Rehovot
Israel
4
2008-03-20
4
2009-02-24
These are the the leading inventors for applications assigned to NOVA MEASURING INSTRUMENTS:
NOVA MEASURING INSTRUMENTS based in Rehovot, IL has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Method and system for measuring patterned structures
#2 | 2008-03-13 ✅ Patent 7,626,711 granted on 2009-12-01Method and system for measuring patterned structures
#3 | 2008-03-06 ✅ Patent 7,663,768 granted on 2010-02-16Method and system for measuring patterned structures
#4 | 2005-09-08 ✅ Patent 7,184,152 granted on 2007-02-27Optical measurements of line edge roughness
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