Differential dual free layer magnetic reader

Description

BACKGROUND

FIG. 1 depicts an air-bearing surface (ABS) view of a conventional differential read transducer usable in magnetic recording technology applications. The conventional read transducer 10 includes insulator 14, magnetic bias structures 16, and differential dual spin valve sensor 20. The differential dual spin valve sensor 20 typically includes two giant magnetoresistive (GMR) sensors or two tunneling magnetoresistive (TMR) sensors. The differential dual spin valve sensor 20 includes two antiferromagnetic (AFM) layers 22, two pinned layers 24, two nonmagnetic spacer layers 26, two free layers 28, and a nonmagnetic layer 29 between the two free layers 28. Also shown is a capping layer 30. Seed layer(s) might also be used. Each free layer 28 has a magnetization sensitive to an external magnetic field. The free layers 28 function as sensor layers for the differential dual spin valve sensor 20. If the differential dual spin valve sensor 20 is to be used in a current perpendicular to plane (CPP) configuration, then current is driven in a direction substantially perpendicular to the plane of the layers 22, 24, 26, 28 and 29. Conversely, in a current-in-plane (CIP) configuration, then conductive leads (not shown) would be provided on the magnetic bias structures 16. The magnetic bias structures 16 are used to magnetically bias the free layers 28.

Although the conventional transducer 10 functions, there are drawbacks. The trend in magnetic recording is to higher areal density memories. The large stack size for the conventional differential dual spin valve sensor 20 may be challenging to fabricate at smaller track widths. For example, the height of the stack from the bottom AFM layer 22 to top AFM layer 22 may be on the order of forty nanometers. A small track width for such a large stack height may be difficult to achieve. Fabrication may be further complicated by the orientation of the AFM layers 22. In general, these AFM layers 22 are magnetically biased in opposite directions. Such biasing may be challenging to accomplish. Further, side reading may be adversely affected by the absence of shields. Accordingly, what is needed is a system and method for improving the performance and/or fabrication of a magnetic recording read transducer at higher areal densities.

BRIEF DESCRIPTION OF SEVERAL VIEWS OF THE DRAWINGS

FIG. 1 depicts an ABS view of a conventional differential dual spin valve magnetic recording read transducer.

FIGS. 2A-2C depicts ABS, plan and apex views of an exemplary embodiment of a portion of a dual free layer magnetic read transducer.

FIGS. 3A-3B depict plan and apex views of another exemplary embodiment of a portion of a differential dual free layer magnetic read transducer.

FIGS. 4A-4B depict plan and side views of another exemplary embodiment of a portion of a differential dual free layer magnetic read transducer.

FIGS. 5A-5B depict perspective views of an exemplary embodiment of a portion of a differential dual free layer magnetic read transducer reading a media.

FIG. 6 is flow chart depicting an exemplary embodiment of a method for reading using a differential dual free layer magnetic recording read transducer.

FIG. 7 is a flow chart depicting an exemplary embodiment of a method for fabricating a differential dual free layer magnetic read transducer.

FIG. 8 is flow chart depicting an exemplary embodiment of a method for providing a differential dual free layer sensor.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

FIGS. 2A-2C depict ABS, plan and side views of an exemplary embodiment of a portion of a magnetic read transducer 100. For clarity, FIGS. 2A-2C are not to scale. The read transducer 100 may be part of a read head or may be part of a merged head that also includes a write transducer. The head of which the read transducer 100 is a part is contained in a disk drive having a media, a slider and the head coupled with the slider. Further, only a portion of the components of the read transducer 100 are depicted.

