ADVANCED METROLOGY SYSTEMS LLC

City:

Natick, Massachusetts

Country:

United States

Published Applications:

Last publication date:

2009-05-14

Patent Grants:

Last grant date:

2010-11-23

Top Inventors for applications by ADVANCED METROLOGY SYSTEMS LLC

These are the the leading inventors for applications assigned to ADVANCED METROLOGY SYSTEMS LLC:

Alexei Maznev 3 Natick, MA United States
Alexander Mazurenko 2 Dedham, MA United States
Carlos A. Duran 1 Canton, NY United States
Michael Gostein 1 Quincy, MA United States

Peter Rosenthal 1 West Simsbury, CT United States
Zhuoyun Li 1 Shrewsbury, MA United States
Alexei Maznev 1 Natick, Russian Federation

Recent patent applications by ADVANCED METROLOGY SYSTEMS LLC

ADVANCED METROLOGY SYSTEMS LLC based in Natick, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2009-05-14 ✅ Patent 7,839,509 granted on 2010-11-23

US20090122321A1

Physics

Method of measuring deep trenches with model-based optical spectroscopy

#2 | 2008-05-29 ✅ Patent 7,499,183 granted on 2009-03-03

US20080123080A1

Physics

Method of measuring sub-micron trench structures

#3 | 2008-02-05 ✅ Patent 7,327,468 granted on 2008-02-05

US10484584

Opto-acoustic apparatus with optical heterodyning for measuring solid surfaces and thin films

#4 | 2006-09-14 ✅ Patent 7,365,864 granted on 2008-04-29

US20060203876A1

Physics

Method of determining properties of patterned thin film metal structures using transient thermal response

AssigneeID:

264906 ⎘