Method and system for providing a read transducer having symmetric antiferromagnetically coupled shields

Description

BACKGROUND

FIG. 1 depicts an air-bearing surface (ABS) view of a conventional read transducer 10. The conventional read transducer 10 includes shields 12 and 20, sensor 14 and magnetic bias structures 16. The read sensor 14 is typically a giant magnetoresistive (GMR) sensor or tunneling magnetoresistive (TMR) sensor. The read sensor 14 includes an antiferromagnetic (AFM) layer, a pinned layer, a nonmagnetic spacer layer, and a free layer. Also shown is a capping layer. In addition, seed layer(s) may be used. The free layer has a magnetization sensitive to an external magnetic field. Thus, the free layer functions as a sensor layer for the magnetoresistive sensor 14. The magnetic bias structures 16 may be hard bias structures or soft bias structures 16. These magnetic bias structures are used to magnetically bias the sensor layer of the sensor 14.

Although the conventional transducer 10 functions, there are drawbacks. In particular, the nanostructure of the shields 12 and 20 may affect performance of the read sensor 14. As the conventional transducer 10 is scaled down for higher density media, the details of the structures of the shields 12 and 20 become more important to performance of the conventional transducer. As a result, the shields 12 and 20 may be more likely to adversely affect performance of the read sensor 14.

Accordingly, what is needed is a system and method for improving the performance of a magnetic recording read transducer.

BRIEF DESCRIPTION OF SEVERAL VIEWS OF THE DRAWINGS

FIG. 1 depicts a conventional read transducer.

FIG. 2 depicts an ABS view of a more recent magnetic recording read transducer.

FIG. 3 is flow chart depicting an exemplary embodiment of a method for fabricating a magnetic recording read transducer.

FIG. 4 is an ABS view of an exemplary embodiment of a portion of a magnetic recording read transducer.

FIG. 5 is flow chart depicting another exemplary embodiment of a method for fabricating a magnetic recording read transducer.

FIG. 6 depicts an ABS view of another exemplary embodiment of a portion of a magnetic recording read transducer.

FIG. 7 is flow chart depicting another exemplary embodiment of a method for fabricating a magnetic recording read transducer.

FIGS. 8-12 depicts an ABS view of another exemplary embodiment of a portion of a magnetic recording read transducer during fabrication.

FIG. 13 is flow chart depicting another exemplary embodiment of a method for fabricating a magnetic recording read transducer.

FIGS. 14-17 depicts an ABS view of another exemplary embodiment of a portion of a magnetic recording read transducer during fabrication.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

FIG. 2 depicts an ABS view of a portion of a more recently developed magnetic read transducer 50. For clarity, FIG. 2 is not to scale. The read transducer 50 may be part of a read head or may be part of a merged head that also includes a write transducer. The transducer 50 includes shields 52 and 60, a read sensor 54 and soft magnetic bias structures 56. The sensor 54 shown is a GMR or TMR sensor. Thus, the sensor 54 includes a pinning layer, a pinned, a nonmagnetic spacer layer, a free layer, and a capping layer. For simplicity, these layers are not separately labeled in FIG. 2. The sensor 54 may also include seed layer(s) (not shown). The magnetic bias structures 56 may be soft bias structures fabricated with soft magnetic material(s). The soft magnetic bias structures 56 have a high permeability and a low coercivity. For example, the soft magnetic bias structures 56 may include NiFe, such as Permalloy. The soft magnetic bias structures 56 magnetically bias the free layer.

The magnetic read transducer 50 also includes an antiferromagnetically biased second shield 60. The shield 60 includes ferromagnetic layers 62 and 66, nonmagnetic spacer layer 64, and pinning layer 68. The shield 60 may also include a capping layer 70. The ferromagnetic layers 62 and 66 are separated by nonmagnetic spacer layer 64. The nonmagnetic spacer layer 64 may be Ru, which allows the magnetic moments of the layers 62 and 66 to be coupled antiparallel. The moment of the ferromagnetic layer 66 is pinned by the pinning layer 68. The pinning layer is typically an antiferromagnet (AFM), such as IrMn.

Because the more recently developed magnetic transducer 50 has an antiferromagnetically coupled second shield 60, the performance of the magnetic transducer 50 may be improved. More specifically, the domains in the second shield 60 may be stabilized and noise reduced. However, at higher recording densities, issues may still exist due to the structures of the shields 52 and 60. Performance of the more recently developed magnetic transducer may thus be adversely affected.