The transducer 100 includes optional magnetic shields 102 and 104, insulator 106, read sensor 110, side bias structures 120 and rear bias structure 130 that may be separated from the read sensor 110 by an insulating layer 140. The magnetic shields 102 and 104 may be a monolithic soft magnetic shield, may be a multilayer antiferromagnetically coupled (AFC) shield or may have another structure. The read sensor 110 is between the rear bias structure 130 and the ABS. Further, an insulating layer 140 may separate the rear bias structure 130 from the sensor 110 and bias structures 120. Such an insulating layer 140 may be used if the rear bias structure 130 is conductive. In addition, although the shields 102 and 104 are shown as extending only to the stripe height of the sensor 110, the shields 102 and 104 generally extend significantly further in the stripe height direction. However, the shields 102 and 104 may also be magnetically decoupled from the rear bias structure 160. Thus, the insulating layer 140 may extend along the depth of the rear bias structure 130. For example, in some embodiments, the insulating layer 140 is at least ten Angstroms and not more than forty Angstroms thick. The insulating layer 140 is also nonmagnetic. Thus, the read sensor 110 may be electrically insulated from the rear bias structure 130 and not exchanged coupled with the rear bias structure 130. Although not depicted in FIGS. 2A-2C, an insulating capping layer may also be provided on top of the rear bias structure 130.

The read sensor 110 includes a first free layer 112 and a second free layer 116 separated by a nonmagnetic spacer layer 114. The nonmagnetic spacer layer 114 may be conductive, an insulating tunneling barrier layer such as an MgO layer having a thickness of not more than twenty Angstroms. Alternatively, the nonmagnetic spacer layer 114 may have another structure. The free layers 112 and 116 are ferromagnetic and may include multiple sublayers. In some embodiments, the track width (TW) of the read sensor 110 is not more than thirty nanometers. In some such embodiments, the track width is not more than twenty nanometers. In addition, as can be seen in FIGS. 2A-2C, the sensor 110 only includes magnetic layers in the free layers 112 and 116. No reference layers or pinning (AFM) layers are utilized. The magnetic reader 100 may be free of magnetic layers between the free layer 112 and the shield 102. Similarly, the magnetic reader 100 may be free of magnetic layers between the free layer 116 and the shield 104. The free layers 112 and 116 are also shown as adjoining the nonmagnetic spacer layer 114. As a result, the sensor 110 is thin in the down track direction. Thus, the shield-to-shield spacing, SS1, of the magnetic transducer may be reduced. In some embodiments, the shield-to-shield spacing is the combined thickness of the layers 112, 114, 116, 118 (if present) and any nonmagnetic seed layers. For example, the shield-to-shield spacing may be less than twenty nanometers. In some embodiments, the shield-to-shield spacing may be less than sixteen nanometers.

The free layers 112 and 116 are biased such that their magnetic moments 113 and 117, respectively are in a scissor mode. The free layers 112 and 116 are also biased such that the sensor 110 may function as a differential read sensor for a perpendicular medium (not shown). A perpendicular medium is one in which the directions of magnetization of the bits are substantially perpendicular to the surface of the medium. The read sensor 110 is a giant magnetoresistive (GMR) or tunneling magnetoresistive (TMR) read sensor in which the magnetoresistance is developed between the two ferromagnetic free layers 112 and 116. Based on the angle between the magnetic moments 113 and 117, the resistance of the read sensor 110 changes. In the embodiment shown, the magnetic moments 113 and 117 are biased to be parallel and in cross-track direction by the side bias structures 120. Without more, the free layer magnetic moments 113 and 117 may be parallel to the magnetic moments 122 of the side bias structures 120. However, the rear bias structure 130 also biases the free layer magnetic moments 113 and 117 perpendicular to the ABS. As can be better seen in FIGS. 2B and 2C the rear bias structure 130 biases the magnetic moment 113 in one direction perpendicular to the ABS, while magnetically biasing the magnetic moment 117 of the free layer 116 in the opposite direction. For example, the moment 132 of the rear bias structure 130 magnetically biases the magnetic moment 113 of the free layer 112 out of the plane of the ABS/transducer and toward the media. The magnetic moment 134 of the rear bias structure 130 biases the magnetic moment 117 of the free layer 116 into the plane of the ABS/transducer and away from the media. Consequently, the magnetic moments 113 and 117 of the free layer 112 and 116, respectively, are biased in a scissor state. Note that in some embodiments, the free layers 112 and 116 may be ferromagnetically coupled or antiferromagnetically coupled through the nonmagnetic spacer layer 114.

As discussed above, the side bias structures 120 magnetically bias the free layers 112 and 116 in the cross track direction. The side bias structures 120 may include soft magnetic materials, such as NiFe, and have magnetic moment 122.

