Advanced Metrology Systems, LLC

City:

Austin, Texas

Country:

United States

Published Applications:

Last publication date:

2009-12-10

Patent Grants:

Last grant date:

2012-05-22

Top Inventors for applications by Advanced Metrology Systems, LLC

These are the the leading inventors for applications assigned to Advanced Metrology Systems, LLC:

Alexander Mazurenko 1 Dedham, MA United States

Recent patent applications by Advanced Metrology Systems, LLC

Advanced Metrology Systems, LLC based in Austin, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2009-12-10 ✅ Patent 8,184,300 granted on 2012-05-22

US20090303496A1

Physics

Method and apparatus for reducing probe wavelength in laser excited surface acoustic wave spectroscopy

AssigneeID:

275559 ⎘