Assignee profile:

Negevtech, Ltd.

City:

Rehovot

Country:

Israel

Published Applications:

15

Last publication date:

2009-09-10

Patent Grants:

14

Last grant date:

2009-04-28

Top Inventors for applications by Negevtech, Ltd.

These are the the leading inventors for applications assigned to Negevtech, Ltd.:

Recent patent applications by Negevtech, Ltd.

Negevtech, Ltd. based in Rehovot, IL has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2009-09-10
US20090225307A1
Physics

WAFER INSPECTION USING SHORT-PULSED CONTINUOUS BROADBAND ILLUMINATION

#2 | 2009-04-28 ✅ Patent 7,525,659 granted on 2009-04-28
US10345097
-

System for detection of water defects

#3 | 2009-01-29 ✅ Patent 8,098,372 granted on 2012-01-17
US20090030630A1
Physics

Optical inspection tool featuring multiple speed modes

#4 | 2008-06-12 ✅ Patent 7,714,998 granted on 2010-05-11
US20080137074A1
Physics

Image splitting in optical inspection systems

#5 | 2008-06-12 ✅ Patent 7,719,674 granted on 2010-05-18
US20080137073A1
Physics

Image splitting in optical inspection systems

#6 | 2008-05-01 ✅ Patent 7,916,286 granted on 2011-03-29
US20080101686A1
Physics

Defect detection through image comparison using relative measures

#7 | 2007-12-20 ✅ Patent 7,480,039 granted on 2009-01-20
US20070291256A1
Physics

Multi mode inspection method and apparatus

#8 | 2007-06-28 ✅ Patent 7,486,861 granted on 2009-02-03
US20070146694A1
Physics

Fiber optical illumination system

#9 | 2006-11-02 ✅ Patent 7,477,383 granted on 2009-01-13
US20060244956A1
Physics

System for detection of wafer defects

#10 | 2006-08-31 ✅ Patent 7,813,541 granted on 2010-10-12
US20060193507A1
Physics

Method and apparatus for detecting defects in wafers

#11 | 2006-08-31 ✅ Patent 7,804,993 granted on 2010-09-28
US20060193506A1
Physics

Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all images

#12 | 2006-01-12 ✅ Patent 7,274,444 granted on 2007-09-25
US20060007434A1
Physics

Multi mode inspection method and apparatus

#13 | 2005-08-18 ✅ Patent 7,260,298 granted on 2007-08-21
US20050180707A1
Physics

Fiber optical illumination system

#14 | 2005-05-26 ✅ Patent 7,180,586 granted on 2007-02-20
US20050110987A1
Physics

System for detection of wafer defects

#15 | 2005-05-10 ✅ Patent 6,892,013 granted on 2005-05-10
US10345096
-

Fiber optical illumination system

AssigneeID:

241678 ⎘