Assignee profile:

SensArray Corporation

City:

Santa Clara, California

Country:

United States

Published Applications:

13

Last publication date:

2008-09-18

Patent Grants:

13

Last grant date:

2010-10-26

Top Inventors for applications by SensArray Corporation

These are the the leading inventors for applications assigned to SensArray Corporation:

Recent patent applications by SensArray Corporation

SensArray Corporation based in Santa Clara, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2008-09-18 ✅ Patent 7,819,033 granted on 2010-10-26
US20080228419A1
Electricity

Process condition sensing wafer and data analysis system

#2 | 2008-09-18 ✅ Patent 8,046,193 granted on 2011-10-25
US20080228306A1
Physics

Determining process condition in substrate processing module

#3 | 2008-04-22 ✅ Patent 7,360,463 granted on 2008-04-22
US10685550
-

Process condition sensing wafer and data analysis system

#4 | 2008-04-17 ✅ Patent 7,497,134 granted on 2009-03-03
US20080087105A1
Physics

Process condition measuring device and method for measuring shear force on a surface of a substrate that undergoes a polishing or planarization process

#5 | 2008-04-17 ✅ Patent 7,698,952 granted on 2010-04-20
US20080087069A1
Physics

Pressure sensing device

#6 | 2007-11-01 ✅ Patent 7,555,948 granted on 2009-07-07
US20070251339A1
Electricity

Process condition measuring device with shielding

#7 | 2007-11-01 ✅ Patent 7,540,188 granted on 2009-06-02
US20070251338A1
Electricity

Process condition measuring device with shielding

#8 | 2007-03-01 ✅ Patent 7,855,549 granted on 2010-12-21
US20070046284A1
Electricity

Integrated process condition sensing wafer and data analysis system

#9 | 2007-01-02 ✅ Patent 7,156,924 granted on 2007-01-02
US10619731
-

System and method for heating and cooling wafer at accelerated rates

#10 | 2006-11-14 ✅ Patent 7,135,852 granted on 2006-11-14
US10837359
-

Integrated process condition sensing wafer and data analysis system

#11 | 2006-08-10 ✅ Patent 7,757,574 granted on 2010-07-20
US20060174720A1
Physics

Process condition sensing wafer and data analysis system

#12 | 2006-01-19 ✅ Patent 7,363,195 granted on 2008-04-22
US20060015294A1
Physics

Methods of configuring a sensor network

#13 | 2005-11-03 ✅ Patent 7,149,643 granted on 2006-12-12
US20050246127A1
Electricity

Integrated process condition sensing wafer and data analysis system

AssigneeID:

263025 ⎘