Layer Metrics Inc.

City:

Wilmington, Delaware

Country:

United States

Published Applications:

Last publication date:

2023-03-23

Patent Grants:

Last grant date:

Top Inventors for applications by Layer Metrics Inc.

These are the the leading inventors for applications assigned to Layer Metrics Inc.:

Dominic Murphy 1 Wilmington, DE United States

Recent patent applications by Layer Metrics Inc.

Layer Metrics Inc. based in Wilmington, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2023-03-23

US20230092539A1

Physics

SPECTROFEROMETER

AssigneeID:

335345 ⎘