FIG. 3 is an exemplary embodiment of a method 100 for providing a read transducer including a mirrored shield. For simplicity, some steps may be omitted, interleaved, and/or combined. The method 100 is also described in the context of providing a single recording transducer. However, the method 100 may be used to fabricate multiple transducers at substantially the same time. The method 100 is also described in the context of particular layers. A particular layer may include multiple materials and/or multiple sub-layers. The method 100 also may start after formation of other portions of the magnetic recording transducer. For example, in some embodiments, a soft, ferromagnetic shield and a nonmagnetic spacer layer, such as aluminum oxide, are provided first.

A first antiferromagnetically coupled (AFC) shield is provided, via step 102. Step 102 typically includes depositing a first ferromagnetic layer, depositing a first nonmagnetic spacer layer on the first ferromagnetic layer and depositing second ferromagnetic layer on the first nonmagnetic spacer layer. The first nonmagnetic spacer layer is between the first ferromagnetic layer and the second ferromagnetic layer. Step 102 may include full film depositing the layers for the shield, masking the desired location of the shield and removing the exposed portions of the layers to form the shield. In other embodiments, a mask having an aperture therein or a nonmagnetic layer having a trench therein may be provided. The shield layers are deposited and the mask removed to form the shield in this embodiments.

The first nonmagnetic spacer layer is configured such that the first and second ferromagnetic layers are antiferromagnetically coupled. For example, the first nonmagnetic spacer layer may be Ru and configured such that a Ruderman-Kittel-Kasuya-Yosida (RKKY) coupling between the first and second ferromagnetic layers is antiferromagnetic in nature. The first magnetic layer has a first saturation magnetization and a first thickness. The second ferromagnetic layer has a second saturation magnetization and a second thickness. The first and second ferromagnetic layers may include one or more of NiFe, NiFeCo, CoFe, CoB, CoFeB and/or other ferromagnetic materials. The first and second ferromagnetic layers may, for example, have a thickness of at least fifty Angstroms and not more than five hundred Angstroms. In some embodiments, the first and second ferromagnetic layers may be formed of the same materials. In other embodiments, the first and second ferromagnetic layers may be formed of different materials. The first and/or second ferromagnetic layer(s) may also be a multilayer. For example, the first ferromagnetic layer may include a trilayer of Co₆₀Fe₄₀/Ni₈₁Fe₁₉/Co₆₀Fe₄₀. The second ferromagnetic layer may include a bilayer of Co₆₀Fe₄₀/Ni₈₁Fe₁₉. In such embodiments, the CoFe sublayers may be at least five and not more than twenty Angstroms thick and the NiFe sublayer(s) may be at least thirty Angstroms and not more than four hundred ninety Angstroms thick.

Step 102 may optionally include providing a pinning layer on which the first ferromagnetic layer resides. The pinning layer may be an antiferromagnet including but not limited to IrMn. In other embodiments, the pinning layer may be omitted. Further, step 102 may include providing one or more amorphous ferromagnetic layer(s) in the AFC shield. For example, CoFeB having at least ten atomic percent B may be provided. In some embodiments, CoFeB layers are provided in both of the first and second ferromagnetic layers. In other embodiments, only the first ferromagnetic layer includes the CoFeB layer. In alternate embodiments, only the second ferromagnetic layer includes the CoFeB layer. For example, the first ferromagnetic layer may include a multilayer of CoFe/NiFe/CoFeB/NiFe/CoFe. The second ferromagnetic layer may include a multilayer of CoFe/NiFe/CoFeB/NiFe. In other embodiments, different material(s) may be used.

A read sensor is provided on the first AFC shield, via step 104. The second ferromagnetic layer may be between the read sensor and the first ferromagnetic layer. In some embodiments, the read sensor is a TMR or GMR sensor. Thus, step 104 may include deposited a stack of layers including at least a ferromagnetic pinned layer, a thin nonmagnetic spacer layer and a ferromagnetic free layer. The pinned and free layers may be formed of the same or different material(s). A pinning layer adjoining the pinned layer may also be provided in step 104. For example, IrMn may be used as the pinning layer for the sensor. Step 104 may also include defining the edges of the read sensor in the track width and/or stripe height (perpendicular to the ABS) direction. The read sensor provided in step 104, may be suitable for use at higher recording densities. For example, the track width of the read sensor may be twenty nanometers or less. Magnetic bias structures might also be fabricated.

