RAYTEX CORPORATION

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2009-08-13

Patent Grants:

Last grant date:

2009-11-10

Top Inventors for applications by RAYTEX CORPORATION

These are the the leading inventors for applications assigned to RAYTEX CORPORATION:

Kazuo Moriya 1 Tokyo, Japan
Takashi Kanno 1 Koshigaya, Japan
Kazuyuki Hiramoto 1 Tokyo, Japan
Takashi Kanno 1 Koshigaya-shi, Japan

Tsuyoshi Iwasaki 1 Yokohama-shi, Japan
Kimihiro Eguchi 1 Tokyo, Japan
Kazuo Moriya 1 Ageo-shi, Japan
Hideo Sakai 1 Tokyo, Japan

Naoyuki Nohara 1 Tokyo, Japan

Recent patent applications by RAYTEX CORPORATION

RAYTEX CORPORATION based in Tokyo, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2009-08-13

US20090201495A1

Physics

Calibration Method For Edge Inspection Apparatus

#2 | 2009-04-09 ✅ Patent 7,616,300 granted on 2009-11-10

US20090091748A1

Physics

Edge flaw detection device

#3 | 2008-05-15 ✅ Patent 7,633,617 granted on 2009-12-15

US20080111992A1

Physics

Defective particle measuring apparatus and defective particle measuring method

#4 | 2005-10-27 ✅ Patent 7,255,719 granted on 2007-08-14

US20050237529A1

Electricity

Wafer rotation device and edge flaw inspection apparataus having the device

AssigneeID:

251818 ⎘