Beaverton, Oregon
United States
953
2026-05-28
821
2026-04-14
These are the the leading inventors for applications assigned to TEKTRONIX, INC.:
TEKTRONIX, INC. based in Beaverton, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
TEST MONITOR INCLUDING SIGNAL SEPARATOR AND DATA RECORDER
#2 | 2026-05-28MULTI-SENSOR PROBES WITH CONTINUOUS TIME PATH
#3 | 2026-05-07DYNAMIC PROBE COLORING AND STATUS INFORMATION USING PASSIVE OPTICAL FIBER
#4 | 2026-02-05PULSE AMPLITUDE MODULATION TRANSITION DENSITY TRIGGER IN A TEST AND MEASUREMENT INSTRUMENT
#5 | 2025-11-06PLUGGABLE OPTICAL VOLTAGE AND CURRENT PROBES
#6 | 2025-10-09 ✅ Patent 12,603,805 granted on 2026-04-14BPSK SUBCARRIER DEMODULATION USING DIRECT FILTERS WITHOUT DOWN CONVERSION
#7 | 2025-06-17 ✅ Patent 12,332,277 granted on 2025-06-17Thermal management system for a test-and-measurement probe
#8 | 2025-04-24POWER PROBE FIXTURES AND ADAPTERS
#9 | 2025-02-20AUTOMATED TESTING OF A PHOTOVOLTAIC POWER SYSTEM AND ASSOCIATED COMPONENTS USING AN OSCILLOSCOPE
#10 | 2024-11-28 ✅ Patent 12,546,804 granted on 2026-02-10REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE EQUALIZER
#11 | 2024-11-14FLIP-CHIP PACKAGE HEAT SPREADER
#12 | 2024-10-24 ✅ Patent 12,596,145 granted on 2026-04-07OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARALLEL INSTRUMENT CHANNELS AND MACHINE LEARNING ASSISTANCE
#13 | 2024-10-24TEST AND MEASUREMENT INSTRUMENT WITH INTEGRATED ANALOG FRONT END
#14 | 2024-09-19 ✅ Patent 12,574,039 granted on 2026-03-10REAL-EQUIVALENT-TIME OSCILLOSCOPE AND WIDEBAND REAL-TIME SPECTRUM ANALYZER
#15 | 2024-08-29SELF-CALIBRATING RADAR SENSOR FOR BEAM PREDICTION DISCOVERY
#16 | 2024-08-22 ✅ Patent 12,373,316 granted on 2025-07-29AUTOMATING PCIe 6.0 TX EQUALIZER CALIBRATION USING A MULTIVARIABLE APPROACH
#17 | 2024-07-11SYSTEMS AND METHODS FOR TUNING AND MEASURING A DEVICE UNDER TEST USING MACHINE LEARNING
#18 | 2024-06-27OPTICAL TRANSCEIVER TUNING USING MACHINE LEARNING
#19 | 2024-06-06MACHINE LEARNING MODEL DISTRIBUTION ARCHITECTURE
#20 | 2024-05-23METHODS FOR 3D TENSOR BUILDER FOR INPUT TO MACHINE LEARNING
#21 | 2024-05-23INTEROPERABILITY PREDICTOR USING MACHINE LEARNING AND REPOSITORY OF TX, CHANNEL, AND RX MODELS FROM MULTIPLE VENDORS
#22 | 2024-05-09 ✅ Patent 12,449,454 granted on 2025-10-21REAL-EQUIVALENT-TIME OSCILLOSCOPE
#23 | 2024-04-25 ✅ Patent 12,494,819 granted on 2025-12-09ULTRA-WIDEBAND SIGNAL GENERATOR WITH LOW PHASE NOISE
#24 | 2024-04-18AD HOC MACHINE LEARNING TRAINING THROUGH CONSTRAINTS, PREDICTIVE TRAFFIC LOADING, AND PRIVATE END-TO-END ENCRYPTION
#25 | 2024-04-18COMPREHENSIVE MACHINE LEARNING MODEL DEFINITION
#26 | 2024-04-18ADAPTIVE INSTRUMENT NOISE REMOVAL
#27 | 2024-04-11CUSTOMIZABLE SAFETY ENCLOSURE FOR A DEVICE UNDER TEST