A second AFC shield is provided, via step 106. Step 106 typically includes depositing a third ferromagnetic layer, depositing a second nonmagnetic spacer layer on the third ferromagnetic layer and depositing fourth ferromagnetic layer on the second nonmagnetic spacer layer. The second nonmagnetic spacer layer is between the third ferromagnetic layer and the fourth ferromagnetic layer. Step 106 may include full film depositing the layers for the shield, masking the desired location of the shield and removing the exposed portions of the layers to form the shield. In other embodiments, a mask having an aperture therein or a nonmagnetic layer having a trench therein may be provided. The shield layers are deposited and the mask removed to form the shield in this embodiments.

The second nonmagnetic spacer layer is configured such that the third and fourth ferromagnetic layers are antiferromagnetically coupled. For example, the second nonmagnetic spacer layer may be Ru and configured such that an RKKY coupling between the third and fourth ferromagnetic layers is antiferromagnetic in nature. The third magnetic layer has a third saturation magnetization and a third thickness. The fourth ferromagnetic layer has a fourth saturation magnetization and a fourth thickness. The third and fourth ferromagnetic layers may include one or more of NiFe, NiFeCo, CoFe, CoB, CoFeB and/or other ferromagnetic materials. The third and fourth ferromagnetic layers may, for example, have a thickness of at least fifty Angstroms and not more than five hundred Angstroms. In some embodiments, the third and fourth ferromagnetic layers may be formed of the same materials. In other embodiments, the third and fourth ferromagnetic layers may be formed of different materials. The third and/or fourth ferromagnetic layer(s) may also be a multilayer. For example, the third ferromagnetic layer may include a bilayer of Ni₈₁Fe₁₉/Co₆₀Fe₄₀. The fourth ferromagnetic layer may include a trilayer of Co₆₀Fe₄₀/Ni₈₁Fe₁₉/Co₆₀Fe₄₀. In such embodiments, the CoFe sublayers may be at least five and not more than twenty Angstroms thick and the NiFe sublayer(s) may be at least thirty Angstroms and not more than four hundred ninety Angstroms thick.

Step 106 may optionally include providing a pinning layer on the fourth ferromagnetic layer. The pinning layer may be an antiferromagnet including but not limited to IrMn. In other embodiments, the pinning layer may be omitted. Further, step 106 may include providing one or more amorphous ferromagnetic layer(s) in the AFC shield. For example, CoFeB having at least ten atomic percent B may be provided. In some embodiments, CoFeB layers are provided in both of the third and fourth ferromagnetic layers. In other embodiments, only the third ferromagnetic layer includes the CoFeB layer. In alternate embodiments, only the fourth ferromagnetic layer includes the CoFeB layer. For example, the third ferromagnetic layer may include a multilayer of NiFe/CoFeB/NiFe/CoFe. The fourth ferromagnetic layer may include a multilayer of CoFe/NiFe/CoFe. In other embodiments, different material(s) may be used.

Steps 102 and 106 are performed such that the second AFC shield is a mirror image of the first AFC shield. Stated differently, step 106 is performed such that the second AFC shield is a mirror image of the first AFC shield. For a mirror, the saturation magnetizations multiplied by thickness(es) of the first AFC shield match those of the second AFC shield to within twenty percent. In some embodiments, the second AFC shield is a mirror of the first AFC if the second saturation magnetization multiplied by the second thickness matches the third saturation magnetization multiplied by the third thickness to within twenty percent. In some such embodiments, these products match to within ten percent. In some embodiments, the second AFC shield is a mirror of the first AFC if the first saturation magnetization multiplied by the first thickness matches the fourth saturation magnetization multiplied by the fourth thickness to within twenty percent. In some embodiments, these products match to within ten percent. In some embodiments, the second saturation magnetization multiplied by the second thickness matches the third saturation magnetization multiplied by the third thickness to within twenty percent and first saturation magnetization multiplied by the first thickness matches the fourth saturation magnetization multiplied by the fourth thickness to within twenty percent. In some cases, these products match to within ten percent.

In some embodiments, this mirroring may be achieved by using the same material(s) in the second and third ferromagnetic layers and/or in the first and fourth ferromagnetic layers. In such embodiments, the thicknesses of the second and third ferromagnetic layers and/or the thicknesses of the first and fourth ferromagnetic layers may match to within the percentages described above. In other embodiments, however, different materials may be used in different layers.

In addition, symmetry may be desired with respect to the free layer for the first AFC shield to mirror the second AFC shield. Thus, the distance between a center of the second ferromagnetic layer and the free layer may match the distance between a center of the third ferromagnetic layer and the free layer to within twenty percent. In some embodiments, these distances may match to within ten percent. Similarly, the distance between a center of the first ferromagnetic layer and the free layer may match the distance between a center of the fourth ferromagnetic layer and the free layer to within twenty percent.

