Apparatuses and methods for adjusting a delay of a command signal path

Description

TECHNICAL FIELD

Embodiments of the invention relate generally to semiconductor memory, and more specifically, in one or more described embodiments, to signal paths and adjusting the timing of command signals through the signal path.

BACKGROUND OF THE INVENTION

In semiconductor memory, proper operation of the memory is based on the correct timing of various internal command and clock signals. For example, in reading data from the memory, internal clock signals that clock data path circuitry to provide (e.g. output) the read data may need to be provided substantially concurrently with internal read command signals to properly enable the data path circuitry to output the read data. If the timing of the internal read command signal is not such that the data path circuitry is enabled at the time the internal clock signal clocks the data path circuitry to output the read data at an expected time, the read command may be inadvertently ignored or the read data provided by the memory may not be correct (e.g., the data associated with another read command). Likewise, in writing data to memory internal clock signals that clock data path circuitry to latch write data may need to be provided with specific timing relationships with internal write command signals to properly enable the data path circuitry to provide the latched write data for writing to memory. Inaccurate timing of the internal command and clock signals could result in the write command being inadvertently ignored or incorrect write data being provided to the memory may (e.g., the write data is associated with another write command). Another example of a command that may require the correct timing of internal clock signals and the command for proper operation include, for example, on-die termination enable commands.

Moreover, as known, a “latency” may be selected (e.g., programmed, desired, used, given, etc.) to set a time, typically in numbers of clock periods T, between receipt of a read command by the memory and when the data is output by the memory. A “write latency” may also be selected to set a time, also typically in numbers of T, between receipt of a write command by the memory and when the write data is provided to the memory. The latencies may be selected, for example, to accommodate clock signals of different frequencies (i.e., different clock periods).

Complicating the generating of correctly timed internal clock and command signals is the relatively high frequency of memory clock signals, such as 1 GHz or higher. For example, memory clock signals can exceed 1 GHz. Further complicating the matter is that multi-data rate memories may provide and receive data at a rate higher than the memory clock signal, which may represent the rate at which commands may be executed. As a result, command signals and an internal clock signal may need to be in sync in order to maintain proper timing. An example of a multi-data rate memory is one that outputs read data at a rate twice that of the clock frequency, such as outputting data synchronized with clock edges of the memory clock signal.

An example conventional approach of timing internal command and clock signals is modeling both the clock path and the command path to have the same propagation delay. This may require, however, that delays and/or counter circuitry run continuously. As a result, power consumption may be higher than desirable. Additionally, the propagation delay of the various internal clock and command paths can often vary due to power, voltage, and temperature conditions. For clock and command paths having relatively long propagation delay or additional delay circuitry, the variations due to operating conditions may negatively affect the timing of the internal signals to such a degree that the memory does not operate properly.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram of an apparatus including a command decoder in accordance with an embodiment of the present disclosure.

FIG. 2 is a block diagram of the command decoder of FIG. 1, in accordance with an embodiment of the present disclosure.

FIG. 3 is a timing diagram of various signals during operation of the command decoder of FIG. 2 in accordance with an embodiment of the present disclosure.

FIG. 4 is a block diagram of a command extension circuit in the command decoder of FIG. 2 in accordance with an embodiment of the present disclosure.

DETAILED DESCRIPTION

Certain details are set forth below to provide a sufficient understanding of embodiments of the invention. However, it will be clear to one skilled in the art that embodiments of the invention may be practiced without these particular details. Moreover, the particular embodiments of the present invention described herein are provided by way of example and should not be used to limit the scope of the invention to these particular embodiments. In other instances, well-known circuits, control signals, timing protocols, and software operations have not been shown in detail in order to avoid unnecessarily obscuring the invention.

FIG. 1 is a block diagram of a portion of an apparatus 100 including a control circuit in accordance with an embodiment of the present disclosure. As used herein, an “apparatus” can refer to, for example, circuitry, a semiconductor die, a device, or a system. The apparatus 100 includes a memory array 101 of memory cells, which may be, for example, dynamic random access memory (DRAM) memory cells, static random access memory (SRAM) memory cells, flash memory cells, or some other types of memory cells. The apparatus 100 includes a control circuit 102 that receives memory commands and provides (e.g., generates) corresponding control signals within the apparatus 100 to execute various memory operations.

