Fremont, California
United States
87
2026-06-04
72
2025-04-22
These are the the leading inventors for applications assigned to Aehr Test Systems:
Aehr Test Systems based in Fremont, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
ELECTRONICS TESTER
#2 | 2025-08-07TESTER APPARATUS, TESTING METHOD AND LEAKAGE DETECTION CIRCUIT
#3 | 2025-07-10SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE
#4 | 2025-06-26ELECTRONICS TESTER
#5 | 2025-05-01ELECTRONICS TESTER
#6 | 2025-03-20ELECTRONICS TESTER
#7 | 2025-03-20ELECTRONICS TESTER
#8 | 2025-03-20ELECTRONICS TESTER
#9 | 2025-03-13SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE
#10 | 2025-03-13SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE
#11 | 2025-02-06 ✅ Patent 12,282,062 granted on 2025-04-22Electronics tester
#12 | 2025-01-02 ✅ Patent 12,253,560 granted on 2025-03-18Electronics tester
#13 | 2024-12-26 ✅ Patent 12,292,484 granted on 2025-05-06Method and system for thermal control of devices in an electronics tester
#14 | 2024-12-26 ✅ Patent 12,265,136 granted on 2025-04-01Method and system for thermal control of devices in electronics tester
#15 | 2024-12-12SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD OF USE
#16 | 2024-12-05SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE
#17 | 2024-11-28SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE
#18 | 2024-11-28SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE
#19 | 2024-09-12METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS TESTER
#20 | 2024-07-11 ✅ Patent 12,298,328 granted on 2025-05-13Controlling alignment during a thermal cycle
#21 | 2024-07-04 ✅ Patent 12,584,958 granted on 2026-03-24ELECTRONICS TESTER
#22 | 2024-03-28 ✅ Patent 12,163,999 granted on 2024-12-10Apparatus for testing electronic devices
#23 | 2024-02-08 ✅ Patent 12,228,609 granted on 2025-02-18Electronics tester
#24 | 2024-02-01 ✅ Patent 12,169,217 granted on 2024-12-17Electronics tester
#25 | 2023-06-29 ✅ Patent 11,821,940 granted on 2023-11-21Electronics tester
#26 | 2023-06-01 ✅ Patent 11,977,098 granted on 2024-05-07System for testing an integrated circuit of a device and its method of use
#27 | 2022-11-24 ✅ Patent 12,326,472 granted on 2025-06-10SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE
#28 | 2022-05-05 ✅ Patent 11,860,221 granted on 2024-01-02Apparatus for testing electronic devices
#29 | 2022-04-07 ✅ Patent 11,835,575 granted on 2023-12-05Electronics tester
#30 | 2022-03-17 ✅ Patent 12,007,451 granted on 2024-06-11Method and system for thermal control of devices in an electronics tester
#31 | 2022-03-03 ✅ Patent 11,635,459 granted on 2023-04-25Electronics tester
#32 | 2021-11-25 ✅ Patent 11,592,465 granted on 2023-02-28Pressure relief valve
#33 | 2021-01-28 ✅ Patent 11,255,903 granted on 2022-02-22Apparatus for testing electronic devices
#34 | 2020-09-24 ✅ Patent 10,976,362 granted on 2021-04-13Electronics tester with power saving state
#35 | 2020-08-13 ✅ Patent 11,448,695 granted on 2022-09-20System for testing an integrated circuit of a device and its method of use
#36 | 2020-07-23 ✅ Patent 11,199,572 granted on 2021-12-14Electronics tester
#37 | 2020-01-23 ✅ Patent 11,209,497 granted on 2021-12-28Method and system for thermal control of devices in an electronics tester
#38 | 2019-11-07 ✅ Patent 11,112,429 granted on 2021-09-07Pressure relief valve
#39 | 2019-03-07 ✅ Patent 10,718,808 granted on 2020-07-21Electronics tester with current amplification
#40 | 2018-12-27 ✅ Patent 10,852,347 granted on 2020-12-01Apparatus for testing electronic devices
#41 | 2018-09-06 ✅ Patent 10,649,022 granted on 2020-05-12Electronics tester
#42 | 2018-04-26 ✅ Patent 10,401,385 granted on 2019-09-03Limiting translation for consistent substrate-to-substrate contact
#43 | 2018-04-19 ✅ Patent 10,488,437 granted on 2019-11-26Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode
#44 | 2018-03-22 ✅ Patent 10,151,793 granted on 2018-12-11Electronics tester with double-spiral thermal control passage in a thermal chuck
#45 | 2017-07-13 ✅ Patent 10,466,292 granted on 2019-11-05Method and system for thermal control of devices in an electronics tester
#46 | 2017-06-22 ✅ Patent 9,880,197 granted on 2018-01-30Controlling alignment during a thermal cycle
#47 | 2017-02-02 ✅ Patent 9,857,418 granted on 2018-01-02Electronics tester with group and individual current configurations
#48 | 2016-06-30 ✅ Patent 10,094,872 granted on 2018-10-09Apparatus for testing electronic devices
