Santa Barbara, California
United States
8
2016-07-28
7
2017-01-24
These are the the leading inventors for applications assigned to MULTIPROBE, INC.:
MULTIPROBE, INC. based in Santa Barbara, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Apparatus and method for combined micro-scale and nano-scale C-V, Q-V, and I-V testing of semiconductor materials
#2 | 2013-07-04 ✅ Patent 8,800,998 granted on 2014-08-12Semiconductor wafer isolated transfer chuck
#3 | 2012-06-14 ✅ Patent 9,551,743 granted on 2017-01-24Apparatus and method for combined micro-scale and nano-scale C-V, Q-V, and I-V testing of semiconductor materials
#4 | 2010-06-17APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q-V, AND I-V TESTING OF SEMICONDUCTOR MATERIALS
#5 | 2007-04-19 ✅ Patent 7,415,868 granted on 2008-08-26Deconvolving tip artifacts using multiple scanning probes
#6 | 2006-02-16 ✅ Patent 7,444,857 granted on 2008-11-04Software synchronization of multiple scanning probes
#7 | 2005-05-12 ✅ Patent 6,951,130 granted on 2005-10-04Software synchronization of multiple scanning probes
#8 | 2005-04-19 ✅ Patent 6,880,389 granted on 2005-04-19Software synchronization of multiple scanning probes
28649 ⎘