Beijing
China
12
2023-10-05
12
2025-05-27
These are the the leading inventors for applications assigned to FOCUS-EBEAM TECHNOLOGY (BEIJING) CO., LTD.:
FOCUS-EBEAM TECHNOLOGY (BEIJING) CO., LTD. based in Beijing, CN has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Electron beam system
#2 | 2023-01-26 ✅ Patent 12,224,153 granted on 2025-02-11Electron microscope
#3 | 2022-04-07 ✅ Patent 11,798,781 granted on 2023-10-24Microscope
#4 | 2021-12-16 ✅ Patent 11,508,548 granted on 2022-11-22Scanning electron microscope
#5 | 2021-07-29 ✅ Patent 11,598,732 granted on 2023-03-07Imaging system and method for specimen detection
#6 | 2021-04-15 ✅ Patent 11,075,056 granted on 2021-07-27Scanning electron microscope objective lens system and method for specimen observation
#7 | 2021-03-04 ✅ Patent 11,145,487 granted on 2021-10-12Scanning electron microscope with composite detection system and specimen detection method
#8 | 2020-07-23 ✅ Patent 10,777,382 granted on 2020-09-15Low voltage scanning electron microscope and method for specimen observation
#9 | 2020-01-30 ✅ Patent 10,699,874 granted on 2020-06-30Vacuum condition controlling apparatus, system and method for specimen observation
#10 | 2020-01-30 ✅ Patent 10,903,039 granted on 2021-01-26Vacuum condition processing apparatus, system and method for specimen observation
#11 | 2019-09-26 ✅ Patent 10,923,312 granted on 2021-02-16Magnetic lens and exciting current control method
#12 | 2019-09-19 ✅ Patent 10,879,036 granted on 2020-12-29Charged particle beam system, opto-electro simultaneous detection system and method
Also check out FOCUS-EBEAM TECHNOLOGY (BEIJING) CO., LTD.'s (Beijing, China) applicant profile with 12 patent applications submitted.
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