Taoyuan
Taiwan
48
2024-11-21
48
2025-11-11
These are the the leading inventors for applications assigned to CHUNGHWA PRECISION TEST TECH. CO., LTD.:
CHUNGHWA PRECISION TEST TECH. CO., LTD. based in Taoyuan, TW has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE
#2 | 2023-11-02 ✅ Patent 12,181,496 granted on 2024-12-31Cantilever probe card and probe module thereof
#3 | 2023-11-02 ✅ Patent 12,092,661 granted on 2024-09-17Cantilever probe card device and elastic probe thereof
#4 | 2023-11-02 ✅ Patent 11,913,973 granted on 2024-02-27Cantilever probe card device and focusing probe thereof
#5 | 2023-11-02 ✅ Patent 11,879,912 granted on 2024-01-23Cantilever probe card and carrier thereof
#6 | 2023-10-05 ✅ Patent 12,111,336 granted on 2024-10-08Modular vertical probe card
#7 | 2023-10-05 ✅ Patent 12,203,961 granted on 2025-01-21Vertical probe card device and fence-like probe thereof
#8 | 2023-10-05 ✅ Patent 11,988,686 granted on 2024-05-21Vertical probe card and fence-like probe thereof
#9 | 2023-10-05 ✅ Patent 12,146,897 granted on 2024-11-19Vertical probe card having different probes
#10 | 2023-02-02 ✅ Patent 11,933,817 granted on 2024-03-19Probe card device and transmission structure
#11 | 2022-11-17 ✅ Patent 11,506,685 granted on 2022-11-22Probe card device and disposable adjustment film thereof
#12 | 2022-10-20 ✅ Patent 11,460,486 granted on 2022-10-04Probe card device and spring-like probe
#13 | 2022-06-02 ✅ Patent 11,536,744 granted on 2022-12-27Probe card device and dual-arm probe
#14 | 2022-05-26 ✅ Patent 11,592,466 granted on 2023-02-28Probe card device and self-aligned probe
#15 | 2022-05-05 ✅ Patent 11,699,871 granted on 2023-07-11Board-like connector, dual-arm bridge of board-like connector, and wafer testing assembly
#16 | 2022-05-05 ✅ Patent 11,747,395 granted on 2023-09-05Board-like connector, single-arm bridge of board-like connector, and wafer testing assembly
#17 | 2022-05-05 ✅ Patent 11,561,244 granted on 2023-01-24Board-like connector, dual-ring bridge of board-like connector, and wafer testing assembly
#18 | 2022-01-20 ✅ Patent 11,226,354 granted on 2022-01-18Probe card device and fence-like probe thereof
#19 | 2021-11-11 ✅ Patent 11,175,313 granted on 2021-11-16Thin-film probe card and test module thereof
#20 | 2021-10-21 ✅ Patent 11,287,446 granted on 2022-03-29Split thin-film probe card
#21 | 2021-07-22 ✅ Patent 11,204,371 granted on 2021-12-21Probe card device
#22 | 2021-07-22 ✅ Patent 11,209,461 granted on 2021-12-28Probe card device and neck-like probe thereof
#23 | 2021-04-15 ✅ Patent 11,175,312 granted on 2021-11-16Staggered probe card
#24 | 2021-01-14 ✅ Patent 11,119,139 granted on 2021-09-14Integrated circuit with antenna in package testing apparatus
#25 | 2020-09-24 ✅ Patent 11,073,537 granted on 2021-07-27Probe card device
#26 | 2020-09-17 ✅ Patent 10,779,407 granted on 2020-09-15Multilayer circuit board and manufacturing method thereof
#27 | 2020-07-23 ✅ Patent 11,009,524 granted on 2021-05-18High speed probe card device and rectangular probe
#28 | 2020-05-28 ✅ Patent 10,845,388 granted on 2020-11-24Probe card device and probe head thereof
#29 | 2020-05-21 ✅ Patent 10,845,387 granted on 2020-11-24Probe card device and matching probe thereof
#30 | 2020-03-19 ✅ Patent 10,775,412 granted on 2020-09-15Probe card testing device and testing device
#31 | 2019-12-12 ✅ Patent 11,009,526 granted on 2021-05-18Probe card device and three-dimensional signal transfer structure thereof
#32 | 2019-12-12 ✅ Patent 10,845,385 granted on 2020-11-24Probe card device
#33 | 2019-10-24 ✅ Patent 10,613,117 granted on 2020-04-07Probe card device and rectangular probe thereof
#34 | 2019-10-17 ✅ Patent 11,041,883 granted on 2021-06-22Probe card device and rectangular probe thereof
#35 | 2019-10-03 ✅ Patent 10,901,001 granted on 2021-01-26Probe card device and probe head
#36 | 2019-08-29 ✅ Patent 10,718,791 granted on 2020-07-21Probe assembly and probe structure thereof
#37 | 2019-08-29 ✅ Patent 10,705,117 granted on 2020-07-07Probe assembly and probe structure thereof
#38 | 2019-07-25 ✅ Patent 10,670,630 granted on 2020-06-02Probe card device and rectangular probe
#39 | 2019-07-11 ✅ Patent 10,605,830 granted on 2020-03-31Probe card device and rectangular probe thereof having ring-shaped branch segment
#40 | 2019-04-04 ✅ Patent 10,615,768 granted on 2020-04-07Probe assembly and capacitive space transformer thereof
#41 | 2019-03-07 ✅ Patent 10,509,057 granted on 2019-12-17Probe assembly and probe structure thereof
#42 | 2019-03-07 ✅ Patent 10,401,388 granted on 2019-09-03Probe card device and rectangular probe thereof
#43 | 2018-11-15 ✅ Patent 10,149,384 granted on 2018-12-04Support structure and manufacture method thereof
#44 | 2018-03-22 ✅ Patent 10,317,429 granted on 2019-06-11Bolt type probe
#45 | 2018-03-15 ✅ Patent 9,970,960 granted on 2018-05-15Sliding rail type probe
#46 | 2018-03-01 ✅ Patent 10,060,949 granted on 2018-08-28Probe device of vertical probe card
#47 | 2018-01-18 ✅ Patent 10,514,390 granted on 2019-12-24Probe structure
#48 | 2017-11-16 ✅ Patent 10,021,783 granted on 2018-07-10Support structure and manufacture method thereof
Also check out CHUNGHWA PRECISION TEST TECH. CO., LTD.'s (Taoyuan, Taiwan) applicant profile with 48 patent applications submitted.
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