The rear bias structure 130 may be a soft magnetic bias structure or may have another structure including but not limited to hard magnetic layers. For example, soft magnetic layers used in the rear bias structure 130 may have a coercivity of less than one hundred Oersted. In some embodiments, the coercivity is not more than ten Oersted. The soft magnetic layer(s) may include single alloys, multiple layer(s), a mixed-composition alloy and/or other components. Other components, such as a pinning structure, may be included in the rear bias structure 130. A pinning structure is a magnetic component used to magnetically bias other portions of the rear magnetic bias structure 130. For example, the pinning structure might be an antiferromagnetic (AFM) layer. In other embodiments, other configurations might be possible.

As discussed above, the rear bias structures 130 provides magnetic biasing in opposite directions for the free layers 112 and 116. Thus, magnetic moments 132 and 134 are shown in proximity to the layers 112 and 116, respectively. In some embodiments, the rear bias structure 130 includes antiferromagnetically coupled soft magnetic layers. The layers may be antiferromagnetically coupled via a Ruderman-Kittel-Kasuya-Yosida (RKKY) interaction. Because they are antiferromagnetically coupled, such magnetic layers could provide the magnetic biasing in opposite directions for the free layers 112 and 116. In such embodiments, the layer having the magnetic moment 132 may be desired to have its top surface closer to the top surface of the free layer 112 than to the bottom surface of the free layer 116 (not more than halfway between the bottom surface of the free layer 116 and the top surface of the free layer 112). Similarly, the layer having the magnetic moment 134 may be desired to have its bottom surface closer to the bottom surface of the free layer 116 than to the top surface of the free layer 112. Such a structure may provide the desired magnetic bias for the free layers 112 and 116.

The magnetic moments 132 and 134 of the rear bias structure 130 is used to bias the sensor 110 in the stripe height direction. Consequently, the rear bias structure 130 has a magnetic anisotropy in the stripe height direction. This anisotropy may arise from one or more effects. For example, the rear bias structure 130 may have a shape anisotropy. In such embodiments, the width in the cross-track direction, w, is less than the length in the stripe height direction, I (w<I). In some embodiments, the length is at least four multiplied by the width. In some such embodiments, the length is at least ten multiplied by the width. The width is shown in FIG. 2B as being slightly smaller than track width, TW, of the sensor 110. In other embodiments, other widths can be used. For example, in some cases, the width is being substantially the same as the track width of the read sensor 110. In such embodiments, this is because the sensor 110 and rear bias structure 130 are defined in the cross-track direction using a single mask. Stated differently, the rear bias structure 130 and sensor 110 may be self-aligned. The thickness in the down-track direction, t, of the rear bias structure 130 may also be set to provide the desired magnetic biasing of the free layers 112 and 116. Similarly, the rear bias structure 130 may have a crystalline anisotropy that favors a perpendicular-to-ABS orientation of the magnetic moment 132 and 134. The rear bias structure 130 may have a magnetic anisotropy due to deposition in a magnetic field. In some embodiments, the rear bias structure 130 may have a magnetoelastic anisotropy, for example due to magnetostriction. In other embodiments, a pinning layer (not shown in FIGS. 2A-2C) or other structure (not shown) may be used to induce the magnetic anisotropy in the rear bias structure 130. One or more of these mechanisms may be used in providing the desired magnetic characteristics for the rear bias structure 130.

Further, the rear bias structure 130 provides sufficient moment to bias the magnetic moments 113 and 117 of the free layers 112 and 116, respectively. For example, in some embodiments, the rear soft bias structure has a saturation magnetization-thickness product of at least one milli-emu/cm² and not more than three milli-emu/cm². In some such embodiments, the saturation magnetization-thickness product is not more than two milli-emu per cm². In general, however, the saturation magnetization-thickness product of the rear bias structure 130 depends upon the saturation magnetization-thickness products of the free layer and the side bias structures. The thickness used in the saturation magnetization-thickness product is the depth of each of the magnetic layer(s) of the rear bias structure 130 in the down track direction.

