Tokyo
Japan
161
2026-07-02
137
2024-04-23
These are the the leading inventors for applications assigned to KABUSHIKI KAISHA NIHON MICRONICS:
KABUSHIKI KAISHA NIHON MICRONICS based in Tokyo, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
SEMICONDUCTOR TESTING DEVICE AND INSPECTION SYSTEM
#2 | 2026-07-02SEMICONDUCTOR TESTING DEVICE
#3 | 2026-07-02SEMICONDUCTOR TESTING DEVICE
#4 | 2026-07-02SEMICONDUCTOR TESTING DEVICE AND INSPECTION SYSTEM
#5 | 2026-07-02SEMICONDUCTOR TESTING DEVICE, ATTACHMENT/DETACHMENT SYSTEM FOR SIGNAL TRANSMISSION UNIT, AND ATTACHMENT/DETACHMENT METHOD FOR SIGNAL TRANSMISSION UNIT
#6 | 2026-07-02SEMICONDUCTOR TESTING DEVICE AND INSPECTION SYSTEM
#7 | 2026-05-21PROBE FOR ELECTRICAL CONNECTION APPARATUS
#8 | 2026-04-30ELECTRICAL CONNECTION DEVICE
#9 | 2026-03-26ELECTRICAL CONNECTION DEVICE
#10 | 2026-03-19PROBE
#11 | 2026-01-22Locking Ring Member
#12 | 2026-01-15INSPECTION APPARATUS
#13 | 2026-01-15INSPECTION APPARATUS
#14 | 2025-12-18Inspection Apparatus
#15 | 2025-10-30ELECTRICAL CONNECTING APPARATUS
#16 | 2023-01-05 ✅ Patent 11,965,911 granted on 2024-04-23Inspection apparatus having a contactor for inspecting electrical characteristics of an object, a contactor tip position adjusting unit, and a position adjusting method therefor
#17 | 2022-12-08 ✅ Patent 11,860,190 granted on 2024-01-02Probe unit with a free length cantilever contactor and pedestal
#18 | 2022-08-18 ✅ Patent 11,874,511 granted on 2024-01-16Connecting apparatus and light condensing substrate
#19 | 2022-05-19 ✅ Patent 12,105,119 granted on 2024-10-01Electrical contactor and electrical connecting apparatus
#20 | 2022-05-12 ✅ Patent 12,244,083 granted on 2025-03-04Electrical connecting apparatus
#21 | 2022-03-31 ✅ Patent 11,747,365 granted on 2023-09-05Probe substrate and electrical connecting apparatus
#22 | 2022-03-10 ✅ Patent 11,828,773 granted on 2023-11-28Electrical connecting device
#23 | 2022-02-03 ✅ Patent 11,435,392 granted on 2022-09-06Inspection method and inspection system
#24 | 2021-12-02 ✅ Patent 11,502,472 granted on 2022-11-15Method of manufacturing electrical contactor
#25 | 2021-05-27 ✅ Patent 11,428,727 granted on 2022-08-30Prober
#26 | 2021-05-20 ✅ Patent 12,031,921 granted on 2024-07-09Measurement system
#27 | 2021-05-13 ✅ Patent 11,378,591 granted on 2022-07-05Electrical connection device
#28 | 2021-04-01 ✅ Patent 11,482,805 granted on 2022-10-25Electrical contactor, electrical connecting structure and electrical connecting apparatus
#29 | 2021-03-25METHOD FOR MANUFACTURING SECONDARY BATTERY
#30 | 2021-02-11 ✅ Patent 11,255,878 granted on 2022-02-22Electrical contactor and electrical connecting apparatus
#31 | 2021-02-11 ✅ Patent 11,372,022 granted on 2022-06-28Electrical contactor and electrical connecting apparatus
#32 | 2020-10-08 ✅ Patent 11,340,289 granted on 2022-05-24Electrical contactor and electrical connecting apparatus
#33 | 2020-06-18 ✅ Patent 11,067,602 granted on 2021-07-20Electrical connecting apparatus
#34 | 2020-06-11 ✅ Patent 10,991,933 granted on 2021-04-27Secondary battery
#35 | 2020-04-02 ✅ Patent 10,989,739 granted on 2021-04-27Probe card holder
#36 | 2020-02-27 ✅ Patent 10,989,738 granted on 2021-04-27Inspection apparatus and inspection method
#37 | 2020-02-13 ✅ Patent 10,776,556 granted on 2020-09-15Wiring board design support apparatus, method for wiring board via arrangement and storage medium recording program for wiring board via arrangement
#38 | 2020-01-23 ✅ Patent 10,962,568 granted on 2021-03-30Jig
