Assignee profile:

Netzsch-Gerätebau GmbH

City:

Selb

Country:

Germany

Published Applications:

24

Last publication date:

2024-08-08

Patent Grants:

24

Last grant date:

2025-07-08

Top Inventors for applications by Netzsch-Gerätebau GmbH

These are the the leading inventors for applications assigned to Netzsch-Gerätebau GmbH:

Recent patent applications by Netzsch-Gerätebau GmbH

Netzsch-Gerätebau GmbH based in Selb, DE has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2024-08-08 ✅ Patent 12,352,712 granted on 2025-07-08
US20240264103A1
Physics

Method and System for the Analysis of Biological Material and Use of Such a System

#2 | 2024-02-01 ✅ Patent 12,631,582 granted on 2026-05-19
US20240035994A1
Physics

THERMAL ANALYSIS SYSTEM AND THERMAL ANALYSIS METHOD

#3 | 2023-08-24 ✅ Patent 12,422,390 granted on 2025-09-23
US20230266259A1
Physics

DEVICE AND METHOD FOR A THERMAL ANALYSIS OF A SAMPLE

#4 | 2022-11-10 ✅ Patent 11,860,132 granted on 2024-01-02
US20220357250A1
Physics

Material analysis device with quick attachment

#5 | 2022-06-02 ✅ Patent 11,747,176 granted on 2023-09-05
US20220170767A1
Physics

Measuring device comprising vibration damper and method for shielding a measuring device from vibrations

#6 | 2021-11-11 ✅ Patent 12,222,304 granted on 2025-02-11
US20210349043A1
Physics

Method and system for the analysis of biological material and use of such a system

#7 | 2021-03-25 ✅ Patent 11,320,408 granted on 2022-05-03
US20210088485A1
Physics

Gas analysis device and gas analysis method

#8 | 2021-03-25 ✅ Patent 11,353,415 granted on 2022-06-07
US20210088460A1
Physics

Thermal analysis device, sample holder assembly and thermal analysis method

#9 | 2019-12-12 ✅ Patent 11,237,123 granted on 2022-02-01
US20190376916A1
Physics

Measuring arrangement and method for a thermal analysis of a sample

#10 | 2019-12-12 ✅ Patent 11,143,609 granted on 2021-10-12
US20190376915A1
Physics

Measuring arrangement and method for a thermal analysis of a sample

#11 | 2019-12-12 ✅ Patent 11,143,608 granted on 2021-10-12
US20190376914A1
Physics

Measuring arrangement and method for a thermal analysis of a sample

#12 | 2018-03-22 ✅ Patent 10,605,677 granted on 2020-03-31
US20180080837A1
Physics

Method for calibrating a temperature control in thermal analyses of samples

#13 | 2018-03-15 ✅ Patent 10,758,874 granted on 2020-09-01
US20180071694A1
Performing operations; transporting

Method and device for generating a continuous carrier gas/vapour mixture stream

#14 | 2017-06-22 ✅ Patent 10,302,497 granted on 2019-05-28
US20170176257A1
Physics

Method and device for the thermal analysis of a sample and/or for the calibration of a temperature measuring device

#15 | 2017-05-04 ✅ Patent 10,180,358 granted on 2019-01-15
US20170122810A1
Physics

Method and device for the photothermic investigation of a sample

#16 | 2017-01-05 ✅ Patent 10,168,291 granted on 2019-01-01
US20170003236A1
Physics

Method and apparatus for the thermomechanical analysis of a sample

#17 | 2016-08-04 ✅ Patent 9,939,396 granted on 2018-04-10
US20160223479A1
Physics

3D diffusivity

#18 | 2016-02-25 ✅ Patent 9,939,329 granted on 2018-04-10
US20160054181A1
Physics

Device and method for thermal analysis

#19 | 2015-12-24 ✅ Patent 10,088,441 granted on 2018-10-02
US20150369765A1
Physics

Method and device for material analysis

#20 | 2015-08-20 ✅ Patent 9,791,330 granted on 2017-10-17
US20150233775A1
Physics

Device and method for measuring a change in length of a sample and/or for measuring a deformation force on a sample

#21 | 2015-01-15 ✅ Patent 9,816,869 granted on 2017-11-14
US20150019157A1
Physics

Method for evaluating a measurement result of a thermal analysis, as well as use of the method, computer unit, computer program product and system for performing the method

#22 | 2014-07-24 ✅ Patent 9,310,259 granted on 2016-04-12
US20140204971A1
Physics

Method for performing a differential thermal analysis

#23 | 2013-12-19 ✅ Patent 9,429,531 granted on 2016-08-30
US20130336355A1
Physics

Thermoanalysis device

#24 | 2013-11-14 ✅ Patent 9,689,818 granted on 2017-06-27
US20130298639A1
Physics

Thermal analysis device and method for thermal analysis comprising gas analysis

Also check out Netzsch-Gerätebau GmbH's (Selb, Germany) applicant profile with 41 patent applications submitted.

AssigneeID:

133375