CRESTEC CORPORATION

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2010-09-09

Patent Grants:

Last grant date:

2012-04-17

Top Inventors for applications by CRESTEC CORPORATION

These are the the leading inventors for applications assigned to CRESTEC CORPORATION:

Hideyuki Ohyi 3 Tokyo, Japan
Takeshi MIYAZAKI 3 Tokyo, Japan
Takashi Obara 2 Kanagawa, Japan
Kazuhiko KOBAYASHI 2 Tokyo, Japan

Kunito Hayashi 2 Tokyo, Japan
Kazumi Furuta 1 Tokyo, Japan
Hiroyuki MIYATA 1 Kanagawa, Japan
Akira Kojima 1 Tokyo, Japan

Takeshi Miyazaki 1 {dot over (T)}okyo, Japan
Osamu MASUDA 1 Tokyo, Japan

Recent patent applications by CRESTEC CORPORATION

CRESTEC CORPORATION based in Tokyo, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2010-09-09 ✅ Patent 8,158,310 granted on 2012-04-17

US20100227200A1

Electricity

Aberration evaluation pattern, aberration evaluation method, aberration correction method, electron beam drawing apparatus, electron microscope, master, stamper, recording medium, and structure

#2 | 2010-03-25 ✅ Patent 8,232,711 granted on 2012-07-31