Row and column address signals are provided (e.g., applied) to the apparatus 100 via an address latch 110. The address latch captures the received address signals, and then provides a column address and a row address to a column address decoder 121 and a row address decoder 122, respectively. The column address decoder 121 selects bit lines extending through the memory array 101 corresponding to respective column addresses. The row address decoder 122 is coupled to a word line driver 124 that activates respective rows of memory cells in the memory array 101 corresponding to received row addresses. The selected data line (e.g., a bit line or bit lines) corresponding to a received column address are coupled to a read/write circuit 130 to provide read data to an input/output (I/O) data block 134. Write data are provided to the memory array 101 through the I/O data block 134 and the read/write circuit 130. The I/O data block 134 may include an output data block 135 and an input data block 136 that operate responsive to an internal clock signal CLKOUT and an internal command signal CMDOUT, for example. The output data block 135 may provide read data from the memory array 101, responsive to a command for read operations. In some embodiments, the output data block 135 may provide the read data responsive to the internal command signal CMDOUT. The input data block 136 may receive write data responsive to a command for write operations.

The control circuit 102 includes a clock path 103. The clock path 103 receives an external clock signal CLKIN and propagates an internal clock signal CLKOUT which is based at least in part on the external clock signal CLKIN to the I/O data block 134.

The control circuit 102 also includes a command path 104. The command path 104, which is shown in FIG. 1 as being included in the control circuit 102, but is not limited to such a configuration, provides the internal command signal CMDOUT to the I/O data block 134. The control circuit 102 responds to memory commands CMDIN to perform various operations on the memory array 101. In particular, the control circuit 102 is used to provide internal control signals to read data from and write data to the memory array 101. The command path 104 receives latency signals such as a CAS latency signal CL and a CAS write latency signal CWL. The command path 104 also receives internal clock signals from the clock path 103. The command path 104 may also receive an N value from a forward path measurement circuit, but is not limited to such a configuration, (not shown) which measures a forward path delay in number of clock cycles of one of the internal clock signals and provides the count N.

FIG. 2 is a block diagram of the control circuit 102 of FIG. 1, in accordance with an embodiment of the present disclosure. The control circuit 102 includes the clock path 103. The clock path 103 includes a clock input buffer 201. The clock input buffer 201 may receive a pair of complementary clock signals CK and CKB based on a clock signal CLKIN, for example, and provides a clock signal CLK. The CLK signal is transmitted to a delay line 209. The CLK signal may be transmitted to a command decoder circuit 204, a command extension circuit 206 on the command path 104. For example, the delay line 209 may be an adjustable delay line including a duty cycle controller (DCC), a coarse delay line and a fine delay line. An adjustable delay amount of the delay line 209 may be based on a delay control signal DLC which is provided by a delay line control circuit 203. The delay line control circuit 203 may provide the delay control signal DLC responsive to the CLK signal and a feedback delay signal DLL_fb. The delay line 209 may provide a clock signal DLLCLK to the clock path 103 by delaying the CLK signal by the adjustable delay amount. The delay line 209 may further provide a clock signal DLLCLKQ to the command path 104 by delaying the CLK signal by the adjustable delay amount. The clock path 103 may further include a tree 210 which receives the DLLCLK signal from the delay line 209 and provides a clock output signal CLKOUT. The CLKOUT signal is also provided to an I/O delay adjustment circuit 211. The I/O delay adjustment circuit 211 models delays caused by the clock input buffer 201 and an output buffer 216 in the output data block 135. The I/O delay adjustment circuit 211 further generates the DLL_fb signal based on the modeled delays and the CLKOUT signal. The I/O delay adjustment circuit 211 provides the DLL_fb signal to the delay line 209.