The magnetic transducer 100 may be suitable for use in high density magnetic recording applications, for example those having a sensor track width (and thus rear bias structure 130 width) of not more than thirty nanometers. In some embodiments, the track width and rear bias structure width may be not greater than twenty nanometers. The read sensor 110 may not include an antiferromagnetic layer or a pinned layer. Consequently, the shield-to-shield spacing (SS1) between the shields 102 and 104 may be reduced. The lower shield-to-shield spacing may be conducive to use in high areal density magnetic recording. The use of the differential mode may also enhance the read signal and allow the differential read sensor 110 to detect transitions between bits. This scissor mode may be more reliably achieved because of the presence of the rear bias structure 130. In particular, the shape anisotropy, width and other aspects of the rear bias structure 130 may allow for more reliable biasing of the read sensor. Further, the linear resolution of the read transducer 100 may be given by the distance between the free layers 112 and 116. The thickness of the nonmagnetic spacer layer 114 may be on the order of two to three nanometers or less. Thus, the linear resolution of the magnetic junction 100 may be improved. The magnetic read transducer 100 may thus be suitable for higher density magnetic recording.

FIGS. 3A and 3B depict plan and apex views, respectively, of another embodiment of a magnetic read transducer 100′. For clarity, FIGS. 3A and 3B are not to scale. The read transducer 100′ may be part of a read head or may be part of a merged head that also includes a write transducer. The head of which the read transducer 100′ is a part is part of a disk drive having a media, a slider and the head coupled with the slider. The transducer 100′ corresponds to the transducer 100. Consequently, analogous components are labeled similarly. For example, the transducer 100′ includes a read sensor 110 having free layers 112 and 116 separated by a nonmagnetic spacer layer 114 that are analogous to such structures in the transducer 100. Thus, the read sensor 110 may be a differential read sensor in which the free layers 112 and 116 are biased in a scissor mode. Thus, the components 102, 104, 110, 112, 114 116, 130′ and 140 have a similar structure and function to the components 102, 104, 110, 112, 114 116, 130 and 140, respectively, depicted in FIGS. 2A-2C. Further, although an ABS view is not shown, the transducer 100′ may appear substantially the same from the ABS as the transducer 100.

In the embodiment shown in FIGS. 3A-3B, the rear bias structure 130′ expressly includes two soft magnetic layers 170 and 180 separated by a nonmagnetic layer 175. The soft magnetic layer 170 and 180 may also be antiferromagnetically coupled through the nonmagnetic layer 175, for example via an RKKY interaction. The bias structure 130′ may be configured such that the magnetic moments 132 and 134 are stable perpendicular to the ABS. For example, the magnetic layer 170 and 180 of the rear bias structure 130′ may each have a magnetic anisotropy analogous to that described above for the rear bias structure 130. For example, a shape anisotropy, crystalline anisotropy, pinning layer(s) and/or other mechanism may be used to stabilize the magnetizations 132 and 134. In some embodiments, the length, I, of the layers 170 and 180 may be much greater than the width, w′, or heights of the layers 170 and 180. In the embodiment shown, the height, t, of the rear bias structure 130′ is shown as the same as that of the read sensor 110. However, the heights may differ. In addition, the top of the soft bias layer 170 is shown aligned with the top of the free layer 112 in the down track direction. Similarly, the bottom of the soft bias layer 180 is shown aligned with the bottom of the free layer 116 in the down track direction. In other embodiments, these surfaces may not be aligned. However, the top of the soft layer 170 may be closer to the top of the free layer 112 than to the bottom of the free layer 116. Similarly, the bottom of the soft bias layer 180 may be closer to the bottom of the free layer 116 than to the top of the free layer 112. Thus, the soft bias layers 170 and 180 magnetically bias the free layers 112 and 116 in opposite directions substantially perpendicular to the ABS.

Note that in the embodiment shown in FIGS. 3A and 3B, the width, w′, of the rear bias structure 130′ differs from the track width. In the embodiment shown, the widths of the read sensor 110 and rear bias structure 130′ may be defined using separate processing step and/or different masks. In other embodiments, the width w′ may be substantially the same as the track width TW.

