Yavne
Israel
7
2009-12-17
6
2010-12-07
These are the the leading inventors for applications assigned to El-Mul Technologies Ltd.:
El-Mul Technologies Ltd. based in Yavne, IL has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Ion detection method and apparatus with scanning electron beam
#2 | 2009-12-03 ā Patent 7,847,268 granted on 2010-12-07Three modes particle detector
#3 | 2006-12-28 ā Patent 7,417,235 granted on 2008-08-26Particle detector for secondary ions and direct and or indirect secondary electrons
#4 | 2006-02-16 ā Patent 7,253,418 granted on 2007-08-07Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope
#5 | 2006-01-31 ā Patent 6,992,300 granted on 2006-01-31Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope
#6 | 2006-01-24 ā Patent 6,989,542 granted on 2006-01-24Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope
#7 | 2005-03-17 ā Patent 7,180,060 granted on 2007-02-20EĆB ion detector for high efficiency time-of-flight mass spectrometers
257614 ā