SILICON TEST SYSTEMS, INC.

City:

San Jose, California

Country:

United States

Published Applications:

Last publication date:

2008-10-30

Patent Grants:

Last grant date:

2012-11-06

Top Inventors for applications by SILICON TEST SYSTEMS, INC.

These are the the leading inventors for applications assigned to SILICON TEST SYSTEMS, INC.:

Romi O. Mayder 5 San Jose, CA United States

Recent patent applications by SILICON TEST SYSTEMS, INC.

SILICON TEST SYSTEMS, INC. based in San Jose, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2008-10-30 ✅ Patent 8,305,098 granted on 2012-11-06

US20080265927A1

Physics

Element usable with the method, and a standalone probe card tester formable using the method

#2 | 2008-08-14 ✅ Patent 7,768,278 granted on 2010-08-03

US20080191683A1

Physics

High impedance, high parallelism, high temperature memory test system architecture

#3 | 2008-05-01

US20080100323A1

Physics

LOW COST, HIGH PIN COUNT, WAFER SORT AUTOMATED TEST EQUIPMENT (ATE) DEVICE UNDER TEST (DUT) INTERFACE FOR TESTING ELECTRONIC DEVICES IN HIGH PARALLELISM

#4 | 2008-05-01 ✅ Patent 7,750,650 granted on 2010-07-06

US20080100291A1

Electricity

Solid high aspect ratio via hole used for burn-in boards, wafer sort probe cards, and package test load boards with electronic circuitry

#5 | 2008-05-01

US20080099232A1

Electricity

THREE-DIMENSIONAL PRINTED CIRCUIT BOARD FOR USE WITH ELECTRONIC CIRCUITRY

AssigneeID:

263715 ⎘