#28 | 2024-04-11 ✅ Patent 12,571,816 granted on 2026-03-10HIGH-IMPEDANCE DIFFERENTIAL FLEXIBLE PROBE TIP
#29 | 2024-03-14CURRENT SHUNT WITH CANCELING MUTUAL INDUCTANCE
#30 | 2024-02-29TEST AND MEASUREMENT INSTRUMENT ACCESSORY WITH RECONFIGURABLE PROCESSING COMPONENT
#31 | 2024-02-29 ✅ Patent 12,493,053 granted on 2025-12-09PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR
#32 | 2024-02-22 ✅ Patent 12,644,910 granted on 2026-06-02CURRENT MONITOR COMBINING A SHUNT RESISTOR WITH A ROGOWSKI COIL
#33 | 2024-02-08 ✅ Patent 12,222,388 granted on 2025-02-11Integrated communication link testing
#34 | 2024-02-08METHOD AND APPARATUS FOR DETERMINING OUTPUT CHARGE OF WIDE BANDGAP DEVICES WITHOUT HARDWARE MODIFICATION
#35 | 2024-02-01 ✅ Patent 12,425,113 granted on 2025-09-23INLINE INSITU CALIBRATION OF MIMO WIRELESS COMMUNICATION SYSTEMS
#36 | 2024-02-01DYNAMIC VERTICAL SIGNAL CALIBRATION IN A TEST AND MEASUREMENT INSTRUMENT
#37 | 2024-02-01 ✅ Patent 12,442,838 granted on 2025-10-14CURRENT MONITOR COMBINING A SHUNT RESISTOR WITH A ROGOWSKI COIL
#38 | 2024-01-25RUNTIME DATA COLLECTION AND MONITORING IN MACHINE LEARNING SYSTEMS
#39 | 2024-01-25AUTOMATED DE-SKEW SYSTEM AND METHOD FOR HIGH VOLTAGE SEMICONDUCTORS
#40 | 2024-01-25FLEXIBLE ARBITRARY WAVEFORM GENERATOR AND INTERNAL SIGNAL MONITOR
#41 | 2024-01-25CONTINUOUS ACQUISITION IN A TEST AND MEASUREMENT INSTRUMENT
#42 | 2024-01-25HIGH SPEED WAVEFORM ACQUISITIONS AND HISTOGRAMS USING GRAPHICS PROCESSING UNIT IN A TEST AND MEASUREMENT INSTRUMENT
#43 | 2024-01-04 ✅ Patent 12,216,558 granted on 2025-02-04Test and measurement system for analyzing devices under test
#44 | 2023-12-28COMBINED SHUNT AND MULTI-SEGMENTED ROGOWSKI-COIL CURRENT SENSOR
#45 | 2023-12-21GENERATING TEST DATA USING PRINCIPAL COMPONENT ANALYSIS
#46 | 2023-12-21MACHINE LEARNING FOR MEASUREMENT USING LINEAR RESPONSE EXTRACTED FROM WAVEFORM
#47 | 2023-12-21OSCILLOSCOPE HAVING A PRINCIPAL COMPONENT ANALYZER
#48 | 2023-12-21SEPARATING NOISE TO INCREASE MACHINE LEARNING PREDICTION ACCURACY IN A TEST AND MEASUREMENT SYSTEM
#49 | 2023-12-21 ✅ Patent 12,313,569 granted on 2025-05-27Analog signal isolator
#50 | 2023-12-14 ✅ Patent 12,583,122 granted on 2026-03-24AUTOMATED CAVITY FILTER TUNING USING MACHINE LEARNING
#51 | 2023-11-23SHUNT FOR USE IN BUSBAR-TO-MODULE CONNECTIONS
#52 | 2023-11-16 ✅ Patent 12,301,695 granted on 2025-05-13Transmitter equalizer tap extraction
#53 | 2023-10-19DEVICE AND METHOD FOR WAVEFORM SEARCHING BY EXAMPLE
#54 | 2023-10-12 ✅ Patent 12,385,949 granted on 2025-08-12SEMI-AUTOMATED OSCILLOSCOPE NOISE COMPENSATION BASED ON POWER SPECTRAL DENSITY CHARACTERIZATION
#55 | 2023-10-05 ✅ Patent 12,442,852 granted on 2025-10-14TUNING A DEVICE UNDER TEST USING PARALLEL PIPELINE MACHINE LEARNING ASSISTANCE