#49 | 2016-06-02 ✅ Patent 9,500,702 granted on 2016-11-22Electronics tester with hot fluid thermal control
#50 | 2016-04-21 ✅ Patent 9,874,583 granted on 2018-01-23Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode
#51 | 2016-04-14 ✅ Patent 10,677,843 granted on 2020-06-09System for testing an integrated circuit of a device and its method of use
#52 | 2015-12-24 ✅ Patent 9,316,683 granted on 2016-04-19Apparatus for testing electronic devices
#53 | 2015-10-08 ✅ Patent 9,291,668 granted on 2016-03-22Electronics tester with a valve integrally formed in a component of a portable pack
#54 | 2015-04-23 ✅ Patent 9,625,521 granted on 2017-04-18Controlling alignment during a thermal cycle
#55 | 2014-08-21 ✅ Patent 9,151,797 granted on 2015-10-06Apparatus for testing electronic devices
#56 | 2014-04-03 ✅ Patent 8,747,123 granted on 2014-06-10Apparatus for testing electronic devices
#57 | 2013-11-14 ✅ Patent 8,628,336 granted on 2014-01-14Apparatus for testing electronic devices
#58 | 2013-06-06 ✅ Patent 8,506,335 granted on 2013-08-13Apparatus for testing electronic devices
#59 | 2012-11-08 ✅ Patent 9,250,291 granted on 2016-02-02System for testing an integrated circuit of a device and its method of use
#60 | 2012-09-06 ✅ Patent 9,086,449 granted on 2015-07-21Adhesively attached stand-offs on a portable pack for an electronics tester
#61 | 2012-05-10 ✅ Patent 8,388,357 granted on 2013-03-05Apparatus for testing electronic devices
#62 | 2011-12-29 ✅ Patent 8,947,116 granted on 2015-02-03System for testing an integrated circuit of a device and its method of use
#63 | 2011-10-20 ✅ Patent 8,986,048 granted on 2015-03-24Integrated feedthrough module
#64 | 2011-06-30 ✅ Patent 8,198,909 granted on 2012-06-12Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
#65 | 2011-01-13 ✅ Patent 8,228,085 granted on 2012-07-24System for testing an integrated circuit of a device and its method of use
#66 | 2010-11-11 ✅ Patent 7,969,175 granted on 2011-06-28Separate test electronics and blower modules in an apparatus for testing an integrated circuit
#67 | 2010-09-30 ✅ Patent 8,030,957 granted on 2011-10-04System for testing an integrated circuit of a device and its method of use
#68 | 2010-08-26 ✅ Patent 8,118,618 granted on 2012-02-21Apparatus for testing electronic devices
#69 | 2010-07-15 ✅ Patent 7,928,754 granted on 2011-04-19Wafer level burn-in and electrical test system and method
#70 | 2010-05-06 ✅ Patent 7,902,846 granted on 2011-03-08Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
#71 | 2009-11-17 ✅ Patent 7,619,428 granted on 2009-11-17Wafer level burn-in and electrical test system and method
#72 | 2009-06-25 ✅ Patent 7,800,382 granted on 2010-09-21System for testing an integrated circuit of a device and its method of use
#73 | 2009-01-15 ✅ Patent 7,667,475 granted on 2010-02-23Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
#74 | 2008-06-26 ✅ Patent 7,511,521 granted on 2009-03-31Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
#75 | 2008-04-03 ✅ Patent 7,826,995 granted on 2010-11-02Apparatus for testing electronic devices
#76 | 2007-01-04 ✅ Patent 7,762,822 granted on 2010-07-27Apparatus for testing electronic devices
#77 | 2006-11-30 ✅ Patent 7,385,407 granted on 2008-06-10Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
#78 | 2006-06-22 ✅ Patent 7,541,822 granted on 2009-06-02Wafer burn-in and text employing detachable cartridge
#79 | 2006-06-15 ✅ Patent 7,053,644 granted on 2006-05-30System for testing and burning in of integrated circuits
#80 | 2006-03-16 ✅ Patent 7,303,929 granted on 2007-12-04Reloading of die carriers without removal of die carriers from sockets on test boards
#81 | 2005-06-23 ✅ Patent 7,126,363 granted on 2006-10-24Die carrier
#82 | 2005-03-17 ✅ Patent 7,301,358 granted on 2007-11-27Contactor assembly for testing electrical circuits
#83 | 2005-03-15 ✅ Patent 6,867,608 granted on 2005-03-15Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
#84 | 2005-02-22 ✅ Patent 6,859,057 granted on 2005-02-22Die carrier
#85 | 2005-02-08 ✅ Patent 6,853,209 granted on 2005-02-08Contactor assembly for testing electrical circuits
#86 | 2005-01-13 ✅ Patent 7,063,544 granted on 2006-06-20System for burn-in testing of electronic devices
#87 | 2005-01-13 ✅ Patent 7,046,022 granted on 2006-05-16Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
Also check out AEHR TEST SYSTEMS's (Fremont, United States) applicant profile with 53 patent applications submitted.
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