Metris N.V.

City:

Leuven

Country:

Belgium

Published Applications:

Last publication date:

2012-02-02

Patent Grants:

Last grant date:

2013-01-08

Top Inventors for applications by Metris N.V.

These are the the leading inventors for applications assigned to Metris N.V.:

Bart Van Coppenolle 3 Linden, Belgium
Lieven De Jonge 3 Overijse, Belgium
Stephen James Crampton 2 Greater London, United Kingdom
Peter Champ 2 Pinner Middlesex, United Kingdom

Denis Vanderstraeten 2 Louvain-la-Neuve, Belgium
Kris Vallons 1 Aarschot, Belgium
Frank Thys 1 Willebroek, Belgium
Denis Vanderstraeten 1 Hamme - Mille, Belgium

Peter CHAMP 1 Pinner, United Kingdom

Recent patent applications by Metris N.V.

Metris N.V. based in Leuven, BE has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2012-02-02 ✅ Patent 8,353,059 granted on 2013-01-08

US20120026510A1

Physics

Optical scanning probe

#2 | 2009-08-13 ✅ Patent 8,117,668 granted on 2012-02-14

US20090205088A1

Physics

Optical scanning probe

#3 | 2007-02-22 ✅ Patent 7,299,145 granted on 2007-11-20

US20070043526A1

Physics

Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probe

#4 | 2006-03-07 ✅ Patent 7,009,717 granted on 2006-03-07

US10640882

Optical probe for scanning the features of an object and methods therefor

#5 | 2005-09-13 ✅ Patent 6,944,564 granted on 2005-09-13

US10435528

Method for the automatic calibration-only, or calibration and qualification simultaneously of a non-contact probe

AssigneeID:

175427 ⎘