The command path 104 in the control circuit includes a command input buffer 202. The command input buffer 202 receives command signals CMDIN. The CMDIN signals may convey a memory access command, such as a read, write, or on die termination (ODT) command, indicative of instructing a read operation, a write operation or an on-die termination, respectively. The command input buffer 202 buffers the received command signals CMDIN and provides buffered command signals CMD to the command decoder circuit 204. The command decoder circuit 204 receives the CLK signal and the CMD signals. The command decoder circuit 204 decodes the CMD signals, responsive to the CLK signal to provide a pulse on a decoded command signal CMDDEC to the command extension circuit 206. The CMDDEC signal may be a read signal, a write signal or an ODT signal. The command extension circuit 206 may receive the CMDDEC signal and a command additive latency signal COMAL signal. The command extension circuit 206 may include a latch circuit 207. Based on the COMAL signal, the CMDDEC signal may be shifted and provided to the latch circuit 207. The latch circuit 207 also receives a delayed clock signal DCLK from a delay circuit 205. The delay circuit 205 receives the CLK signal, adds a delay (D_DCLK) to the CLK signal, and provides the DCLK signal. The latch circuit 207 may include a flip-flop which may latch the shifted CMDDEC signal responsive to the DCLK signal and may further provide an intermediate command signal CMDX. The command extension circuit 206 may further include an extension circuit 208. The extension circuit 208 receives the CMDX signal and generates a command extension signal CMDEXT that has a pulse width of multiple clock cycles of the CLK signal by lengthening the CMDX signal having a pulse width of one clock cycle (T) of the CLK signal. As will be described in more detail below, the extension circuit 208 provides the CMDEXT signal responsive to the CLK signal.

The command path 104 further includes a delay line 212 coupled to the command extension circuit 206. For example, the delay line 212 may be an adjustable delay line including a DCC, a coarse delay line and a fine delay line. In some embodiments, the delay line 212 has substantially the same circuit structure as the delay line 209. The CMDEXT signal is transmitted to the delay line 212. The delay line 212 may provide a delayed command signal CMDDLL responsive to the CMDEXT signal and further responsive to the DLC signal that is based on the CLK signal and the DLL_fb signal. The command path 104 further includes a dQ-Enable-Delay (QED) circuit 213. The QED circuit 213 receives a selected latency (e.g., a CL value and/or a CWL value), an N value. The QED circuit 213 may further receive the DLLCLKQ signal from the delay line 209. For a read operation, the DLLCLK signal and the DLLCLKQ signal are the same signal. For an on-die termination (ODT) function, the DLLCLK signal is stable and the DLLCLKQ signal provides a clock pulses, because termination information is common to all data queues (DQs), and a common ODT signal may be generated from DLLCLKQ at a root of the tree 210. The common ODT signal may be provided to all the DQs through a network similar to the tree 210. This may keep the ODT signal provided to the DQs synchronized with the CLKOUT signal at leaves of the tree 210. The latency may be defined by a number of clock cycles, for example, of the CLK signal. The N value may be a number of clock cycles equivalent to a delay between receipt of the CLK signal and the DLLCLKQ signal. The CL value is column address strobe (CAS) latency that may account for a delay time between when the apparatus receives the read command and when the output buffer 216 receives read data responsive to the read command based on the CLKOUT signal including time for data to be accessed and provided to an output bus (e.g., via a DQ pad after the output buffer 216). The CWL value is CAS write latency that may account for a delay time between when the apparatus receives the write command and when the input data block 136 in FIG. 1 receives write data responsive to the write command based on DQS signals (not shown) including time for data to be accessed and provided to an input bus (e.g., via a DQ pad before the input data block 136). The CL value and the CWL value may be represented as numbers of clock cycles of the CLK signal. The CL value and the CWL value may be frequency dependent value, for example.

The QED circuit 213 synchronizes the CMDDLL signal from the delay line 212 with the DLLCLKQ signal from the delay line 209, for example, by adjusting a latency (e.g., shifting) of the CMDDLL signal using the N value and the CL value or the CWL value. For example, in some embodiments, the QED circuit 213 may shift the CMDDLL signal for the read command responsive to the CL. In some embodiments, the QED circuit 213 may shift the CMDDLL signal for the write command or the ODT command responsive to the CWL. An adjustment factor may also be considered. For example, in some embodiments, the N value may be greater than or equal to nine. For example, in some embodiments, the CL value and the N value may have to satisfy the condition that a difference between the CL value and the N value (e.g., CL−N) is greater or equal to two. In some embodiments, the QED circuit 213 shifts the CMDDLL signal by (CL−(N+2)) clock cycles of the DLLCLKQ signal for read commands, where two is the adjustment factor.

