San Diego, California
United States
36
2019-03-05
36
2019-03-05
These are the the leading inventors for applications assigned to LITEL INSTRUMENTS:
LITEL INSTRUMENTS based in San Diego, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Precision geographic location system and method utilizing an image product
#2 | 2017-01-26 ✅ Patent 9,903,719 granted on 2018-02-27System and method for advanced navigation
#3 | 2015-11-12 ✅ Patent 9,483,816 granted on 2016-11-01Method and system for high accuracy and reliability registration of multi modal imagery
#4 | 2015-07-07 ✅ Patent 9,074,848 granted on 2015-07-07Precision geographic location system and method utilizing an image product
#5 | 2011-01-13 ✅ Patent 8,786,827 granted on 2014-07-22Method and apparatus for measurement of exit pupil transmittance
#6 | 2009-10-06 ✅ Patent 7,598,006 granted on 2009-10-06Method and apparatus for embedded encoding of overlay data ordering in an in-situ interferometer
#7 | 2009-06-09 ✅ Patent 7,544,449 granted on 2009-06-09Method and apparatus for measurement of crossfield chromatic response of projection imaging systems
#8 | 2008-01-10 ✅ Patent 7,515,250 granted on 2009-04-07In-situ interferometer arrangement
#9 | 2007-12-06 ✅ Patent 7,871,004 granted on 2011-01-18Method and apparatus for self-referenced wafer stage positional error mapping
#10 | 2007-09-20 ✅ Patent 7,381,503 granted on 2008-06-03Reference wafer calibration reticle
#11 | 2007-09-18 ✅ Patent 7,271,905 granted on 2007-09-18Method and apparatus for self-referenced wafer stage positional error mapping
#12 | 2007-09-06 ✅ Patent 7,846,624 granted on 2010-12-07Systems and methods for determination of focus and telecentricity, amelioration of metrology induced effects and application to determination of precision bossung curves
#13 | 2007-08-02 ✅ Patent 7,442,951 granted on 2008-10-28Reticle for use in rapid determination of average intrafield scanning distortion having transmissivity of a complementary alignment attribute being different than the transmissivity of at least one alignment attribute
#14 | 2007-03-29 ✅ Patent 7,261,983 granted on 2007-08-28Reference wafer and process for manufacturing same
#15 | 2007-01-09 ✅ Patent 7,160,657 granted on 2007-01-09Reference wafer and process for manufacturing same
#16 | 2006-09-21 ✅ Patent 7,871,002 granted on 2011-01-18Method and apparatus for self-referenced wafer stage positional error mapping
#17 | 2006-08-31 ✅ Patent 7,697,138 granted on 2010-04-13Method and apparatus for determination of source polarization matrix
#18 | 2006-05-25 ✅ Patent 7,136,144 granted on 2006-11-14Method and apparatus for self-referenced dynamic step and scan intra-field lens distortion
#19 | 2006-03-02 ✅ Patent 7,337,552 granted on 2008-03-04Method and apparatus for registration with integral alignment optics
#20 | 2006-01-12 ✅ Patent 7,268,360 granted on 2007-09-11Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion
#21 | 2005-12-13 ✅ Patent 6,975,382 granted on 2005-12-13Method and apparatus for self-referenced dynamic step and scan intra-field lens distortion
#22 | 2005-12-01 ✅ Patent 7,283,202 granted on 2007-10-16In-situ interferometer arrangement
#23 | 2005-11-17 ✅ Patent 7,295,291 granted on 2007-11-13Apparatus and process for the determination of static lens field curvature
#24 | 2005-11-17 ✅ Patent 7,053,979 granted on 2006-05-30Process for amelioration of scanning synchronization error
#25 | 2005-11-08 ✅ Patent 6,963,390 granted on 2005-11-08In-situ interferometer arrangement
#26 | 2005-11-03 ✅ Patent 7,671,979 granted on 2010-03-02Apparatus and process for determination of dynamic lens field curvature
#27 | 2005-11-03 ✅ Patent 7,126,668 granted on 2006-10-24Apparatus and process for determination of dynamic scan field curvature
#28 | 2005-10-27 ✅ Patent 7,286,208 granted on 2007-10-23In-situ interferometer arrangement
#29 | 2005-10-27 ✅ Patent 7,688,426 granted on 2010-03-30Method and apparatus for measurement of exit pupil transmittance
#30 | 2005-10-20 ✅ Patent 7,088,427 granted on 2006-08-08Apparatus and method for high resolution in-situ illumination source measurement in projection imaging systems
#31 | 2005-10-06 ✅ Patent 7,262,398 granted on 2007-08-28Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion
#32 | 2005-09-15 ✅ Patent 7,261,985 granted on 2007-08-28Process for determination of optimized exposure conditions for transverse distortion mapping
#33 | 2005-06-14 ✅ Patent 6,906,303 granted on 2005-06-14Method and apparatus for self-referenced dynamic step and scan intra-field scanning distortion
#34 | 2005-06-14 ✅ Patent 6,906,780 granted on 2005-06-14Method and apparatus for self-referenced dynamic step and scan intra-field lens distortion
#35 | 2005-06-02 ✅ Patent 7,099,011 granted on 2006-08-29Method and apparatus for self-referenced projection lens distortion mapping
#36 | 2005-05-31 ✅ Patent 6,899,982 granted on 2005-05-31Method and apparatus for proper ordering of registration data
Also check out Litel Instruments' (San Diego, United States) applicant profile with 3 patent applications submitted.
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