Thus, the AFC shield fabricated in step 102 and the AFC shield formed in step 106 are manufactured such that one is a mirror of the other as described above. However, a particular direction of magnetization is not required for the shields. For example, in some embodiments, the magnetic moment of the second ferromagnetic layer is antiferromagnetically aligned with the magnetic moment of the third ferromagnetic layer. In other embodiments, the magnetic moment of the second ferromagnetic layer has a second ferromagnetic layer magnetic moment that is aligned parallel with a third ferromagnetic layer magnetic moment of the third ferromagnetic layer.

FIG. 4 is an ABS view of an exemplary embodiment of a portion of a magnetic recording read transducer 200 formed using the method 100. For clarity, FIG. 4 is not to scale. The read transducer 200 may be part of a read head or may be part of a merged head that also includes a write transducer. The head of which the read transducer 200 is part of a disk drive having a media, a slider and the head coupled with the slider. The read transducer 200 is also described in the context of particular components. In other embodiments, some of the components may be omitted, provided in a different location, or have different constituents. Further, other components may be used.

The transducer 200 includes a first AFC shield 210, a read sensor 220, magnetic bias structure 230 and a second AFC shield 240. Other components may be included in the read transducer 200 but are not shown. The read sensor 220 may be a TMR sensor, a GMR sensor or another sensor. The read sensor 220 includes a sensor layer 222. In some embodiments, the sensor layer 222 is a free layer. Thus, the sensor 220 may include a pinning layer, a pinned layer, a nonmagnetic spacer layer, a free (sensor) layer 222, and a capping layer. The sensor 220 may also include seed layer(s) (not shown). In other embodiments, the pinning layer may be omitted or may use a different pinning mechanism. The read sensor layer 222 has a track width, TW. In some embodiments, TW is not greater than twenty nanometers. In other embodiments, other track widths are possible. The magnetic bias structures 130 may be hard or soft magnetic bias structures.

The first AFC shield 210 includes ferromagnetic layers 212 and 216 separated by a nonmagnetic spacer layer 214. The second AFC shield 240 includes ferromagnetic layers 246 and 242 separated by nonmagnetic spacer layer 244. For simplicity, optional seed and/or capping layer are not shown in FIG. 4. The ferromagnetic layers 212, 216, 242 and 246 may be single layers. One or more of the ferromagnetic layers 212, 216, 242 and 246 may be multilayer. This possibility is indicated by the dashed lines in layers 212, 216, 242 and 246. The dashed lines also indicate that the layers 212, 216, 242 and/or 246 need not have the same number of layers. Although they may be mirrors, as discussed below, the layers 216 and 246 need not contain the same number of layers or be made of the same materials. Similarly, the layers 212 and 242 need not contain the same number of layers or be made of the same materials. In some embodiments, the layers 216 and 246 include a bilayer of Ni₈₁Fe₁₉/Co₆₀Fe₄₀. In some such embodiments, the layers 212 and 246 may include a trilayer of Co₆₀Fe₄₀/Ni₈₁Fe₁₉/Co₆₀Fe₄₀. As discussed above, the AFC shield 210 and/or 220 may include one or more amorphous magnetic layers. In some embodiments, these amorphous magnetic layers are interlayers within the ferromagnetic layer(s) 212, 216, 242 and/or 246. For example, the layer(s) 212, 216, 242 and/or 246 may include CoFeB having at least ten atomic percent B. For example, the ferromagnetic layers 212 and/or 242 may include multilayer (from bottom to top) of NiFe/CoFeB/NiFe/CoFe. The ferromagnetic layer(s) 216 and/or 246 may include a multilayer (from bottom to top) of CoFe/NiFe/CoFeB/NiFe/CoFe.

The ferromagnetic layers 212, 216, 242 and 246 may be magnetically soft. The ferromagnetic layers 212 and 216 are also antiferromagnetically coupled through the nonmagnetic spacer layer 214, for example via an RKKY coupling. In some embodiments, therefore, the nonmagnetic spacer layer 214 may be Ru. Further, in some embodiments, the spacer layer 214 may be configured such that the second antiferromagnetic coupling peak in the RKKY coupling is used for the first AFC shield 210. In other embodiments, other peaks, such as the first peak, in the RKKY coupling may be used. Similarly, the ferromagnetic layers 242 and 246 are antiferromagnetically coupled through the nonmagnetic spacer layer 244, for example via an RKKY coupling. In some embodiments, therefore, the nonmagnetic spacer layer 244 may be Ru. However, in some embodiments, the spacer layer 244 may be configured such that the first antiferromagnetic coupling peak in the RKKY coupling is used for the second AFC shield 240. In other embodiments, other peaks, such as the first peak, in the RKKY coupling may be used. Note that, the thicknesses of the layers 214 and 244 may differ. One or both of the shields 210 and 240 may also include a pinning layer adjoining the layer 212 or 242.