The magnetic transducer 100′ shares the benefits of the magnetic transducer 100. The magnetic transducer 100′ may be suitable for use in higher density magnetic recording for example due to a smaller shield-to-shield spacing and/or a higher linear resolution. Performance of the sensor 110 may thus be improved.

FIGS. 4A and 4B depict plan and apex views of another embodiment of a magnetic read transducer 100″. For clarity, FIGS. 4A and 4B are not to scale. The read transducer 100″ may be part of a read head or may be part of a merged head that also includes a write transducer. The head of which the read transducer 100″ is a part is part of a disk drive having a media, a slider and the head coupled with the slider. The transducer 100″ corresponds to the transducers 100 and/or 100′. Consequently, analogous components are labeled similarly. For example, the transducer 100″ includes a differential read sensor 110 having free layers 112 and 116 separated by a nonmagnetic spacer layer 114 that are analogous to such structures in the transducer 100. Thus, the components 102, 104, 106, 110, 112, 114, 116, 120′, 130″, 140, 170′, 175′ and 180′ have a similar structure and function to the components 102, 104, 106, 110, 112, 114 116, 120, 130/130′, 140, 170, 175 and 180, respectively, depicted in FIGS. 2A-2C and 3A-3B. Further, although an ABS view is not shown, the transducer 100″ may appear substantially the same from the ABS as the transducer 100/100′.

In the embodiment shown in FIGS. 4A-4B, the rear bias structure 130″ includes antiferromagnetically coupled soft magnetic layers 170′ and 180′. The width of the rear bias structure 130″ in the cross track direction, w″ is equal to the track width of the sensor 110. Thus, in the embodiment shown, the rear bias structure 130″ and the sensor 110 may be self-aligned. The top surface of the rear soft bias layer 170′ is shown as aligned with the top surface of the free layer 112. Similarly, the bottom surface of the rear soft bias layer 180′ is depicted as aligned with the bottom surface of the free layer 116. Other configurations are possible. However, the layers 170′ and 180′ are desired to magnetically bias the free layers 112 and 116, respectively, in the directions of their magnetic moments 132 and 134, respectively. Thus, the magnetic anisotropies and/or other characteristics of the rear soft bias structure 130″ may be analogous to those described above.

The side bias structures 120′ depicted in FIG. 4A extend further in the stripe height direction than the sensor 110. Thus, the stripe height/back edge of the sensor 110 may be defined separately from the back edges of the side bias structures 120′. The side bias structures 120′ are shown as extending as far as the rear bias structure 130″ in the stripe height direction. In other embodiments, however, the side bias structures 120′ may terminate a different distance from the ABS than the rear bias structure 130″.

The magnetic transducer 100″ shares the benefits of the magnetic transducer(s) 100 and/or 100′. The magnetic transducer 100″ may be suitable for use in higher density magnetic recording for example due to a smaller shield-to-shield spacing and/or a higher linear resolution. Performance of the sensor 110 may thus be improved.

FIGS. 5A and 5B depict perspective views of an exemplary embodiment of a portion of a data storage device 200 as well as a corresponding read signal 230 and 230′, respectively. For clarity only a portion of the data storage device, read transducer and media are shown. FIGS. 5A and 5B are also not to scale. Operation of the magnetic transducers 100, 100′ and 100″ may be understood with respect to FIGS. 5A and 5B. The data storage device 200 includes transducer having a differential read sensor 220 and media 210. The read sensor 220 is a differential read sensor including free layers 222 and 224 having magnetic moments 223 and 225, respectively. The read sensor 220 is analogous to the read sensor 110. The positions of the magnetic moments 223 and 225 in the absence of a field from the media are denoted by dashed lines. In the embodiment shown, the free layer magnetic moments 223 and 225 are biased to be perpendicular in the absence of an external field. However, other configurations are possible.

The media 210 is a perpendicular media in which the data are stored such that the magnetic moments are substantially perpendicular to the media surface. For the purposes of this explanation, a logical “1” occurs for a magnetic moment directed out of the plane of the media and a logical “0” occurs for a magnetic moment directed into the plane of the media. Thus, in FIG. 5A, bit 212 stores a “1” using magnetic moment 213, while bit 214 stores a “0” using magnetic moment 215. In FIG. 5B, bit 216 stores a “0” using magnetic moment 217, while bit 218 stores a “1” using magnetic moment 219.

