PROFILE TECHNOLOGIES, INC.

City:

Manhasset, New York

Country:

United States

Published Applications:

Last publication date:

2011-12-08

Patent Grants:

Last grant date:

2013-10-22

Top Inventors for applications by PROFILE TECHNOLOGIES, INC.

These are the the leading inventors for applications assigned to PROFILE TECHNOLOGIES, INC.:

Charles A. Frost 5 Albuquerque, NM United States
Ronald J. Focia 2 Edgewood, NM United States
Ronald J. Focia 1 Stevens, PA United States
Gale Burnett 1 Ferndale, WA United States

Gale D. Burnett 1 Ferndale, WA United States

Recent patent applications by PROFILE TECHNOLOGIES, INC.

PROFILE TECHNOLOGIES, INC. based in Manhasset, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2011-12-08

US20110298477A1

Physics

SYSTEMS AND METHODS FOR DETECTING ANOMALIES ON INTERNAL SURFACES OF HOLLOW ELONGATE STRUCTURES USING TIME DOMAIN OR FREQUENCY DOMAIN REFLECTOMETRY

#2 | 2010-07-08 ✅ Patent 8,564,303 granted on 2013-10-22

US20100171483A1

Physics

Systems and methods for detecting anomalies in elongate members using electromagnetic back scatter

#3 | 2008-08-14 ✅ Patent 7,642,790 granted on 2010-01-05

US20080191706A1

Physics

Systems and methods for testing conductive members employing electromagnetic back scattering

#4 | 2008-06-19 ✅ Patent 7,940,061 granted on 2011-05-10

US20080143344A1

Physics

Systems and methods for detecting anomalies on internal surfaces of hollow elongate structures using time domain or frequency domain reflectometry

#5 | 2006-07-06 ✅ Patent 7,196,529 granted on 2007-03-27

US20060145704A1

Physics

Systems and methods for testing conductive members employing electromagnetic back scattering

AssigneeID:

209826 ⎘