As discussed above, the AFC shields 210 and 240 are mirrors and may be symmetric with respect to the sensor layer 222. Thus, the thickness, t2, of layer 216 multiplied by its saturation magnetization may match the thickness, t3, of the ferromagnetic layer 246 multiplied by its saturation magnetization to within the percentages described above. Similarly, the thickness, t1, of layer 212 multiplied by its saturation magnetization may match the thickness, t4, of the ferromagnetic layer 242 multiplied by its saturation magnetization to within the percentages described above. In addition, the AFC shields 210 and 240 may be desired to be symmetric with respect to the location of the sensor layer 222. As can be seen in FIG. 4, the sensor layer 222 may not be located at the center of the sensor 220. In some embodiments, therefore, the centers of the ferromagnetic layers 246 and/or 242 may be a different distance from the center of the read sensor 220 than the centers of the ferromagnetic layers 216 and/or 212, respectively.

The magnetic transducer 200 fabricated using the method 100 may have improved performance, particularly at higher recording densities and smaller track widths of the read sensor 220. Because of the symmetry between the mirrored AFC shields 210 and 240, there may be less magnetic noise. The configuration of the AFC shields 210 and 240 may also reduce disturbances due to internal write fields or external stray fields near the sensor 220. Consequently, performance of the magnetic transducer 200 may be improved.

FIG. 5 is flow chart depicting another exemplary embodiment of a method 110 for fabricating a magnetic recording read transducer including mirrored AFC shields. For simplicity, some steps may be omitted, interleaved, and/or combined. The method 110 is also described in the context of providing a single recording transducer. However, the method 110 may be used to fabricate multiple transducers at substantially the same time. The method 110 is also described in the context of particular layers. A particular layer may include multiple materials and/or multiple sub-layers. The method 110 also may start after formation of other portions of the magnetic recording transducer.

A first, bottom shield is optionally provided, via step 112. Step 112 typically includes plating a large high permeability layer. A first nonmagnetic layer may also be optionally provided, via step 114. Step 114 may include depositing an aluminum oxide layer on the bottom shield. This layer may be on the order of one hundred nanometers to one thousand nanometers thick.

A first AFC shield is provided in step 116, 118 and 120. Steps 116, 118 and 120 are thus analogous to step 102 of the method 100. A first pinning layer is optionally provided, via step 116. Step 116 may include depositing an antiferromagnetic layer, such as IrMn. The AFC layers are provided, via step 118. Step 118 thus includes depositing a first ferromagnetic layer, depositing a first nonmagnetic spacer layer on the first ferromagnetic layer and depositing second ferromagnetic layer on the first nonmagnetic spacer layer. The first nonmagnetic spacer layer is between the first ferromagnetic layer and the second ferromagnetic layer. The first nonmagnetic spacer layer is configured such that the first and second ferromagnetic layers are antiferromagnetically coupled, as discussed above. The first magnetic layer has a first saturation magnetization and a first thickness. The second ferromagnetic layer has a second saturation magnetization and a second thickness. The first and second ferromagnetic layers may include one or more of NiFe, NiFeCo, CoFe, CoB, CoFeB and/or other ferromagnetic materials. The first and/or second ferromagnetic layer(s) may also be a multilayer. One or more amorphous ferromagnetic layer(s) are provided in the first AFC shield, via step 120. For example, CoFeB having at least ten atomic percent B may be provided. Although depicted as separate from step 118, the amorphous ferromagnetic layers of step 120 may be insertion layers within the first and/or second ferromagnetic layers provided in step 118.

The read sensor is provided on the first AFC shield, via step 122. Step 122 may include depositing the layers for the sensor, then defining the sensor in at least the track width direction using an ion mill. In some embodiments, some or all of the layers in the sensor are also defined in the stripe height direction. The sensor provided in step 122 may be a TMR sensor, a GMR sensor or another type of sensor. The read sensor provided in step 122, may be suitable for use at higher recording densities. For example, the track width of the read sensor may be twenty nanometers or less. Magnetic bias structures might also be fabricated. As part of step 122, the magnetic bias, insulating and/or other structures for the read sensor may be provided.