In FIG. 5A, the read sensor 220 is used to read a transition from a “1” in bit 212 to a “0” in bit 214. It is presumed that the previous bits stored a logical “1”. Thus, both magnetic moment 223 and 225 would be canted in the same direction (up) prior to the bits 212 and 214. As the sensor 220 approaches the transition between the bits 212 and 214, the free layer 224 starts to respond to the field due to the bit 214. Thus the moment 225 begins to rotate down, further from the magnetic moment 223 of the free layer 222. As the read sensor 220 begins passing over the transition, the free layer moment 225 responds primarily to the magnetic moment 215 of the bit 214 and is rotated down. In contrast, the free layer moment 223 still responds primarily to the magnetic moment 213 of the bit 212 and is rotated up. When the center of the read sensor 220 passes over the transition, the magnetic moments 223 and 225 may be separated by the largest (obtuse) angle. This is the situation depicted in FIG. 5A. Thus, a maximum in the signal 230 occurs may occur the center of the read sensor 220 passes over the transition between the bits 212 and 214. As the read sensor 220 continues, the free layer magnetic moment 223 responds more to the magnetic moment 215 of the bit 214 and rotates down. The angle between the free layer magnetic moments 223 and 225 decreases. Thus, the signal 230 decreases as the read sensor 220 passes the transition.

In FIG. 5B, the read sensor 220 is used to read a transition from a “0” in bit 216 to a “1” in bit 218. It is presumed that the previous bits stored a logical “0”. Thus, both magnetic moment 223 and 225 would be canted in the same direction (down) prior to the bits 216 and 218. As the sensor 220 approaches the transition between the bits 216 and 218, the free layer 224 starts to respond to the field due to the bit 218. Thus the moment 225′ begins to rotate up, closer to the magnetic moment 223′ of the free layer 222. As the read sensor 220 begins passing over the transition, the free layer moment 225′ responds primarily to the magnetic moment 219 of the bit 218 and is rotated up. In contrast, the free layer moment 223′ still responds primarily to the magnetic moment 217 of the bit 216 and is rotated down. When the center of the read sensor 220 passes over the transition, the magnetic moments 223′ and 225′ may be separated by the smallest (acute) angle. This is the situation depicted in FIG. 5B. Thus, a minimum in the signal 230′ occurs may occur the center of the read sensor 220 passes over the transition between the bits 216 and 218. As the read sensor 220 continues, the free layer magnetic moment 223′ responds more to the magnetic moment 219 of the bit 218 and rotates up. The angle between the free layer magnetic moments 223′ and 225′ decreases. Thus, the signal 230′ decreases as the read sensor 220 passes the transition. As such, the reader 220 may detect transitions in the media 210. The read sensor 220 is, therefore, a differential read sensor. Thus, the read sensor 220 may be seen as measuring a gradient in the magnetic field due to the bits 212, 214, 216 and 218 stored in the media 210.

FIG. 6 is an exemplary embodiment of a method 250 for utilizing a read transducer such as the devices 100, 100′, 100″ and/or 200. For simplicity, some steps may be omitted, interleaved, combined, have multiple substeps and/or performed in another order unless otherwise specified. The method 250 is described in the context of the magnetic recording disk drive 200. However, the method 250 may be used for the transducer(s) 100′, 100″ and/or 100″.

The read sensor 220 is driven with a read current, via step 252. The read current may be used to obtain a voltage across the read sensor 220. The read sensor 220 is passed in proximity to the media 210 while the read current is driven through the read sensor 220 in step 252.

A signal is received from the differential read sensor 220, via step 254. The signal may be a current or voltage indicative of the magnetoresistance between the free layers 222 and 224. Thus, the signal received in step 254 indicates the presence of transitions between bits.

Using the method 250, the read sensor 220 and/or 110 may be used. Thus, reading of higher areal density magnetic media may be achieved.

