Heverlee
Belgium
10
2011-05-26
10
2013-02-19
These are the the leading inventors for applications assigned to ICOS VISION SYSTEMS NV:
ICOS VISION SYSTEMS NV based in Heverlee, BE has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Detecting semiconductor substrate anomalies
#2 | 2010-01-07 ✅ Patent 8,319,975 granted on 2012-11-27Methods and apparatus for wavefront manipulations and improved 3-D measurements
#3 | 2008-09-09 ✅ Patent 7,423,743 granted on 2008-09-09Method and an apparatus for measuring positions of contact elements of an electronic component
#4 | 2008-04-17 ✅ Patent 7,542,144 granted on 2009-06-02Spatial and spectral wavefront analysis and measurement
#5 | 2007-11-29 ✅ Patent 7,427,731 granted on 2008-09-23Illumination unit and method for the operation thereof
#6 | 2006-11-09 ✅ Patent 7,434,856 granted on 2008-10-14Gripper and method of operating the same
#7 | 2006-04-27 ✅ Patent 7,446,885 granted on 2008-11-04Device for measuring in three dimensions a topographical shape of an object
#8 | 2005-11-29 ✅ Patent 6,970,238 granted on 2005-11-29System for inspecting the surfaces of objects
#9 | 2005-05-05 ✅ Patent 7,327,470 granted on 2008-02-05Spatial and spectral wavefront analysis and measurement
#10 | 2005-04-07 ✅ Patent 7,361,921 granted on 2008-04-22Device and method for plane-parallel orientation of a the surface of an object to be examined in relation to a focus plane of a lens
201779 ⎘