A second AFC shield that is a mirror of the first AFC shield is provided in step 124, 126 and 128. Steps 124, 126 and 128 are thus analogous to step 106 of the method 100. One or more amorphous ferromagnetic layer(s) are provided in the second AFC shield, via step 124. For example, CoFeB having at least ten atomic percent B may be provided. Although depicted as separate from step 126, described below, the amorphous ferromagnetic layers of step 124 may be insertion layers within the third and/or fourth ferromagnetic layers provided in step 124. The AFC layers are provided, via step 124. Step 124 thus includes depositing a third ferromagnetic layer, depositing a second nonmagnetic spacer layer on the third ferromagnetic layer and depositing fourth ferromagnetic layer on the second nonmagnetic spacer layer. The second nonmagnetic spacer layer is between the third ferromagnetic layer and the fourth ferromagnetic layer. The first second nonmagnetic spacer layer is configured such that the third and fourth ferromagnetic layers are antiferromagnetically coupled, as discussed above. The third magnetic layer has a third saturation magnetization and a third thickness. The fourth ferromagnetic layer has a fourth saturation magnetization and a fourth thickness. The third and fourth ferromagnetic layers may include one or more of NiFe, NiFeCo, CoFe, CoB, CoFeB and/or other ferromagnetic materials. The third and/or fourth ferromagnetic layer(s) may also be a multilayer. A second pinning layer is optionally provided on the AFC layers, via step 128. Step 128 may include depositing an antiferromagnetic layer, such as IrMn.

A second nonmagnetic layer may be optionally provided, via step 130. Step 130 may include depositing an aluminum oxide layer on the second AFC shield. The aluminum oxide layer may be at least one hundred nanometers thick and not more than one thousand nanometers thick. A second, top shield is optionally provided, via step 132. Step 132 typically includes plating a large high permeability layer.

Using the method 110, a transducer having mirrored AFC shields may be provided. The magnetic transducer 200 fabricated using the method 110 may have improved performance, particularly at higher recording densities and smaller track widths of the read sensor. Because of the symmetry between the mirrored AFC shields, there may be less magnetic noise, reduced disturbances due to internal or external fields near the sensor. Consequently, performance of the magnetic transducer may be improved.

FIG. 6 depicts an ABS view of another exemplary embodiment of a portion of a magnetic recording read transducer having mirrored AFC shields and which may be fabricated using the method 110. For clarity, FIG. 6 is not to scale. The read transducer 200′ may be part of a read head or may be part of a merged head that also includes a write transducer. The head of which the read transducer 200′ is part of a disk drive having a media, a slider and the head coupled with the slider. The read transducer 200′ is also described in the context of particular components. In other embodiments, some of the components may be omitted, provided in a different location, or have different constituents. Further, other components may be used.

The magnetic write transducer 200′ is analogous to the magnetic write transducer 200. The transducer 200′ thus includes a first AFC shield 210′, a read sensor 220, magnetic bias structure 230 and a second AFC shield 240′ analogous to the first AFC shield 210, the read sensor 220, the magnetic bias structure 230 and the second AFC shield 240, respectively. The structure and function of the components 210′, 220, 230 and 240′ may thus be analogous to that of the components 210, 220, 230 and 240, respectively. Other components may be included in the read transducer 200 but are not shown. The read sensor 220 may be a TMR sensor, a GMR sensor or another sensor. The read sensor 220 includes a sensor layer 222. In some embodiments, the sensor layer 222 is a free layer. The read sensor layer 222 has a track width, TW. In some embodiments, TW is not greater than twenty nanometers. In other embodiments, other track widths are possible. The magnetic bias structures 130 may be hard or soft magnetic bias structures.

The magnetic transducer 200′ is also shown as including optional first (bottom) shield 202, optional first nonmagnetic layer 204, optional second nonmagnetic layer 208 and optional second shield 206. In some embodiments, the shields 202 and 206 are mirrors. Stated differently, the saturation magnetization multiplied by the thickness of the first shield 202 may match the saturation magnetization multiplied by the thickness of the second shield 206 to within twenty percent. The shields 202 and 206 may also be desired to be symmetric with respect to the sensor layer 222 of the sensor 220. Thus, the shields 202 and 206 may be desired to be the same distance from the sensor layer 222 to within twenty percent. The thicknesses of various layers, such as the layers 204 and/or 208 may be adjusted. The shields 202 and 206 may be made of the same or different materials. Similarly, the nonmagnetic spacer layers 204 and 208 may be made of the same or different materials. In other embodiments, one or more of the layers 202, 204, 206 and 208 may be omitted.

