducer 120. Thus, the magnetic recording layer may be desired to have a small grain size such as less than ten nm and be thermally stable in the media 150. In some embodiments, the magnetic recording layer 152 includes FePt. For example, FePt having an L10 crystal structure may be used as the recording layer 152. The FePt may also have a (001) orientation. In such embodiments, the magnetic recording layer 152 may have a high perpendicular anisotropy. In other embodiments other and/or different materials may be used for the magnetic recording layer 152.

The crystalline underlayer 154 and crystalline head sink layer 156 each has a crystal structure. Stated differently, each of the layers 154 and 156 has an ordered lattice structure (as opposed to an amorphous layer). In some embodiments, the crystal structures are the same. For example, both the crystalline underlayer 154 and the crystalline heat sink layer 156 may be body-centered cubic (BCC). In some embodiments, the crystalline underlayer 154 and the crystalline heat sink layer 156 each has an orientation. In some embodiments, the crystallographic orientation of the layers 154 and 156 may be the same. For example, the layers 154 and 156 may each have a (200) orientation.

The heat sink layer 156 may be configured not only to have the desired crystal structure, but also to function as a heat sink. Thus, the thermal properties of the media 150 may be managed at least in part using the heat sink layer 156. The thermal conductivity of the heat sink layer 156 may be desired to be high. In some embodiments, the thermal conductivity of the heat sink layer 156 is at least fifty Watts/mK. In some such embodiments, the heat sink layer 156 has a thermal conductivity of at least seventy Watts/mK. In some embodiments, the above numerical values for thermal conductivity are as measured using a pump probe method, otherwise known as a time domain thermo-reflectance (TDTR) technique. In other embodiments other methods and other numerical values may be used. The heat sink layer 156 may include material(s) such as Cu, Ag, Au, V, Cr, Nb Ru, W and/or Mo. In some embodiments, the heat sink layer 156 includes W or Mo. However, if Cu, Ag, and/or Au are used, such materials may be present as only part of the heat sink layer 156. For example, the heat sink 156 may be a multilayer heat sink. The Au, Ag, and/or Cu may be a seed layer or one of the layers in the multilayer heat sink layer 156. In contrast, if W or Mo are used, the heat sink layer 150 may consist of only W and/or Mo. In some embodiments, the heat sink layer 156 may be at least forty nanometers thick and not more than one hundred twenty nanometers thick. In some such embodiments, the heat sink layer 156 may be at least eighty and not more than one hundred nanometers thick.

The thermal conductivity of the crystalline underlayer 154 is also configured to manage the thermal properties of the magnetic recording media 150. The thermal conductivity of the crystalline underlayer 154 may be less than that of the heat sink layer. However, the thermal conductivity of the crystalline underlayer 154 may also be sufficiently high that the crystalline underlayer does not act as a thermal barrier. In some embodiments, the crystalline underlayer 154 has a thermal conductivity of at least ten W/mK. In some such embodiments, the thermal conductivity of the crystalline underlayer 154 is at least twenty W/mK. The crystalline underlayer 154 may, for example, include one or more of CrMo, CrV, Cr, MoTa, MoW, MoV, CrW, Mo and RuAl. As discussed above, the numerical values of the thermal conductivities discussed herein may be measured using TDTR. Thus, measurements by other methods may result in differences in the experimental values of thermal conductivities discussed herein.

The magnetic media 150 may have improved performance. The crystal structure of the crystalline underlayer 154 may result in an improved crystal structure of the magnetic recording layer 152. This is particularly true if an orientation control layer (not shown in FIG. 2) is used between the crystalline underlayer 154 and the magnetic recording layer 152. Recently developed magnetic recording media may use an amorphous underlayer for growth of the orientation control layer. Such an amorphous underlayer is desired to provide a smooth surface for growth of the orientation control layer. In order to provide a smooth surface, the amorphous underlayer is desired to be relatively thick. However, even for a thicker amorphous underlayer and orientation control layer, the crystal structure and orientation of the magnetic recording layer 152 may not be as desired. In contrast, the crystalline underlayer 154 may provide the desired growth template for the magnetic recording layer 152. For example, a magnetic recording layer 152 including FePt having an L10 structure and a (001) orientation may be better grown on a BCC crystalline underlayer 154 having a (200) orientation. Because the magnetic recording layer 152 has a desired crystal structure, the magnetic properties of the magnetic recording layer 152 may also be closer to those desired. For example, the perpendicular anisotropy may be enhanced. Thus, performance of the magnetic recording media 150 at higher densities may be improved.

