Carrollton, Texas
United States
29
2023-11-16
28
2024-12-24
These are the the leading inventors for applications assigned to Verity Instruments, Inc.:
Verity Instruments, Inc. based in Carrollton, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
System, apparatus, and method for improved background correction and calibration of optical devices
#2 | 2023-09-07 ✅ Patent 12,449,622 granted on 2025-10-21FIBEROPTICAL CABLE ASSEMBLIES AND INTERFACES FOR SPECTROMETERS
#3 | 2023-06-22 ✅ Patent 11,885,682 granted on 2024-01-30System, apparatus, and method for spectral filtering
#4 | 2022-12-22 ✅ Patent 12,646,700 granted on 2026-06-02MULTIMODE CONFIGURABLE SPECTROMETER
#5 | 2020-08-20 ✅ Patent 10,794,763 granted on 2020-10-06Fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a wafer
#6 | 2019-11-07 ✅ Patent 11,725,985 granted on 2023-08-15Signal conversion system for optical sensors
#7 | 2019-09-05 ✅ Patent 10,763,144 granted on 2020-09-01Adaptable-modular optical sensor based process control system, and method of operation thereof
#8 | 2019-05-23 ✅ Patent 10,923,324 granted on 2021-02-16Microwave plasma source
#9 | 2019-01-10 ✅ Patent 10,679,832 granted on 2020-06-09Microwave plasma source
#10 | 2018-10-04 ✅ Patent 11,424,115 granted on 2022-08-23Multimode configurable spectrometer
#11 | 2018-08-09 ✅ Patent 10,861,755 granted on 2020-12-08System and method for measurement of complex structures
#12 | 2018-05-17 ✅ Patent 10,365,212 granted on 2019-07-30System and method for calibration of optical signals in semiconductor process systems
#13 | 2016-10-27 ✅ Patent 9,801,265 granted on 2017-10-24High dynamic range measurement system for process monitoring
#14 | 2016-09-15 ✅ Patent 9,842,726 granted on 2017-12-12Method and apparatus for the detection of arc events during the plasma processing of a wafer, surface of substrate
#15 | 2016-04-12 ✅ Patent 9,310,250 granted on 2016-04-12High dynamic range measurement system for process monitoring
#16 | 2013-01-17 ✅ Patent 9,772,226 granted on 2017-09-26Referenced and stabilized optical measurement system
#17 | 2012-02-02 ✅ Patent 9,383,323 granted on 2016-07-05Workpiece characterization system
#18 | 2010-02-11 ✅ Patent 9,997,325 granted on 2018-06-12Electron beam exciter for use in chemical analysis in processing systems
#19 | 2009-04-23 ✅ Patent 8,125,633 granted on 2012-02-28Calibration of a radiometric optical monitoring system used for fault detection and process monitoring
#20 | 2008-11-06 ✅ Patent 7,630,859 granted on 2009-12-08Method and apparatus for reducing the effects of window clouding on a viewport window in a reactive environment
#21 | 2007-05-17 ✅ Patent 7,589,843 granted on 2009-09-15Self referencing heterodyne reflectometer and method for implementing
#22 | 2007-03-29 ✅ Patent 7,545,503 granted on 2009-06-09Self referencing heterodyne reflectometer and method for implementing
#23 | 2006-12-21Method for monitoring film thickness using heterodyne reflectometry and grating interferometry
#24 | 2006-08-31 ✅ Patent 7,339,682 granted on 2008-03-04Heterodyne reflectometer for film thickness monitoring and method for implementing
#25 | 2006-08-01 ✅ Patent 7,084,979 granted on 2006-08-01Non-contact optical profilometer with orthogonal beams
#26 | 2006-05-23 ✅ Patent 7,049,156 granted on 2006-05-23System and method for in-situ monitor and control of film thickness and trench depth
#27 | 2006-01-31 ✅ Patent 6,991,514 granted on 2006-01-31Optical closed-loop control system for a CMP apparatus and method of manufacture thereof
#28 | 2005-12-13 ✅ Patent 6,975,393 granted on 2005-12-13Method and apparatus for implementing an afterglow emission spectroscopy monitor
#29 | 2005-01-06 ✅ Patent 9,386,241 granted on 2016-07-05Apparatus and method for enhancing dynamic range of charge coupled device-based spectrograph
Also check out Verity Instruments, Inc.'s (Carrollton, United States) applicant profile with 17 patent applications submitted.
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