The first AFC shield 210′ includes ferromagnetic layers 212 and 216 separated by a nonmagnetic spacer layer 214. The first AFC shield 210′ may also include optional pinning layer 218. In some embodiments, the pinning layer 218 may be omitted. Also shown in the first AFC shield are amorphous ferromagnetic layers 213 and 219 within ferromagnetic layers 212 and 216, respectively. The presence of layers 213 and 219 is thus indicated by dashed lines. In other embodiments, the amorphous ferromagnetic layer(s) 213 and/or 219 could be located outside of the ferromagnetic layers 212 and 216, respectively, or omitted. In other embodiments, one or both of the layers 213 and 219 may be omitted. For simplicity, optional seed and/or capping layer are not shown.

The second AFC shield 240′ includes ferromagnetic layers 242 and 246 separated by a nonmagnetic spacer layer 244. The second AFC shield 240′ may also include optional pinning layer 248. In some embodiments, the pinning layer 248 may be omitted. Also shown in the first AFC shield are amorphous ferromagnetic layers 243 and 249 within ferromagnetic layers 242 and 246, respectively. The presence of layers 243 and 249 is thus indicated by dashed lines. In other embodiments, the amorphous ferromagnetic layer(s) 243 and/or 249 could be located outside of the ferromagnetic layers 242 and 246, respectively, or omitted. In other embodiments, one or both of the layers 243 and 249 may be omitted. For simplicity, optional seed and/or capping layer are not shown. In some embodiments, the layers 216 and 246 include a bilayer (from bottom to top) of Ni₈₁Fe₁₉/Co₆₀Fe₄₀. In some such embodiments, the layers 212 and 246 may include a trilayer (from bottom to top) of Co₆₀Fe₄₀/Ni₈₁ Fe₁₉/Co₆₀Fe₄₀. In some embodiments, amorphous magnetic layers 213, 219, 243 and/or 249 are present. For example, the layer(s) 212, 216, 242 and/or 246 may include CoFeB having at least ten atomic percent B may be provided. For example, the ferromagnetic layers 212 and/or 242 may include multilayer of NiFe/CoFeB (layer 213 or 243)/NiFe/CoFe. The ferromagnetic layer(s) 216 and/or 246 may include a multilayer of CoFe/NiFe/CoFeB (layer 219 or 249)/NiFe.

As discussed above with respect to the shields 210 and 240, the AFC shields 210′ and 240′ are mirrors and may be symmetric with respect to the sensor layer 222. Thus, the thicknesses, t1, t2, t3 and/or t4 and the saturation magnetizations of the layers 212, 216, 242 and/or 246 are as discussed above. Similarly, the thicknesses and other features of the nonmagnetic spacer layers 214 and 244 are as discussed above.

The magnetic transducer 200′ fabricated using the method 110 may have improved performance, particularly at higher recording densities and smaller track widths of the read sensor 220. Because of the symmetry between the mirrored AFC shields 210′ and 240′, there may be less magnetic noise. The configuration of the AFC shields 210′ and 240′ may also reduce disturbances due to internal write fields or external stray fields near the sensor 220. Consequently, performance of the magnetic transducer 200 may be improved.

FIG. 7 is flow chart depicting another exemplary embodiment of a method 150 for fabricating an AFC shield in a magnetic recording read transducer. For simplicity, some steps may be omitted, interleaved, and/or combined. FIGS. 8-12 depicts an ABS view of another exemplary embodiment of a portion of a magnetic recording read transducer 250 during fabrication. For clarity, FIGS. 8-12 are not to scale. The method 150 is described in the context of providing a single recording transducer 250. However, the method 150 may be used to fabricate multiple transducers at substantially the same time and/or another transducer. The method 150 is also described in the context of particular layers. A particular layer may include multiple materials and/or multiple sub-layers. The method 150 also may start after formation of other portions of the magnetic recording transducer.

The first pinning layer is optionally provided, via step 152. Step 152 may thus be performed only if the pinning layer 218 is to be used. The first magnetic layer is deposited, via step 154. The first nonmagnetic spacer layer is provided, via step 156. The second magnetic layer is deposited, via step 158. Steps 152, 154, 156 and 158 may include full-film depositing the layers. An anneal may then be performed, via step 160. For example, the anneal of step 160 may be performed at high temperatures in order to set the magnetization direction of the first magnetic layer. FIG. 8 depicts an ABS view of the transducer 250 after step 160 is performed. Thus, an AFC stack 254 is shown on underlayer(s) 252. The underlayer(s) 252 may include the bottom shield and first nonmagnetic layer. The AFC stack 254 may include not only the first and second ferromagnetic layers separated by first nonmagnetic spacer layer but also the first pinning layer.

