Issaquah, Washington
United States
22
2009-01-29
19
2010-03-23
These are the the leading inventors for applications assigned to Applied Precision, LLC:
Applied Precision, LLC based in Issaquah, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
System and method employing photokinetic techniques in cell biology imaging applications
#2 | 2009-01-29 ✅ Patent 7,608,840 granted on 2009-10-27System and method employing photokinetic techniques in cell biology imaging applications
#3 | 2008-10-09MULTI-AXIS INTEGRATION SYSTEM AND METHOD
#4 | 2007-12-20 ✅ Patent 7,770,402 granted on 2010-08-10Thermally efficient CCD camera housing
#5 | 2007-11-22 ✅ Patent 7,634,128 granted on 2009-12-15Stereoscopic three-dimensional metrology system and method
#6 | 2007-10-16 ✅ Patent 7,283,253 granted on 2007-10-16Multi-axis integration system and method
#7 | 2007-10-09 ✅ Patent 7,278,268 granted on 2007-10-09Thermally efficient CCD camera housing
#8 | 2007-08-30FLAT-FIELD, PANEL FLATTENING, AND PANEL CONNECTING METHODS
#9 | 2007-08-02 ✅ Patent 7,663,382 granted on 2010-02-16High-speed capacitor leakage measurement systems and methods
#10 | 2007-06-12 ✅ Patent 7,231,081 granted on 2007-06-12Stereoscopic three-dimensional metrology system and method
#11 | 2007-05-10 ✅ Patent 7,385,409 granted on 2008-06-10System and method of mitigating effects of component deflection in a probe card analyzer
#12 | 2007-04-26POLARIZED PHASE MICROSCOPY
#13 | 2007-01-30 ✅ Patent 7,170,307 granted on 2007-01-30System and method of mitigating effects of component deflection in a probe card analyzer
#14 | 2006-11-28 ✅ Patent 7,141,801 granted on 2006-11-28System and method of illuminating living cells for imaging
#15 | 2006-11-02 ✅ Patent 7,750,622 granted on 2010-07-06Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis and manufacture
#16 | 2006-09-05 ✅ Patent 7,102,368 granted on 2006-09-05Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture
#17 | 2006-06-13 ✅ Patent 7,062,091 granted on 2006-06-13Coordinate calibration for scanning systems
#18 | 2005-06-02 ✅ Patent 7,330,588 granted on 2008-02-12Image metrics in the statistical analysis of DNA microarray data
#19 | 2005-03-01 ✅ Patent 6,862,363 granted on 2005-03-01Image metrics in the statistical analysis of DNA microarray data
#20 | 2005-01-20 ✅ Patent 6,986,211 granted on 2006-01-17System and method of planar positioning
#21 | 2005-01-13 ✅ Patent 7,228,003 granted on 2007-06-05Flat-field, panel flattening, and panel connecting methods
#22 | 2005-01-13 ✅ Patent 7,408,176 granted on 2008-08-05System and method employing photokinetic techniques in cell biology imaging applications
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