Burlington, Massachusetts
United States
8
2011-06-30
6
2012-08-14
These are the the leading inventors for applications assigned to DFT MICROSYSTEMS, INC.:
DFT MICROSYSTEMS, INC. based in Burlington, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Methods of parametric testing in digital circuits
#2 | 2010-06-03Signal Integrity Measurement Systems and Methods Using a Predominantly Digital Time-Base Generator
#3 | 2009-08-06 ✅ Patent 7,917,319 granted on 2011-03-29Systems and methods for testing and diagnosing delay faults and for parametric testing in digital circuits
#4 | 2008-08-14System and Method for Physical-Layer Testing of High-Speed Serial Links in their Mission Environments
#5 | 2008-02-28 ✅ Patent 7,681,091 granted on 2010-03-16Signal integrity measurement systems and methods using a predominantly digital time-base generator
#6 | 2008-01-17 ✅ Patent 7,813,297 granted on 2010-10-12High-speed signal testing system having oscilloscope functionality
#7 | 2007-05-17 ✅ Patent 8,327,204 granted on 2012-12-04High-speed transceiver tester incorporating jitter injection
#8 | 2005-11-17 ✅ Patent 7,242,209 granted on 2007-07-10System and method for testing integrated circuits
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