DELINEO DIAGNOSTICS, INC

City:

Dover, Delaware

Country:

United States

Published Applications:

Last publication date:

2019-01-31

Patent Grants:

Last grant date:

2020-07-07

Top Inventors for applications by DELINEO DIAGNOSTICS, INC

These are the the leading inventors for applications assigned to DELINEO DIAGNOSTICS, INC:

Scott Anderson Middlebrooks 3 Beaverton, OR United States
Henricus Wilhelm van der Heijden 2 Oud-Turnhout, Belgium
Henricus Wilhelm van der Heijden 1 Turnhout, Belgium
Adrianus Cornelis Koopman 1 Hilversum, Netherlands

Recent patent applications by DELINEO DIAGNOSTICS, INC

DELINEO DIAGNOSTICS, INC based in Dover, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2019-01-31 ✅ Patent 10,706,534 granted on 2020-07-07

US20190035075A1

Physics

Method and apparatus for classifying a data point in imaging data

#2 | 2017-01-19 ✅ Patent 10,130,323 granted on 2018-11-20

US20170018076A1

Physics

Method and apparatus for planning computer-aided diagnosis

#3 | 2017-01-19 ✅ Patent 10,265,040 granted on 2019-04-23

US20170018075A1

Physics

Method and apparatus for adaptive computer-aided diagnosis

AssigneeID:

118223 ⎘