Better thermal management of the magnetic recording media 150 may be attained. The amorphous underlayer described above may have a thermal conductivity of ten W/mK or less. As a result, the amorphous underlayer may act as a thermal barrier between the magnetic recording layer 152 and the heat sink layer. In contrast, the crystalline underlayer 154 has a higher thermal conductivity. As a result, heat may be better conducted from the magnetic recording layer 152 to the crystalline heat sink layer 156. Thus, a larger thermal gradient may be obtained in the magnetic recording media 150. The region of the magnetic recording media 150 heated by the laser 134 (thermal spot size) may be better confined. Thus, performance of the magnetic recording media 150 at higher areal densities may be improved.

FIG. 3 depicts an exemplary embodiment of the magnetic media 150′ usable in a disk drive such as the disk drive 100. For clarity, FIG. 3 is not to scale. For simplicity not all portions of the magnetic recording media are shown. The magnetic media 150′ is analogous to the magnetic recording media 150 depicted in FIG. 2. Consequently, similar components have analogous labels. The magnetic recording media 150′ includes a magnetic recording layer 152, a crystalline underlayer 154 and a crystalline heat sink layer 156 analogous to the magnetic recording layer 152, crystalline underlayer 154 and crystalline heat sink layer 156, respectively, depicted in FIG. 2. Also shown are an overcoat layer 158, an orientation control layer 160, a seed/thermal control layer 162, an adhesion layer 164 and a substrate 166. The substrate 166 may be glass, but may also be another material.

The adhesion layer 164 may be used to help ensure that the remaining layers 162, 156, 154, 160 and 152 do not delaminate from the substrate 166. For example, the adhesion layer may include NiTa, CrTa, CrTi and/or Ta. The seed layer/thermal control layer 162 may include one or more of RuAl, RuTi, Cr and NiAl. In some embodiments, the seed/thermal control layer 162 provides the desired growth template for the crystalline heat sink layer 156. Thus, the layer 162 functions as a seed layer. Thus, the layer 162 may allow for the crystalline heat sink layer 156 to have the desired crystal structure and orientation. In some embodiments, the layer 162 improves the growth of the crystalline heat sink layer 156 has a B2 or a BCC structure having a (200) orientation. In some embodiments, the layer 162 aids in thermal management of the media 150′. For example, the thermal conductivity of the layer 162 may be configured as desired. In some embodiments, the thermal conductivity is within the range of the thermal conductivities of RuAl, RuTi, Cr and NiAl. In other embodiments, the layer 162 aids both in growth of the crystalline heat sink layer 156 having the desired structure and orientation and in thermal management for the media 150′. Thus, the seed/thermal control layer 162 may function as a seed layer for the layer 156, a thermal control layer for the media 150′, or both.

The crystalline heat sink layer 156 is configured not only to function as a heat sink, but also to have the desired crystal structure. The thickness of the crystalline heat sink layer 156 may be in the range described above. The thermal conductivity of the heat sink layer is also desired to be high. In some embodiments, the thermal conductivity of the crystalline heat sink layer 156 is in the range described above. The crystalline heat sink layer 156 may also have the desired crystal structure and orientation. In some embodiments, the crystalline heat sink layer 156 has a B2 or BCC crystal structure and a (200) orientation. For example, the heat sink layer 156 may include Cu, Ag, Au, V, Cr, Nb, Ru, W and/or Mo. In some embodiments, the heat sink layer 156 includes W or Mo. If Cu, Ag, and/or Au are used, such materials may be present as only part of the heat sink layer 156.

The crystalline underlayer 154 also has a crystal structure. In some embodiments, the crystalline underlayer 154 has a BCC crystal structure and a (200) orientation. Thus, the crystal structures and orientations of the layers 154 and 156 may be the same. The thermal conductivity of the crystalline underlayer 154 may be less than that of the heat sink layer. In some embodiments, the crystalline underlayer 154 has a thermal conductivity of at least ten W/mK. In some such embodiments, the thermal conductivity of the crystalline underlayer 154 is at least twenty W/mK. The crystalline underlayer 154 may, for example, include one or more of CrMo, CrV, Cr, MoTa, MoW, MoV, CrW, Mo and RuAl. In some such embodiments, the crystalline underlayer 154 may be not more than 25 nm thick.

The orientation control layer 160 is used to provide a growth template for the desired orientation and crystal structure of the magnetic recording layer 152. In some embodiments, the magnetic recording layer 152 includes FePt. For example, FePt having an L10 crystal structure and a (001) orientation may be used as the recording layer 152. The orientation control layer 160 may assist growth of the magnetic recording layer 152 in achieving this crystal structure and orientation. In some embodiments, the orientation control layer 160 is crystalline MgO having a (200) orientation. The crystalline underlayer 154 may function as a seed layer for the orientation control layer 160. Thus, a particular lattice parameter, crystal structure and orientation of the crystalline underlayer layer 154 are desired to match that of the orientation control layer 160. The lattice parameter of the crystalline underlayer 154 may be desired to differ from the lattice parameter of the orientation control layer 160 by not more than ten percent. In some such embodiments, this difference is not more than four percent. In other embodiments, the lattice parameter mismatch is not more than two percent. Further, the orientation control layer 160 may be relatively thin. In some such embodiments, the orientation control layer 160 may be not more than 25 nm thick.

