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Assignee profile:

METRYX LIMITED

City:

Bristol

Country:

United Kingdom

Published Applications:

16

Last publication date:

2022-02-03

Patent Grants:

16

Last grant date:

2026-02-10

Top Inventors for applications by METRYX LIMITED

These are the the leading inventors for applications assigned to METRYX LIMITED:

Recent patent applications by METRYX LIMITED

METRYX LIMITED based in Bristol, GB has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2022-02-03 ✅ Patent 12,546,646 granted on 2026-02-10
US20220034708A1
Physics

METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF A SEMICONDUCTOR WAFER

 #2 | 2017-01-05 ✅ Patent 9,818,658 granted on 2017-11-14
US20170005019A1
Electricity

Semiconductor wafer processing methods and apparatus

 #3 | 2016-10-20 ✅ Patent 9,995,783 granted on 2018-06-12
US20160306004A1
Physics

Measurement apparatus and method

 #4 | 2016-07-07 ✅ Patent 9,903,750 granted on 2018-02-27
US20160195424A1
Physics

Method and device for determining information relating to the mass of a semiconductor wafer

 #5 | 2014-08-21 ✅ Patent 9,310,244 granted on 2016-04-12
US20140231152A1
Physics

Semiconductor wafer metrology apparatus and method

 #6 | 2014-01-16 ✅ Patent 9,423,447 granted on 2016-08-23
US20140015557A1
Physics

Measurement apparatus and method

 #7 | 2013-06-13 ✅ Patent 8,594,827 granted on 2013-11-26
US20130149800A1
Electricity

Method of controlling semiconductor device fabrication

 #8 | 2013-05-16 ✅ Patent 9,228,886 granted on 2016-01-05
US20130118816A1
Physics

Semiconductor wafer weight metrology apparatus

 #9 | 2011-08-04 ✅ Patent 8,364,302 granted on 2013-01-29
US20110190919A1
Electricity

Method of controlling semiconductor device fabrication

 #10 | 2011-05-19 ✅ Patent 8,200,447 granted on 2012-06-12
US20110119009A1
Physics

Measuring apparatus

 #11 | 2011-01-20 ✅ Patent 9,349,624 granted on 2016-05-24
US20110015773A1
Electricity

Semiconductor wafer monitoring apparatus and method

 #12 | 2010-11-11 ✅ Patent 8,357,548 granted on 2013-01-22
US20100285614A1
Physics

Semiconductor wafer metrology apparatus and method

 #13 | 2010-08-19 ✅ Patent 8,683,880 granted on 2014-04-01
US20100206098A1
Physics

Semiconductor wafer metrology apparatus and method

 #14 | 2010-06-17 ✅ Patent 8,200,353 granted on 2012-06-12
US20100147078A1
Electricity

Measuring apparatus

 #15 | 2008-04-17 ✅ Patent 7,892,863 granted on 2011-02-22
US20080087106A1
Physics

Measuring apparatus

 #16 | 2006-05-04 ✅ Patent 7,340,372 granted on 2008-03-04
US20060095228A1
Physics

Apparatus and method for investigating parameters of layers deposited on semiconductor wafers

Also check out Metryx Limited's (Bristol, United Kingdom) applicant profile with 8 patent applications submitted.

AssigneeID:

22343 ⎘