#39 | 2020-01-09 ✅ Patent 11,085,948 granted on 2021-08-10Electric connection device
#40 | 2019-06-13 ✅ Patent 10,908,182 granted on 2021-02-02Electrical connecting apparatus and contact
#41 | 2019-05-23 ✅ Patent 10,705,122 granted on 2020-07-07Probe card
#42 | 2019-04-25 ✅ Patent 10,707,516 granted on 2020-07-07Sheet layering jig, method for manufacturing layered product, and method for manufacturing sheet-shaped secondary cell
#43 | 2019-01-17 ✅ Patent 10,892,452 granted on 2021-01-12Cell structure unit and multilayer cell
#44 | 2018-11-29 ✅ Patent 10,367,082 granted on 2019-07-30Secondary cell and method for manufacturing secondary cell
#45 | 2018-08-09 ✅ Patent 10,686,210 granted on 2020-06-16Secondary battery mounted chip manufacturing method
#46 | 2018-07-26 ✅ Patent 10,705,151 granted on 2020-07-07Intermediate structure unit for secondary cell and method for manufacturing secondary cell
#47 | 2018-06-28 ✅ Patent 10,367,140 granted on 2019-07-30Method for manufacturing secondary cell
#48 | 2017-12-21 ✅ Patent 10,295,590 granted on 2019-05-21Probe card with temperature control function, inspection apparatus using the same, and inspection method
#49 | 2017-06-15 ✅ Patent 10,101,365 granted on 2018-10-16Semiconductor module, electrical connector, and inspection apparatus
#50 | 2017-05-25 ✅ Patent 10,018,669 granted on 2018-07-10Electrical contactor and electrical connecting apparatus
#51 | 2016-09-22 ✅ Patent 9,917,330 granted on 2018-03-13Secondary battery
#52 | 2016-06-23 ✅ Patent 10,090,507 granted on 2018-10-02Secondary battery-mounted circuit chip and manufacturing method thereof
#53 | 2016-05-26 ✅ Patent 10,024,908 granted on 2018-07-17Probe and contact inspection device
#54 | 2016-05-26 ✅ Patent 10,215,801 granted on 2019-02-26Contact inspection device having a probe head and rotation restricting portions
#55 | 2016-02-11 ✅ Patent 9,865,859 granted on 2018-01-09Stacked-type secondary battery
#56 | 2015-07-09 ✅ Patent 9,778,284 granted on 2017-10-03Semiconductor probe, testing device and testing method for testing quantum battery
#57 | 2015-07-02 ✅ Patent 9,735,594 granted on 2017-08-15Charging/discharging device
#58 | 2015-07-02 ✅ Patent 10,347,893 granted on 2019-07-09Secondary battery
#59 | 2015-06-04 ✅ Patent 9,865,908 granted on 2018-01-09Electrode structure of solid type secondary battery
#60 | 2015-05-28 ✅ Patent 9,767,721 granted on 2017-09-19Inspection apparatus and inspection method
#61 | 2015-05-14 ✅ Patent 9,599,844 granted on 2017-03-21Inspection apparatus
#62 | 2015-04-23 ✅ Patent 9,748,596 granted on 2017-08-29Single layer secondary battery having a folded structure
#63 | 2015-04-23 ✅ Patent 9,535,108 granted on 2017-01-03Inspection apparatus and inspection method
#64 | 2015-03-12 ✅ Patent 9,972,862 granted on 2018-05-15Secondary battery
#65 | 2015-01-01 ✅ Patent 9,799,927 granted on 2017-10-24Repair apparatus of sheet type cell
#66 | 2014-12-25 ✅ Patent 9,476,934 granted on 2016-10-25Inspection apparatus and inspection method for inspecting a wiring board
#67 | 2014-12-18 ✅ Patent 9,341,651 granted on 2016-05-17Probe card and method for manufacturing the same
#68 | 2014-12-04 ✅ Patent 9,859,596 granted on 2018-01-02Repeatedly chargeable and dischargeable quantum battery
#69 | 2014-11-06 ✅ Patent 10,036,780 granted on 2018-07-31Evaluation apparatus and evaluation method of sheet type cell
#70 | 2014-10-30 ✅ Patent 9,164,149 granted on 2015-10-20Testing device and testing method for quantum battery using semiconductor probe
