Osaka
Japan
41
2013-08-06
41
2013-08-06
These are the the leading inventors for applications assigned to Konica Minolta Sensing, Inc.:
Konica Minolta Sensing, Inc. based in Osaka, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Spectral characteristic measuring system, spectral characteristic measuring instrument, and data processing device
#2 | 2011-09-22 ✅ Patent 8,918,298 granted on 2014-12-23Solar cell evaluation device and solar cell evaluation method
#3 | 2011-09-15 ✅ Patent 8,130,371 granted on 2012-03-06Method of calibrating reflection characteristic measuring apparatus for sheet specimen
#4 | 2011-06-02 ✅ Patent 8,390,803 granted on 2013-03-05Calibration device and optical characteristic measuring system using the same
#5 | 2010-11-04 ✅ Patent 8,345,230 granted on 2013-01-01Illumination apparatus and reflective characteristics measuring apparatus employing the same
#6 | 2010-10-14 ✅ Patent 8,373,722 granted on 2013-02-12Color measuring apparatus and method and liquid crystal display system
#7 | 2010-04-29 ✅ Patent 8,115,924 granted on 2012-02-14Optical characteristic measuring apparatus
#8 | 2010-04-15 ✅ Patent 8,243,261 granted on 2012-08-14Optical property measurement apparatus
#9 | 2010-03-18 ✅ Patent 8,144,322 granted on 2012-03-27Spectral characteristic measuring apparatus, method for calibrating spectral characteristic measuring apparatus, and spectral characteristic measuring system
#10 | 2009-10-01 ✅ Patent 8,288,739 granted on 2012-10-16Method and apparatus for measuring optical property of fluorescent sample
#11 | 2009-08-13 ✅ Patent 8,121,814 granted on 2012-02-21Three-dimensional processor and method for controlling display of three-dimensional data in the three-dimensional processor
#12 | 2009-07-16 ✅ Patent 8,441,470 granted on 2013-05-14Color sensor unit for use in display device, color measuring device for use in display device, display system incorporated with color sensor unit, and display calibration method
#13 | 2009-07-16 ✅ Patent 8,436,320 granted on 2013-05-07Fluorescence detecting apparatus, and fluorescence detecting method
#14 | 2009-05-07 ✅ Patent 7,973,935 granted on 2011-07-05Reflection characteristic measuring apparatus for sheet specimen and method of calibrating reflection characteristic measuring apparatus for sheet specimen
#15 | 2009-05-07 ✅ Patent 7,746,457 granted on 2010-06-29Light quantity measuring apparatus
#16 | 2009-03-26 ✅ Patent 7,667,856 granted on 2010-02-23Optical characteristic measuring apparatus
#17 | 2009-03-12 ✅ Patent 8,085,409 granted on 2011-12-27Surface profile measuring apparatus
#18 | 2009-03-05 ✅ Patent 7,859,663 granted on 2010-12-28Polychrometer and method for correcting stray lights of the same
#19 | 2009-02-26 ✅ Patent 7,710,559 granted on 2010-05-04Calibration reference light source and calibration system using the same
#20 | 2009-01-15 ✅ Patent 8,064,133 granted on 2011-11-22Light receiving optical system, and spectrophotometer incorporated with the same
#21 | 2008-12-04 ✅ Patent 7,697,136 granted on 2010-04-13Reflection characteristic measuring apparatus, and method for calibrating reflection characteristic measuring apparatus
#22 | 2008-10-09 ✅ Patent 8,801,621 granted on 2014-08-12Method, system and program product for analyzing pulse wave data
#23 | 2008-10-09 ✅ Patent 7,852,481 granted on 2010-12-14Apparatus and method for measuring optical property
#24 | 2008-09-18 ✅ Patent 7,916,292 granted on 2011-03-29Concave diffraction grating device, reflective dispersion device, and spectral device
#25 | 2008-09-04 ✅ Patent 7,705,983 granted on 2010-04-27Wavelength displacement correcting system
#26 | 2006-12-28 ✅ Patent 7,355,712 granted on 2008-04-08Apparatus for measuring goniometric reflection property of sample
#27 | 2006-12-28 ✅ Patent 7,471,391 granted on 2008-12-30Method for calibrating spectral characteristics of a spectral analyzer and a spectral analyzer applying said method
#28 | 2006-10-12 ✅ Patent 7,502,099 granted on 2009-03-10Measuring method and apparatus for measuring an optical property of a fluorescent sample
#29 | 2006-09-21 ✅ Patent 7,195,516 granted on 2007-03-27Battery housing structure and portable electronic apparatus
#30 | 2006-07-06 ✅ Patent 7,369,239 granted on 2008-05-06Light measuring apparatus and method for measuring monochromatic light
#31 | 2006-06-22 ✅ Patent 7,365,850 granted on 2008-04-29Two-dimensional spectroradiometer
#32 | 2006-06-22 ✅ Patent 7,339,665 granted on 2008-03-04Calibration source for calibrating spectroradiometer, calibration method using the same, and calibration system
#33 | 2006-05-25 ✅ Patent 7,369,244 granted on 2008-05-06Optical measuring apparatus, illumination system, and light detecting system
#34 | 2006-01-05 ✅ Patent 7,538,870 granted on 2009-05-26Multi-channel colorimeter and method for measuring spectral intensity characteristics
#35 | 2005-12-29 ✅ Patent 7,262,854 granted on 2007-08-28Multi-angle colorimeter
#36 | 2005-12-08 ✅ Patent 7,327,458 granted on 2008-02-05Spectral sensitivity composing system
#37 | 2005-11-10 ✅ Patent 7,454,054 granted on 2008-11-18Three-dimensional shape input device
#38 | 2005-08-18 ✅ Patent 7,508,522 granted on 2009-03-24Reflected light measuring apparatus and reflected light measuring method
#39 | 2005-04-14 ✅ Patent 7,194,374 granted on 2007-03-20Operation guide customizable measuring instrument
#40 | 2005-02-24 ✅ Patent 7,116,417 granted on 2006-10-03Spectrometer and method for correcting wavelength displacement of spectrometer
#41 | 2005-01-27 ✅ Patent 7,151,600 granted on 2006-12-19Calibration system for a spectral luminometer and a method for calibrating a spectral luminometer
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