In operation, a command represented by the CMDIN signal is provided to the command path 104 and propagated through the command input buffer 202, the command decoder circuit 204, the command extension circuit 206, the delay line 212, and the QED circuit 213. The QED circuit 213 adds clock cycles of the DLLCLKQ signal to the propagating CMDDLL signal to provide a resulting propagation delay for the command path 104 that will accommodate the selected latency. A tree 214 which receives the shifted CMDDLL signal (e.g., a CMDDLLQ signal) and provides an output signal CMDOUT from the command path 104. The CMDOUT signal is provided to an output adjustment circuit 215 in the output data block 135. The output adjustment circuit 215 provides an output signal which is latched data responsive to the CLKOUT signal based on the CMDOUT signal. For example, the output adjustment circuit 215 may include a timing control signal generator for determining timings of rising and falling edges of the output data and the ODT termination. For example, the output adjustment circuit 215 may include a parallel-serial converter which converts data of a plurality of bits read in parallel from the memory array 101 in FIG. 1 via the R/W circuit 130 to a set of serial data in an appropriate order based on the timings. The output buffer 216 receives the output signal and provides data to a data queue (e.g., DQx).

FIG. 3 is a timing diagram of various signals during operation of the control circuit 102 of FIG. 2 in accordance with an embodiment of the present disclosure. At time T0, the CMDIN signal becomes active, representing a memory command received by the command path 104 at a rising edge of a first pulse (N-pulse) of the CLKIN signal. After decoding the CMD signal responsive to the CMDIN signal with the CLK signal, the CMDDEC signal becomes active at time T1. The CMDDEC signal in FIG. 3 has a rising edge at time T1, which corresponds to the active CMDIN signal at time T0. The delay between times T0 and T1 represents a propagation delay D_BUF of the CMDIN signal through the command input buffer 202 to be provided as the CMD signal and a propagation delay D_CD of the CMD signal in the command decoder circuit 204 to be provided as the CMDDEC signal.

In the latch circuit 207 of the command extension circuit 206, the active CMDDEC signal is latched responsive to a rising edge of a second pulse (e.g., (N+1)-pulse) of the DCLK signal at time T2. The latch circuit 207 provides the CMDX signal with a propagation delay D_LT between a clock input and a data output of the latch circuit 207. The CMDX signal in FIG. 3 has a rising edge after time T2 which is not latched by the second pulse (e.g., (N+1)-pulse) of the CLK signal at time T2. Instead, the CMDX signal may be latched by the third pulse (e.g., (N+2)-pulse) of the CLK signal at time T3. The CMDX signal is provided to the extension circuit 208. As will be described in more detail below, the extension circuit 208 provides the CMDEXT signal that has the pulse width of multiple clock cycles of the CLK signal by lengthening the CMDX signal having the pulse width of one clock cycle (T) of the CLK signal and a propagation delay D_LT, responsive to the CLK signal. For example, the CMDEXT signal may have the pulse width of four clock cycles (4T) as shown in FIG. 3. The CMDEXT signal may become active at time T4 responsive to the third pulse (e.g., (N+2)-pulse) of the CLK signal at time T3.

The CMDEXT signal propagates through the delay line 212 to provide the CMDDLL signal while the CLK signal propagates through the delay line 209 to provide the DLLCLKQ signal. The delay line 212 and the delay line 209 provide the same delay D_DL. The DLLCLKQ has a rising edge of an N-pulse at T8 which is delayed by the delay D_DL from a rising edge of an N-pulse of the CLK signal at time T7. A rising edge at T5 of the CMDDLL signal has the delay D_DL relative to a rising edge of the CMDEXT signal time T4. The CMDDLL signal may have an extended pulse width (e.g., 4T) after the CMDEXT signal. The QED circuit 213 receives the CMDDLL signal and the DLLCLKQ signal. To capture a rising edge of the CMDDLL signal, the DLLCLKQ signal is used. As shown in FIG. 3, the active CMDDLL signal is captured responsive to a rising edge of an (N+3)-pulse of the DLLCLKQ signal at time T6. The QED circuit 213 may provide the CMDDLLQ signal by providing a propagation delay to the CMDDLL signal in order to adjust based on the selected latency (e.g., (CL−(N+2))). For example such as shifting the CMDDLL signal by (CL−(N+2)) clock cycles of the DLLCLKQ signal for read commands, where two is the adjustment factor.

