NIKON INSTRUMENTS, INC.

City:

Melville, New York

Country:

United States

Published Applications:

Last publication date:

2005-07-21

Patent Grants:

Last grant date:

2007-05-15

Top Inventors for applications by NIKON INSTRUMENTS, INC.

These are the the leading inventors for applications assigned to NIKON INSTRUMENTS, INC.:

Fuminori Hayano 1 Phoenix, AZ United States

Recent patent applications by NIKON INSTRUMENTS, INC.

NIKON INSTRUMENTS, INC. based in Melville, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2005-07-21 ✅ Patent 7,218,399 granted on 2007-05-15

US20050157296A1

Physics

Method and apparatus for measuring optical overlay deviation

AssigneeID:

302271 ⎘