A mask that covers the desired region for the first AFC shield is provided, via step 162. This step may include photolithographically forming the mask. FIG. 9 depicts the transducer 250 after step 162 is performed. Thus, a mask 256 has been provided.

The exposed portion of the AFC stack is removed, for example via ion milling, via step 164. FIG. 10 depicts an ABS view of the transducer 250 after step 164 is performed. Thus, the edges of the AFC stack 254′ have been defined in at least the track width direction. A refill step if performed, via step 166. Step 166 may include depositing a nonmagnetic material, such as aluminum oxide, while the mask 256 remains in place. FIG. 11 depicts the transducer after step 166 is performed. Thus, the nonmagnetic layer 258 is shown. The mask 256 is lifted off, via step 168. Also in step 168, the transducer may be planarized. FIG. 12 depicts the transducer 250 after step 168 is performed. Thus, the AFC shield 254′ remains. Fabrication of other components of the transducer may then be completed.

The magnetic transducer 250 fabricated using the method 150 may have improved performance, particularly at higher recording densities and smaller track widths of the read sensor. Because of the symmetry between the mirrored AFC shields 254′ and the remaining shield (not shown), there may be less magnetic noise. The configuration of the AFC shield 254′ and its mirror may also reduce disturbances due to internal write fields or external stray fields near the sensor. Consequently, performance of the magnetic transducer 250 may be improved.

FIG. 13 is flow chart depicting another exemplary embodiment of a method 170 for fabricating an AFC shield in a magnetic recording read transducer. For simplicity, some steps may be omitted, interleaved, and/or combined. FIGS. 14-17 depicts an ABS view of another exemplary embodiment of a portion of a magnetic recording read transducer 270 during fabrication. For clarity, FIGS. 14-17 are not to scale. The method 170 is described in the context of providing a single recording transducer 270. However, the method 170 may be used to fabricate multiple transducers at substantially the same time and/or another transducer. The method 170 is also described in the context of particular layers. A particular layer may include multiple materials and/or multiple sub-layers. The method 170 also may start after formation of other portions of the magnetic recording transducer.

A nonmagnetic layer may be provided, via step 172. The nonmagnetic layer provided in step 172 may be analogous to the nonmagnetic layer 204 depicted in FIG. 6. Referring back to FIGS. 13-17, a mask that exposes the region on which the first AFC shield is desired to be located is provided, via step 174. FIG. 14 depicts the transducer 270 after step 174 is performed. Thus, the underlayer(s) 272 and mask 274 are shown. The underlayer(s) 272 include the nonmagnetic layer provided in step 172. Other layers may also be present.

A trench is formed in the nonmagnetic layer, via step 176. Step 176 may include a mill, a reactive ion etch (RIE) of the region or other mechanism to form a trench in the nonmagnetic layer. FIG. 15 depicts the transducer 270 after step 176 is performed. Thus, a trench 276 has been provided.

The first pinning layer is optionally provided, via step 178. Step 178 may thus be performed only if the pinning layer 218 is to be used. The first magnetic layer is deposited, via step 180. The first nonmagnetic spacer layer is provided, via step 182. The second magnetic layer is deposited, via step 184. Steps 180, 182 and 184 may include full-film depositing the layers. FIG. 16 depicts an ABS view of the transducer 270 after step 182 is performed. Thus, an AFC stack 276 is shown on underlayer(s) 272. The AFC stack 274 may include not only the first and second ferromagnetic layers separated by first nonmagnetic spacer layer but also the first pinning layer.

The mask 274 is lifted off, via step 186. Also in step 186, the transducer may be planarized. FIG. 17 depicts the transducer 250 after step 186 is performed. Thus, the AFC shield 274 remains. An anneal may then be performed, via step 188. For example, the anneal of step 188 may be performed at high temperatures in order to set the magnetization direction of the magnetic layers. Fabrication of other components of the transducer may then be completed.

The magnetic transducer 270 fabricated using the method 170 may have improved performance, particularly at higher recording densities and smaller track widths of the read sensor. Because of the symmetry between the mirrored AFC shields 276 and the remaining shield (not shown), there may be less magnetic noise. The configuration of the AFC shield 2276 and its mirror may also reduce disturbances due to internal write fields or external stray fields near the sensor. Consequently, performance of the magnetic transducer 270 may be improved.