The magnetic media 150′ may have improved performance. Use of the layer 164 may improve the crystal structure of the crystalline heat sink layer 156 and/or thermal management in the media 150′. As discussed above, the crystal structure of the crystalline underlayer 154 may result in an improved crystal structure of the magnetic recording layer 152. This is particularly true for the magnetic media 150′, which includes the orientation control layer 160. The crystalline underlayer 154 may provide the desired growth template for the orientation control layer 160. In turn, the orientation control layer 160 provides a growth template for the desired crystal structure and orientation for the magnetic recording layer 152. Because the magnetic recording layer 152 has a desired crystal structure and orientation, the magnetic properties of the magnetic recording layer 152 may also be closer to those desired. Because of the use of the crystalline underlayer 154, this improvement may be obtained for a thinner orientation control layer 160. Consequently, a better path for heat to flow to the crystalline heat sink layer 156 may be provided. Thermal management of the media 150′ may be improved. The thermal conductivity of the crystalline underlayer 154 may be in the ranges described above. As a result, heat may be better conducted between the magnetic recording layer 152 and the heat sink layer 156. Thus, a larger thermal gradient may be obtained in the magnetic recording media 150. The region of the magnetic recording media 150 heated by the laser 134 (thermal spot size) may be better confined. Smaller bits may be written and less laser power consumed. Thus, performance of the magnetic recording media 150′ may be improved.

FIG. 4 depicts an exemplary embodiment of a method 200 for providing a magnetic recording media such as the media 150. For simplicity, some steps may be omitted, interleaved, and/or combined. The method 200 is also described in the context of providing a magnetic recording disk drive 100 and media 150 depicted in FIGS. 1-2. However, the method 200 may be used to fabricate multiple magnetic recording heads at substantially the same time. The method 200 may also be used to fabricate other magnetic recording media. The method 200 is also described in the context of particular layers. A particular layer may include multiple materials and/or multiple sub-layers. The method 200 also may start after formation of other portions of the magnetic recording media. For example, the method 200 may start after a portion of the media 150 has been fabricated.

Referring to FIGS. 2 and 4, the crystalline heat sink layer 156 is provided, via step 202. Step 202 may include depositing one or more of Cu, Ag, Au, V, Cr, Nb, W, Mo and Ru. The Cu, Ag and/or Au are used in conjunction with other materials such as the W, Mo, V, Cr, and Nb. The crystalline underlayer 154 is provided, via step 204. Step 204 may include depositing one or more of CrMo, CrV, Cr, MoTa, MoW, MoV, CrW, Mo and RuAl. The magnetic recording layer 154 may be deposited, via step 206. Step 206 may include depositing a material including FePt.

Using the method 200, the magnetic disk drive 100 and magnetic recording media 150 may be provided. Thus, the benefits of the magnetic recording media 150 and magnetic recording transducer 120 may be achieved.

FIG. 5 depicts an exemplary embodiment of a method 210 for providing a magnetic recording media such as the media 150′. For simplicity, some steps may be omitted, interleaved, and/or combined. The method 210 is also described in the context of providing a HAMR disk 100 and media 150′ depicted in FIGS. 1 and 3. However, the method 210 may be used to fabricate multiple magnetic recording heads at substantially the same time. The method 210 may also be used to fabricate other magnetic recording media. The method 210 is also described in the context of particular layers. A particular layer may include multiple materials and/or multiple sub-layers. The method 210 also may start after formation of other portions of the magnetic recording media 150′.

Referring to FIGS. 3 and 5, the adhesion layer 164 and seed layer 162 are provided on the substrate 166 via steps 212 and 214, respectively. The crystalline heat sink layer 156 is provided, via step 216. Step 216 may include depositing one or more of Cu, Ag, Au, V, Cr, Nb, W, Mo and Ru. The Cu, Ag and Au are, however, used for only part of the heat sink layer 156. The crystalline underlayer 154 is provided, via step 218. Step 218 may include depositing one or more of CrMo, CrV, Cr, MoTa, MoW, MoV, CrW, Mo and RuAl. The crystalline MgO orientation control layer 160 is deposited, via step 220. The magnetic recording layer 154 may be deposited, via step 222. Step 222 may include depositing a material including FePt. Fabrication of the magnetic recording media 150/150′ may then be completed. For example, the overcoat layer 158 may also be provided after step 222.

Using the method 210, the magnetic disk drive 100 and magnetic recording media 150′ may be provided. Thus, the benefits of the magnetic recording media 150′ and disk drive 100 may be achieved.