Assignee profile:

4D TECHNOLOGY CORPORATION

City:

Tucson, Arizona

Country:

United States

Published Applications:

11

Last publication date:

2018-01-02

Patent Grants:

11

Last grant date:

2018-01-02

Top Inventors for applications by 4D TECHNOLOGY CORPORATION

These are the the leading inventors for applications assigned to 4D TECHNOLOGY CORPORATION:

Recent patent applications by 4D TECHNOLOGY CORPORATION

4D TECHNOLOGY CORPORATION based in Tucson, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2018-01-02 ✅ Patent 9,857,169 granted on 2018-01-02
US15385143
Physics

Single-step interferometric radius-of-curvature measurements utilizing short-coherence sources

#2 | 2017-08-29 ✅ Patent 9,746,316 granted on 2017-08-29
US15049080
Physics

High-resolution in-line metrology for roll-to-roll processing operations

#3 | 2010-12-09 ✅ Patent 8,351,048 granted on 2013-01-08
US20100309476A1
Physics

Linear-carrier phase-mask interferometer

#4 | 2010-06-03 ✅ Patent 8,345,258 granted on 2013-01-01
US20100134801A1
Physics

Synchronous frequency-shift mechanism in fizeau interferometer

#5 | 2008-03-13 ✅ Patent 7,675,628 granted on 2010-03-09
US20080062428A1
Physics

Synchronous frequency-shift mechanism in Fizeau interferometer

#6 | 2007-12-27 ✅ Patent 7,580,135 granted on 2009-08-25
US20070296978A1
Physics

Chromatic compensation in Fizeau interferometer

#7 | 2007-09-13 ✅ Patent 7,777,895 granted on 2010-08-17
US20070211256A1
Physics

Linear-carrier phase-mask interferometer

#8 | 2006-09-14 ✅ Patent 7,230,718 granted on 2007-06-12
US20060203251A1
Physics

Simultaneous phase-shifting fizeau interferometer

#9 | 2005-04-21 ✅ Patent 7,079,251 granted on 2006-07-18
US20050083531A1
Physics

Calibration and error correction in multi-channel imaging

#10 | 2005-03-03 ✅ Patent 7,230,717 granted on 2007-06-12
US20050046865A1
Physics

Pixelated phase-mask interferometer

#11 | 2005-03-03 ✅ Patent 7,057,737 granted on 2006-06-06
US20050046863A1
Physics

Common optical-path testing of high-numerical-aperture wavefronts

AssigneeID:

228431 ⎘