Ann Arbor, Michigan
United States
13
2017-01-26
13
2019-02-26
These are the the leading inventors for applications assigned to PICOMETRIX, LLC:
PICOMETRIX, LLC based in Ann Arbor, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
System for determining at least one property of a sheet dielectric sample using terahertz radiation
#2 | 2016-10-27 ✅ Patent 9,998,236 granted on 2018-06-12System for transmitting and receiving electromagnetic radiation
#3 | 2015-09-24 ✅ Patent 9,360,296 granted on 2016-06-07System for calculation of material properties using reflection terahertz radiation and an external reference structure
#4 | 2015-03-05 ✅ Patent 10,024,963 granted on 2018-07-17System and method to detect anomalies
#5 | 2012-12-06 ✅ Patent 9,588,041 granted on 2017-03-07System and method for detection and measurement of interfacial properties in single and multilayer objects
#6 | 2012-07-12 ✅ Patent 8,436,310 granted on 2013-05-07System and method reducing fiber stretch induced timing errors in fiber optic coupled time domain terahertz systems
#7 | 2010-11-04 ✅ Patent 8,457,915 granted on 2013-06-04System and method to measure the transit time position(s) of pulses in time domain data
#8 | 2008-10-23 ✅ Patent 8,390,910 granted on 2013-03-05Optical delay
#9 | 2008-04-24 ✅ Patent 9,136,419 granted on 2015-09-15Photoconductive device
#10 | 2008-03-25 ✅ Patent 7,348,608 granted on 2008-03-25Planar avalanche photodiode
#11 | 2006-10-12 ✅ Patent 7,468,503 granted on 2008-12-23Pin photodetector with mini-mesa contact layer
#12 | 2006-03-16 ✅ Patent 7,263,266 granted on 2007-08-28Precision fiber attachment
#13 | 2005-07-21 ✅ Patent 7,348,607 granted on 2008-03-25Planar avalanche photodiode
Also check out Picometrix, LLC's (Ann Arbor, United States) applicant profile with 4 patent applications submitted.
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