#71 | 2014-10-09 ✅ Patent 9,442,160 granted on 2016-09-13Probe assembly and probe base plate
#72 | 2014-05-29 ✅ Patent 9,638,746 granted on 2017-05-02Probe card and inspection device
#73 | 2014-05-22 ✅ Patent 9,095,071 granted on 2015-07-28Multilayer wiring board and method for manufacturing the same
#74 | 2014-05-01 ✅ Patent 9,910,089 granted on 2018-03-06Inspection unit, probe card, inspection device, and control system for inspection device
#75 | 2014-04-24 ✅ Patent 9,164,130 granted on 2015-10-20Method for manufacturing a probe
#76 | 2014-03-13 ✅ Patent 9,113,546 granted on 2015-08-18Method for manufacturing electric film body
#77 | 2014-02-13 ✅ Patent 9,146,257 granted on 2015-09-29Contact probe and probe card
#78 | 2014-01-30 ✅ Patent 9,110,098 granted on 2015-08-18Probe card and testing apparatus
#79 | 2014-01-23 ✅ Patent 9,759,744 granted on 2017-09-12Contact inspection device
#80 | 2014-01-09 ✅ Patent 9,435,854 granted on 2016-09-06Electrical contactor and contact method for the same
#81 | 2013-12-12 ✅ Patent 9,075,083 granted on 2015-07-07Probe card
#82 | 2013-12-05 ✅ Patent 9,568,500 granted on 2017-02-14Electrical test probe
#83 | 2013-10-10 ✅ Patent 9,194,886 granted on 2015-11-24Probe and probe card
#84 | 2013-09-19 ✅ Patent 9,215,810 granted on 2015-12-15Wiring base plate and method for manufacturing the same
#85 | 2013-08-15 ✅ Patent 9,116,174 granted on 2015-08-25Electrical connecting apparatus and method for assembling the same
#86 | 2013-06-27 ✅ Patent 8,851,358 granted on 2014-10-07Method for aligning plate-like members and method for manufacturing electrical connecting apparatus
#87 | 2013-06-20 ✅ Patent 9,121,869 granted on 2015-09-01Probe assembly, probe card including the same, and methods for manufacturing these
#88 | 2013-05-16 ✅ Patent 9,329,206 granted on 2016-05-03Probe card and method for manufacturing the same
#89 | 2013-05-09 ✅ Patent 9,207,260 granted on 2015-12-08Probe block, probe card and probe apparatus both having the probe block
#90 | 2013-02-28 ✅ Patent 8,699,035 granted on 2014-04-15Inspection apparatus and inspection method for light emitting device
#91 | 2012-08-23 ✅ Patent 8,721,372 granted on 2014-05-13Contact and electrical connecting apparatus
#92 | 2012-06-21 ✅ Patent 8,468,685 granted on 2013-06-25Wire forming device
#93 | 2012-06-14 ✅ Patent 8,435,045 granted on 2013-05-07Electrical connecting apparatus and method for manufacturing the same
#94 | 2012-05-24 ✅ Patent 8,460,010 granted on 2013-06-11Contact and electrical connecting apparatus
#95 | 2012-05-24 ✅ Patent 9,097,761 granted on 2015-08-04Chip stack device testing method, chip stack device rearranging unit, and chip stack device testing apparatus
#96 | 2012-03-22 ✅ Patent 8,975,908 granted on 2015-03-10Electrical test probe and probe assembly with improved probe tip
#97 | 2012-02-23 ✅ Patent 9,015,934 granted on 2015-04-28Method for manufacturing probe card
#98 | 2012-02-23 ✅ Patent 9,015,935 granted on 2015-04-28Method for manufacturing probe card
#99 | 2012-01-26 ✅ Patent 8,486,759 granted on 2013-07-16Method for forming terminal of stacked package element and method for forming stacked package
#100 | 2012-01-05 ✅ Patent 8,366,477 granted on 2013-02-05Electrical connecting apparatus and contacts used therefor
Also check out Kabushiki Kaisha Nihon Micronics' (Tokyo, Japan) applicant profile with 124 patent applications submitted.
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