FIG. 4 is a block diagram of a command extension circuit in the control circuit of FIG. 2 in accordance with an embodiment of the present disclosure. For example, the command extension circuit 206 may include a latch circuit 207. The latch circuit 207 may receive the CMDDEC signal and a command additive latency signal COMAL signal. The command additive latency COMAL signal may represent additive latency which allows a read command or a write command to be issued immediately following an active command. The CMDDEC signal may be a read signal, a write signal or an ODT signal. The latch circuit 207 may also receive the delayed clock signal DCLK from the delay circuit 205. As previously described, the delay circuit 205 receives the CLK signal, and may add a delay D_DCLK to the CLK signal, and provides the DCLK signal. The latch circuit may include a latch 401 for a command for operations, such as a read command or write command and a latch 402 for an ODT command. The latch 401 may be a flip-flop which may latch the shifted CMDDEC signal representing either the read command signal or the write signal responsive to the DCLK signal. The latch 402 may be a flip-flop which may latch the shifted CMDDEC signal representing the ODT command responsive to the DCLK signal. The CMDDEC signal latched by the DCLK signal is provided as an intermediate command signal CMDX.

The command extension circuit 206 may further include the extension circuit 208. The extension circuit 208 may include a plurality of flip-flops 304 and a multiplexer 405. For example, the number of the plurality of flip-flops 403a, 403b, 403c, and 403d may be four in FIG. 4. For the read operation or the write operation, the extension circuit 208 receives the CMDX signal having a pulse width of one clock cycle T at a flip-flop 403a. In one example, the CMDX signal may include a positive pulse when the multiplexer 405 is an OR gate. In another example, the CMDX signal may include a negative pulse when the multiplexer 405 is a NAND gate. Each of the plurality of flip-flops 403a, 403b, 403c, and 403d may provide a delay having a length of the one clock cycle T to the CMDX signal associated with a respective latency. The flip-flop 403a receives the CMDX signal and the CLK signal and provides a first delayed CMDX signal. The flip-flop 403b has a data input that receives the first delayed CMDX signal and a clock input that receives the CLK signal, and further provides a second delayed CMDX signal. The flip-flop 403c has a data input that receives the second delayed CMDX signal and a clock input that receives the CLK signal, and further provides a third delayed CMDX signal. The flip-flop 403d has a data input that receives the third delayed CMDX signal and a clock input that receives the CLK signal, and further provides a fourth delayed CMDX signal. The multiplexer 405 may receive the first delayed CMDX signal, the second delayed CMDX signal, the third delayed CMDX signal, and the fourth delayed CMDX signal, and may further provide the CMDEXT signal responsive to the read command or the write command. Thus, the extension circuit 208 may generate the CMDEXT signal having the pulse width of multiple clock cycles of the CLK signal by delaying the CMDX signal having a pulse width of one clock cycle (T) of the CLK signal by the plurality of flip-flops 403a, 403b, 403c, and 403d and multiplexing the delayed CMDX signals from the plurality of the flip-flops 403a, 403b, 403c, and 403d by the multiplexer 405. The extension circuit 208 may also include a flip-flop 404 which may latch the CMDX signal representing the ODT command responsive to the CLK signal and may further provide a signal responsive to the ODT command as the CMDEXT signal. For example, in some embodiments, the flip-flop 404 may synchronize the CMDX signal provided by the flip-flop 402 with the CLK signal without extending a pulse width of the CMDX signal. As a result, the extension circuit 208 provides the CMDEXT signal responsive to the CLK signal.

Although this invention has been disclosed in the context of certain preferred embodiments and examples, it will be understood by those skilled in the art that the inventions extend beyond the specifically disclosed embodiments to other alternative embodiments and/or uses of the inventions and obvious modifications and equivalents thereof. In addition, other modifications which are within the scope of this invention will be readily apparent to those of skill in the art based on this disclosure. It is also contemplated that various combination or sub-combination of the specific features and aspects of the embodiments may be made and still fall within the scope of the inventions. It should be understood that various features and aspects of the disclosed embodiments can be combined with or substituted for one another in order to form varying mode of the disclosed invention. Thus, it is intended that the scope of at least some of the present invention herein disclosed should not be limited by the particular disclosed embodiments described above.