Montbonnot-Saint-Martin
France
27
2025-02-13
26
2026-03-31
These are the the leading inventors for applications assigned to Unity Semiconductor:
Unity Semiconductor based in Montbonnot-Saint-Martin, FR has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
A METHOD AND SYSTEM FOR DISCRIMINATING DEFECTS PRESENT ON A FRONTSIDE FROM DEFECTS PRESENT ON A BACKSIDE OF A TRANSPARENT SUBSTRATE
#2 | 2025-01-14 ✅ Patent 12,196,681 granted on 2025-01-14Method and a device for detecting crystalline defects in a substrate by dark field and photoluminescence
#3 | 2024-10-22 ✅ Patent 12,123,698 granted on 2024-10-22Method and a system for characterizing structures through a substrate
#4 | 2024-08-27 ✅ Patent 12,074,400 granted on 2024-08-27Substrate dimension adapter
#5 | 2024-08-22 ✅ Patent 12,444,039 granted on 2025-10-14METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES THROUGH A SUBSTRATE
#6 | 2024-03-26 ✅ Patent 11,942,379 granted on 2024-03-26Inspection method for detecting a defective bonding interface in a sample substrate, and measurement system implementing the method
#7 | 2024-02-29 ✅ Patent 12,163,899 granted on 2024-12-10System for optical inspection of a substrate using same or different wavelengths
#8 | 2023-11-23 ✅ Patent 12,079,979 granted on 2024-09-03Method and a system for characterising structures through a substrate
#9 | 2023-11-23 ✅ Patent 11,959,737 granted on 2024-04-16Method and a system for combined characterisation of structures etched in a substrate
#10 | 2023-11-23 ✅ Patent 11,959,736 granted on 2024-04-16Method and a system for characterising structures etched in a substrate
#11 | 2023-08-10 ✅ Patent 11,906,302 granted on 2024-02-20Method and system for measuring a surface of an object comprising different structures using low coherence interferometry
#12 | 2022-10-27 ✅ Patent 11,965,730 granted on 2024-04-23Method for measuring film thickness distribution of wafer with thin films
#13 | 2022-01-13 ✅ Patent 11,713,960 granted on 2023-08-01Method and system for measuring a surface of an object comprising different structures using low coherence interferometry
#14 | 2021-11-11 ✅ Patent 11,965,834 granted on 2024-04-23Dark-field optical inspection device
#15 | 2021-08-05 ✅ Patent 11,287,246 granted on 2022-03-29Method and device for inspecting a surface of an object comprising nonsimilar materials
#16 | 2021-07-15 ✅ Patent 11,300,520 granted on 2022-04-12Method and system for optically inspecting a substrate
#17 | 2020-08-27 ✅ Patent 11,092,644 granted on 2021-08-17Method and system for inspecting boards for microelectronics or optics by laser doppler effect
#18 | 2019-07-18 ✅ Patent 10,684,233 granted on 2020-06-16Positioning device for an integrated circuit board, and inspection apparatus for an integrated circuit board comprising such a positioning device
#19 | 2019-05-09METHOD AND SYSTEM FOR THE OPTICAL INSPECTION AND MEASUREMENT OF A FACE OF AN OBJECT
#20 | 2018-08-16 ✅ Patent 10,260,868 granted on 2019-04-16Interferometric method and system using variable fringe spacing for inspecting transparent wafers for electronics, optics or optoelectronics
#21 | 2017-10-19 ✅ Patent 9,958,261 granted on 2018-05-01Device and method for surface profilometry for the control of wafers during processing
#22 | 2017-09-28 ✅ Patent 10,240,977 granted on 2019-03-26Method for 2D/3D inspection of an object such as a wafer
#23 | 2017-09-28 ✅ Patent 10,082,425 granted on 2018-09-25Integrated chromatic confocal sensor
#24 | 2017-08-03 ✅ Patent 9,857,313 granted on 2018-01-02Method and system for inspecting wafers for electronics, optics or optoelectronics
#25 | 2016-12-29 ✅ Patent 9,897,927 granted on 2018-02-20Device and method for positioning a photolithography mask by a contactless optical method
#26 | 2015-08-27 ✅ Patent 10,074,172 granted on 2018-09-11Device and method for making dimensional measurements on multilayer objects such as wafers
#27 | 2015-08-13 ✅ Patent 10,043,266 granted on 2018-08-07Method and device for controllably revealing structures buried in objects such as wafers
Also check out UNITY SEMICONDUCTOR's (Montbonnot-Saint-Martin, France) applicant profile with 19 patent applications submitted.
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