FIG. 7 is an exemplary embodiment of a method 300 for providing a read transducer. For simplicity, some steps may be omitted, interleaved, combined, have multiple substeps and/or performed in another order unless otherwise specified. The method 300 is described in the context of providing a magnetic recording disk drive and transducer 100. However, the method 300 may be used in fabricating the transducer 100′, 100″ and/or 200. The method 300 may be used to fabricate multiple magnetic read heads at substantially the same time. The method 300 may also be used to fabricate other magnetic recording transducers. The method 300 is also described in the context of particular layers. A particular layer may include multiple materials and/or multiple sub-layers. The method 300 is described in the context of a disk drive. However, the method may be used in other applications employing a magnetoresistive and bias structures. The method 300 also may start after formation of other portions of the magnetic recording transducer.

The bottom shield 102 may optionally be provided, via step 302. The read sensor 110 is provided, via step 304. Step 304 may include depositing a stack of layers for the read sensor and defining the read sensor in the cross-track and stripe height directions. The rear bias structure 130 is provided, via step 306. Step 306 may be performed after the sensor 110 has been defined in at least the stripe height direction. Thus, at least part of step 306 is performed after at least part of step 304. Step 306 may include providing antiferromagnetically coupled soft magnetic layers such as the layers 170/170′ and 180/180′. Steps 304 and 306 also include defining the read sensor 110 and rear magnetic bias structure 130 in the track width direction. In some embodiments, the track width of the read sensor 110 and the width of the rear magnetic bias structure 130 are defined together.

The side bias structures 120 are provided, via step 308. Step 308 is performed after the read sensor is defined in the cross-track direction in step 304. Thus, at least part of step 304 is performed before step 308. Step 308 may include depositing the insulating layer 106, depositing the material(s) for the magnetic bias structures 120. A mill step and planarization, such as a chemical mechanical planarization (CMP) may also be performed. The top shield 104 may optionally be provided in step 309.

Using the method 300, the transducers 100, 100′, 100″ and/or 200 may be fabricated. Thus, the benefits of one or more of the transducers 100, 100′, 100″ and/or 200 may be achieved.

FIG. 8 is an exemplary embodiment of a method 310 for providing a rear bias structure of a read transducer. For simplicity, some steps may be omitted, interleaved, combined, have multiple substeps and/or performed in another order unless otherwise specified. The method 310 is described in the context of providing a magnetic recording disk drive and transducer 100′. However, the method 310 may be used in fabricating the transducer 100, 100″ and/or 200. The method 310 may be used to fabricate multiple magnetic read heads at substantially the same time. The method 310 may also be used to fabricate other magnetic recording transducers. The method 310 is also described in the context of particular layers. A particular layer may include multiple materials and/or multiple sub-layers. The method 310 is described in the context of a disk drive. However, the method may be used in other applications employing a magnetoresistive and bias structures. The method 310 also may start after formation of other portions of the magnetic recording transducer.

The read sensor stack is deposited, via step 212. Step 212 includes depositing the free layer 112, depositing the nonmagnetic layer 114 and depositing the free layer 116. The read sensor 110 is defined in the stripe height direction, via step 314. In some embodiments, step 314 occurs before the read sensor is defined in the cross-track direction. Step 314 may include masking and ion milling the read sensor stack. Thus, space may be made for the rear bias structure 130/130′/130″. The insulating layer 140 is provided, via step 316.

The layers 170, 175 and 180 are deposited to the desired thicknesses, via step 318. Thus, the magnetic layers 170 and 180 may be antiferromagnetically coupled through the nonmagnetic layer 175.

The rear bias structure 130′ and the read sensor 110 may be defined in the cross track direction, via step 320. Thus, the rear bias structure 130′ and the read sensor 110 are self-aligned and have matching track width/width. In other embodiments, the widths of the rear bias structure 130′ and the read sensor 110 may be defined separately.

An insulating layer 106 may be provided, via step 322. The side bias structures 120 may then be provided, via step 324.

Thus, the magnetic transducer 100′ may be fabricated. The method 320 may also be used to fabricate the transducer(s) 100, 100″ and/or 200. Thus, the benefits of one or more of the transducers 100, 100′, 100″ and/or 200 may be achieved.