#56 | 2023-08-24 ✅ Patent 12,590,996 granted on 2026-03-31SYSTEMS, DEVICES, AND METHODS FOR MEASURING DIRECT CURRENT/LOW FREQUENCY SIGNAL COMPONENTS
#57 | 2023-08-17SEAMLESS SPECTROGRAMS IN A MULTI-CHANNEL TEST AND MEASUREMENT INSTRUMENT
#58 | 2023-08-10METHOD AND APPARATUS FOR MEASURING POWER SUPPLY INDUCED JITTER
#59 | 2023-07-20 ✅ Patent 12,416,662 granted on 2025-09-16MACHINE LEARNING MODEL TRAINING USING DE-NOISED DATA AND MODEL PREDICTION WITH NOISE CORRECTION
#60 | 2023-07-13SYSTEMS AND METHODS FOR MACHINE LEARNING MODEL TRAINING AND DEPLOYMENT
#61 | 2023-07-13LAMINATED STRUCTURE FOR THERMAL CONDUCTION IN A FLEXIBLE ELECTRICAL SUBSTRATE
#62 | 2023-07-06 ✅ Patent 12,298,329 granted on 2025-05-13Termination trigger pick-off for remote head sampler
#63 | 2023-06-29 ✅ Patent 12,339,298 granted on 2025-06-24METHOD OF CTLE ESTIMATION USING CHANNEL STEP-RESPONSE FOR TRANSMITTER LINK EQUALIZATION TEST
#64 | 2023-06-27 ✅ Patent 11,687,213 granted on 2023-06-27Object oriented graphical user interface for a test and measurement instrument
#65 | 2023-06-15 ✅ Patent 12,560,630 granted on 2026-02-24ENTROPY ON ONE-DIMENSIONAL AND TWO-DIMENSIONAL HISTOGRAMS
#66 | 2023-05-16 ✅ Patent 11,652,494 granted on 2023-05-16Discrete offset dithered waveform averaging for high-fidelity digitization of repetitive signals
#67 | 2023-05-04 ✅ Patent 12,498,410 granted on 2025-12-16FLEXIBLE WIDE BANDGAP DOUBLE PULSE TESTING METHODOLOGY
#68 | 2023-05-04 ✅ Patent 12,345,755 granted on 2025-07-01REVERSE RECOVERY MEASUREMENTS AND PLOTS
#69 | 2023-03-30SYSTEM AND METHOD FOR DEVELOPING MACHINE LEARNING MODELS FOR TESTING AND MEASUREMENT
#70 | 2023-03-23 ✅ Patent 12,607,667 granted on 2026-04-21SYSTEM AND METHOD FOR DETECTION OF ANOMALIES IN TEST AND MEASUREMENT RESULTS OF A DEVICE UNDER TEST (DUT)
#71 | 2023-03-16 ✅ Patent 12,535,504 granted on 2026-01-27TEST AND MEASUREMENT INSTRUMENT WITH REMOVABLE BATTERY PACK
#72 | 2023-03-09 ✅ Patent 12,442,837 granted on 2025-10-14REAL-EQUIVALENT-TIME CLOCK RECOVERY FOR A NEARLY-REAL-TIME REAL-EQUIVALENT-TIME OSCILLOSCOPE
#73 | 2023-02-23PARALLEL TRIGGER PATHS IN A TEST AND MEASUREMENT INSTRUMENT
#74 | 2023-02-16 ✅ Patent 11,940,889 granted on 2024-03-26Combined TDECQ measurement and transmitter tuning using machine learning
#75 | 2023-02-16 ✅ Patent 11,907,090 granted on 2024-02-20Machine learning for taps to accelerate TDECQ and other measurements
#76 | 2023-01-19 ✅ Patent 11,936,397 granted on 2024-03-19Multiple analog-to-digital converter system to provide simultaneous wide frequency range, high bandwidth, and high resolution
#77 | 2023-01-19 ✅ Patent 12,085,590 granted on 2024-09-10Swept parameter oscilloscope
