Akishima
Japan
67
2020-07-16
60
2022-08-16
These are the the leading inventors for applications assigned to JEOL Ltd.:
JEOL Ltd. based in Akishima, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Magnetic field generator and nuclear magnetic resonance apparatus
#2 | 2010-11-11 ✅ Patent 7,864,922 granted on 2011-01-04Wavelength-dispersive X-ray spectrometer
#3 | 2008-03-20 ✅ Patent 7,592,591 granted on 2009-09-22X-ray analyzer using electron beam
#4 | 2008-03-20 ✅ Patent 7,531,793 granted on 2009-05-12Tandem mass spectrometry system
#5 | 2008-02-07 ✅ Patent 7,498,573 granted on 2009-03-03Method for obtaining and processing surface analysis data
#6 | 2007-12-06 ✅ Patent 7,755,060 granted on 2010-07-13Multipole lens and method of fabricating same
#7 | 2007-09-20 ✅ Patent 7,400,144 granted on 2008-07-15Magnetic resonance force microscope
#8 | 2007-08-23NMR measurement method
#9 | 2007-07-12 ✅ Patent 7,521,688 granted on 2009-04-21Charged-particle beam instrument
#10 | 2007-07-12 ✅ Patent 7,481,099 granted on 2009-01-27Micromotion device and scanning probe microscope
#11 | 2007-06-28Apparatus for organic synthesis and reactions
#12 | 2007-05-31 ✅ Patent 7,619,220 granted on 2009-11-17Method of measuring aberrations and correcting aberrations using Ronchigram and electron microscope
#13 | 2007-05-24 ✅ Patent 7,605,378 granted on 2009-10-20Charged-particle beam system
#14 | 2007-05-24 ✅ Patent 7,420,179 granted on 2008-09-02Electron microscope
#15 | 2007-05-03Field emission electron gun
#16 | 2007-04-05 ✅ Patent 7,473,905 granted on 2009-01-06Electrostatic deflector
#17 | 2007-01-25 ✅ Patent 7,351,971 granted on 2008-04-01Charged-particle beam instrument and method of detection
#18 | 2007-01-25 ✅ Patent 7,748,052 granted on 2010-06-29Scanning probe microscope and method of operating the same
#19 | 2007-01-18 ✅ Patent 7,378,850 granted on 2008-05-27NMR probe
#20 | 2007-01-18Scanning probe microscope
#21 | 2007-01-11 ✅ Patent 7,405,568 granted on 2008-07-29Method and apparatus for digital quadrature lock-in detection in magnetic resonance
#22 | 2006-12-28 ✅ Patent 7,528,394 granted on 2009-05-05Focused ion beam system
#23 | 2006-12-28 ✅ Patent 7,566,884 granted on 2009-07-28Specimen holder for electron microscope
#24 | 2006-12-21Ion source
#25 | 2006-11-16 ✅ Patent 7,531,794 granted on 2009-05-12Method and apparatus for preparing specimen
#26 | 2006-11-16 ✅ Patent 7,459,680 granted on 2008-12-02Method of analysis using energy loss spectrometer and transmission electron microscope equipped therewith
#27 | 2006-10-05 ✅ Patent 7,202,476 granted on 2007-04-10Charged-particle beam instrument
#28 | 2006-10-05 ✅ Patent 7,351,970 granted on 2008-04-01Scanning electron microscope
#29 | 2006-09-28 ✅ Patent 7,387,016 granted on 2008-06-17Atomic force microscope and method of energy dissipation imaging using the same
#30 | 2006-09-14 ✅ Patent 7,426,779 granted on 2008-09-23Method of fabricating wire member
#31 | 2006-08-22 ✅ Patent 7,095,024 granted on 2006-08-22TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope
#32 | 2006-08-03 ✅ Patent 7,345,288 granted on 2008-03-18Sample holder and ion-beam processing system
#33 | 2006-08-03 ✅ Patent 7,355,175 granted on 2008-04-08Method and apparatus for automatically correcting charged-particle beam and method of controlling aberration corrector for charged-particle beam
#34 | 2006-07-06 ✅ Patent 7,202,471 granted on 2007-04-10Method and apparatus for mass spectrometry
#35 | 2006-06-29 ✅ Patent 7,361,909 granted on 2008-04-22Method and apparatus for correcting drift during automated FIB processing
