Waldbronn
Germany
24
2022-07-14
21
2024-10-01
These are the the leading inventors for applications assigned to Polytec GmbH:
Polytec GmbH based in Waldbronn, DE has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Interferometric measurement device and interferometric method for determining the surface topography of a measurement object
#2 | 2022-06-16 ✅ Patent 12,345,563 granted on 2025-07-01METHOD AND APPARATUS FOR INTERFEROMETRIC VIBRATION MEASUREMENT AT A PLURALITY OF A MEASUREMENT POINTS BY MEANS OF A MEASURING LASER BEAM
#3 | 2021-09-09METHOD FOR DETERMINING THE PATH OF A MEASUREMENT BEAM OF AN INTERFEROMETRIC MEASURING DEVICE, AND MEASURING DEVICE FOR INTERFEROMETRIC MEASUREMENT OF AN OBJECT UNDER MEASUREMENT
#4 | 2021-09-09 ✅ Patent 11,333,485 granted on 2022-05-17Alignment method for a beam-directing unit of an interferometric measuring device, and measuring device for carrying out an interferometric measurement by means of laser radiation
#5 | 2021-08-19 ✅ Patent 12,066,321 granted on 2024-08-20Method for determining the path of a measurement beam of an interferometric measuring device, and measuring device for interferometric measurement of an object under measurement
#6 | 2017-07-13 ✅ Patent 9,910,056 granted on 2018-03-06Device and method for an interferometric measuring of an object
#7 | 2015-07-30 ✅ Patent 9,638,513 granted on 2017-05-02Device and method for the interferometric measuring of an object
#8 | 2014-11-27 ✅ Patent 9,212,896 granted on 2015-12-15Optical interferometer and vibrometer comprising such an optical interferometer
#9 | 2014-02-13 ✅ Patent 9,851,243 granted on 2017-12-26Method and device for the optical non-contact oscillation measurement of an oscillating object
#10 | 2014-01-09 ✅ Patent 9,551,726 granted on 2017-01-24Device and method for an interferometric measuring of an object
#11 | 2013-05-02 ✅ Patent 10,018,460 granted on 2018-07-10Interferometric measuring device with detectors set at different angular ranges
#12 | 2013-04-18COHERENCE GRID -- INTERFEROMETER AND METHOD FOR A SPATIALLY RESOLVED OPTIC MEASUREMENT OF THE SURFACE GEOMETRY OF AN OBJECT
#13 | 2011-04-28METHOD AND DEVICE FOR THE SPECTROMETRIC MEASUREMENT OF A MATERIAL FLOW MOVING IN THE LONGITUDINAL DIRECTION
#14 | 2011-04-21 ✅ Patent 8,913,247 granted on 2014-12-16Device and method for interferometric vibration measurement of an object
#15 | 2010-08-12 ✅ Patent 8,115,933 granted on 2012-02-14Interferometer for optically measuring an object
#16 | 2009-10-08 ✅ Patent 8,199,331 granted on 2012-06-12Vibrometer and method for optically measuring an object
#17 | 2008-12-11 ✅ Patent 7,808,646 granted on 2010-10-05Interferometer for optically measuring an object
#18 | 2008-11-27 ✅ Patent 8,111,403 granted on 2012-02-07Method and device for non-contact oscillation measurements
#19 | 2008-11-20 ✅ Patent 7,852,487 granted on 2010-12-14Heterodyne interferometer device for optically measuring an object
#20 | 2007-12-20 ✅ Patent 7,518,101 granted on 2009-04-14Scanning microscope for optically measuring an object
#21 | 2007-08-02 ✅ Patent 7,663,764 granted on 2010-02-16Measuring device and method to optically measure an object
#22 | 2006-07-18 ✅ Patent 7,079,227 granted on 2006-07-18Optical assembly to be mounted on a microscope for measuring periodic movements of a microstructure
#23 | 2006-07-18 ✅ Patent 7,079,258 granted on 2006-07-18Measurement device for non-contact detection of oscillations of an object
#24 | 2005-12-22 ✅ Patent 7,443,513 granted on 2008-10-28Apparatus for optical measurement of an object
Also check out Polytec GmbH's (Waldbronn, Germany) applicant profile with 9 patent applications submitted.
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