Vantaa
Finland
22
2019-12-26
19
2020-03-10
These are the the leading inventors for applications assigned to Janesko Oy:
Janesko Oy based in Vantaa, FI has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Light arrangement for an optical device for measurement of an index of refraction, and a refractometer
#2 | 2019-02-12 ✅ Patent 10,203,279 granted on 2019-02-12Optical measuring device, a refractometer and an arrangement for an optical measurement
#3 | 2018-12-13 ✅ Patent 10,866,078 granted on 2020-12-15Arrangement and a method for inserting and removing a head of a measuring device to and from a process space
#4 | 2018-07-05Membrane device and method for manufacturing the membrane device
#5 | 2018-06-21Method and arrangement for determining concentration of at least two sample components in solution of at least three components
#6 | 2017-12-14 ✅ Patent 10,288,552 granted on 2019-05-14Sealing arrangement and sealing method of a measuring device
#7 | 2016-12-29 ✅ Patent 10,113,960 granted on 2018-10-30Arrangement in connection with measuring window of refractometer, and refractometer
#8 | 2015-12-17 ✅ Patent 9,766,176 granted on 2017-09-19Method and arrangement in connection with separate sample taken from process liquid
#9 | 2015-11-19 ✅ Patent 9,632,025 granted on 2017-04-25Method and measuring device for continuously measuring the abbe number
#10 | 2014-09-18 ✅ Patent 9,719,919 granted on 2017-08-01Method for measuring refractive index, and refractometer
#11 | 2013-09-19CONNECTOR STRUCTURE
#12 | 2013-09-19 ✅ Patent 9,243,936 granted on 2016-01-26Measuring sensor
#13 | 2013-03-07 ✅ Patent 9,612,144 granted on 2017-04-04Method and arrangement for measuring flow rate of optically non-homogenous material
#14 | 2012-05-24 ✅ Patent 9,028,140 granted on 2015-05-12Temperature sensor having a frame made of a mineral material
#15 | 2012-04-19 ✅ Patent 9,063,020 granted on 2015-06-23Method and device for measuring temperature having a separate structure for terminal areas arranged in unrestricted thermal contact with a process liquid
#16 | 2011-03-31 ✅ Patent 8,456,627 granted on 2013-06-04Structure of measurement window
#17 | 2010-02-04 ✅ Patent 8,628,678 granted on 2014-01-14Method for measuring the active KOH concentration in a KOH etching process
#18 | 2008-09-18 ✅ Patent 8,182,748 granted on 2012-05-22Method and arrangement of measuring acidity or other chemical or physical property of a gas
#19 | 2007-03-08 ✅ Patent 7,619,723 granted on 2009-11-17Refractometer
#20 | 2007-03-08 ✅ Patent 7,631,569 granted on 2009-12-15Arrangement for moving measuring head of measuring device into and out of process space
#21 | 2005-06-14 ✅ Patent 6,907,182 granted on 2005-06-14Optical conductor
#22 | 2005-04-05 ✅ Patent 6,875,642 granted on 2005-04-05Method for manufacturing thin film, and thin film
Also check out JANESKO OY's (Vantaa, Finland) applicant profile with 7 patent applications submitted.
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