#36 | 2006-05-11 ✅ Patent 7,605,001 granted on 2009-10-20Method of multidimensional NMR with simultaneous plural magnetization transfer, and NMR pulse sequence thereof
#37 | 2006-05-11 ✅ Patent 7,351,983 granted on 2008-04-01Focused ion beam system
#38 | 2006-03-16 ✅ Patent 7,205,551 granted on 2007-04-17Method of correcting chromatic aberrations in charged-particle beam and charged-particle beam system
#39 | 2006-03-16 ✅ Patent 7,388,365 granted on 2008-06-17Method and system for inspecting specimen
#40 | 2006-02-23 ✅ Patent 7,091,498 granted on 2006-08-15Rotating specimen holder
#41 | 2006-02-23 ✅ Patent 7,154,092 granted on 2006-12-26Method of three-dimensional image reconstruction and transmission electron microscope
#42 | 2006-02-02 ✅ Patent 7,388,198 granted on 2008-06-17Electron microscope
#43 | 2006-01-26 ✅ Patent 7,230,234 granted on 2007-06-12Orthogonal acceleration time-of-flight mass spectrometer
#44 | 2006-01-12 ✅ Patent 7,180,295 granted on 2007-02-20NMR detector and NMR spectrometer equipped therewith
#45 | 2005-12-20 ✅ Patent 6,977,369 granted on 2005-12-20Cold spray mass spectrometric device
#46 | 2005-12-15 ✅ Patent 7,241,995 granted on 2007-07-10Electron microscope equipped with magnetic microprobe
#47 | 2005-11-03 ✅ Patent 7,977,630 granted on 2011-07-12Electron microscope
#48 | 2005-10-27 ✅ Patent 7,106,059 granted on 2006-09-12Method of quantifying magnetic resonance spectrum
#49 | 2005-10-20 ✅ Patent 7,149,639 granted on 2006-12-12Method of detecting nozzle clogging and analytical instrument
#50 | 2005-09-29Charged-particle-beam lithographic system
#51 | 2005-09-29 ✅ Patent 7,329,881 granted on 2008-02-12Charged-particle beam system
#52 | 2005-09-01 ✅ Patent 7,095,031 granted on 2006-08-22Method of automatically correcting aberrations in charged-particle beam and apparatus therefor
#53 | 2005-08-25 ✅ Patent 7,049,605 granted on 2006-05-23Detector using microchannel plates and mass spectrometer
#54 | 2005-08-04 ✅ Patent 7,060,985 granted on 2006-06-13Multipole field-producing apparatus in charged-particle optical system and aberration corrector
#55 | 2005-07-21 ✅ Patent 7,145,154 granted on 2006-12-05Method of automatically correcting aberrations in charged-particle beam and apparatus therefor
#56 | 2005-06-30 ✅ Patent 7,049,609 granted on 2006-05-23Method of verifying proximity effect correction in electron beam lithography
#57 | 2005-06-09 ✅ Patent 7,278,296 granted on 2007-10-09Scanning probe microscope
#58 | 2005-06-02 ✅ Patent 7,722,818 granted on 2010-05-25Apparatus and method for preparing samples
#59 | 2005-06-02 ✅ Patent 7,049,611 granted on 2006-05-23Charged-particle beam lithographic system
#60 | 2005-05-05 ✅ Patent 6,965,112 granted on 2005-11-15Specimen holder, observation system, and method of rotating specimen
#61 | 2005-05-05 ✅ Patent 6,949,736 granted on 2005-09-27Method of multi-turn time-of-flight mass analysis
#62 | 2005-04-21 ✅ Patent 7,354,500 granted on 2008-04-08Mask and apparatus using it to prepare sample by ion milling
#63 | 2005-02-17Inspection system
#64 | 2005-02-17 ✅ Patent 7,026,614 granted on 2006-04-11Automatic methods for focus and astigmatism corrections in charged-particle beam instrument
#65 | 2005-02-10 ✅ Patent 7,012,261 granted on 2006-03-14Multipole lens, charged-particle beam instrument fitted with multipole lenses, and method of fabricating multipole lens
#66 | 2005-02-10 ✅ Patent 7,064,326 granted on 2006-06-20Electron microscope
#67 | 2005-02-03 ✅ Patent 7,034,288 granted on 2006-04-25Time-of-flight mass spectrometer
Also check out JEOL Ltd.'s (Akishima, Japan) applicant profile with 1 patent applications submitted.
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