#78 | 2023-01-19 ✅ Patent 12,055,416 granted on 2024-08-06Stand for a test and measurement instrument
#79 | 2023-01-12USAGE-AWARE COMPRESSION FOR STREAMING DATA FROM A TEST AND MEASUREMENT INSTRUMENT
#80 | 2022-12-29 ✅ Patent 12,092,693 granted on 2024-09-17System and method for computing direct quadrature zero resultant drive vector using rotor position
#81 | 2022-12-22 ✅ Patent 12,395,176 granted on 2025-08-19MULTIPLE SAMPLE-RATE DATA CONVERTER
#82 | 2022-12-08 ✅ Patent 11,765,002 granted on 2023-09-19Explicit solution for DFE optimization with constraints
#83 | 2022-12-08 ✅ Patent 12,571,841 granted on 2026-03-10GENERAL DIGITAL SIGNAL PROCESSING WAVEFORM MACHINE LEARNING CONTROL APPLICATION
#84 | 2022-12-08 ✅ Patent 12,553,943 granted on 2026-02-17MULTI-INPUT REMOTE HEADS FOR SEQUENTIAL TESTING
#85 | 2022-11-24SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT
#86 | 2022-11-24 ✅ Patent 12,146,914 granted on 2024-11-19Bit error ratio estimation using machine learning
#87 | 2022-11-10 ✅ Patent 11,898,927 granted on 2024-02-13Real-equivalent-time oscilloscope with time domain reflectometer
#88 | 2022-11-03 ✅ Patent 12,372,550 granted on 2025-07-29ISOLATED PROBE TIP
#89 | 2022-10-20REAL-EQUIVALENT-TIME FLASH ARRAY DIGITIZER OSCILLOSCOPE ARCHITECTURE
#90 | 2022-10-20 ✅ Patent 12,210,039 granted on 2025-01-28Multi-mode measurement probe
#91 | 2022-10-13 ✅ Patent 12,526,010 granted on 2026-01-13TEST MONITOR INCLUDING SIGNAL SEPARATOR AND DATA RECORDER
#92 | 2022-10-13 ✅ Patent 11,808,786 granted on 2023-11-07Precision, high bandwidth, switching attenuator
#93 | 2022-10-06 ✅ Patent 11,619,697 granted on 2023-04-04Calibration of magnetic field sensor for current probe
#94 | 2022-09-29 ✅ Patent 11,923,896 granted on 2024-03-05Optical transceiver tuning using machine learning
#95 | 2022-09-29 ✅ Patent 11,923,895 granted on 2024-03-05Optical transmitter tuning using machine learning and reference parameters
#96 | 2022-09-29TEST AND MEASUREMENT INSTRUMENT HAVING PROGRAMMABLE ACQUISITION HISTORY STORAGE AND RESTORE
#97 | 2022-09-29TEST AND MEASUREMENT INSTRUMENT HAVING PROGRAMMABLE ACQUISITION HISTORY
#98 | 2022-09-22 ✅ Patent 11,624,781 granted on 2023-04-11Noise-compensated jitter measurement instrument and methods
#99 | 2022-08-11 ✅ Patent 12,442,845 granted on 2025-10-14METHOD OF GENERATING METADATA FROM ACQUIRED SIGNALS FOR SEARCH, FILTERING, AND MACHINE LEARNING INPUTS
#100 | 2022-08-04 ✅ Patent 12,328,242 granted on 2025-06-10EYE CLASSES SEPARATOR WITH OVERLAY, AND COMPOSITE, AND DYNAMIC EYE-TRIGGER FOR HUMANS AND MACHINE LEARNING
Also check out Tektronix, Inc.'s (Beaverton, United States) applicant profile with 405 patent applications submitted.
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