Assignee profile:

CHUNGHWA PRECISION TEST TECH. CO., LTD.

City:

Taoyuan

Country:

Taiwan

Published Applications:

48

Last publication date:

2024-11-21

Patent Grants:

48

Last grant date:

2025-11-11

Top Inventors for applications by CHUNGHWA PRECISION TEST TECH. CO., LTD.

These are the the leading inventors for applications assigned to CHUNGHWA PRECISION TEST TECH. CO., LTD.:

Recent patent applications by CHUNGHWA PRECISION TEST TECH. CO., LTD.

CHUNGHWA PRECISION TEST TECH. CO., LTD. based in Taoyuan, TW has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2024-11-21 ✅ Patent 12,467,949 granted on 2025-11-11
US20240385221A1
Physics

CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE

#2 | 2023-11-02 ✅ Patent 12,181,496 granted on 2024-12-31
US20230349953A1
Physics

Cantilever probe card and probe module thereof

#3 | 2023-11-02 ✅ Patent 12,092,661 granted on 2024-09-17
US20230349952A1
Physics

Cantilever probe card device and elastic probe thereof

#4 | 2023-11-02 ✅ Patent 11,913,973 granted on 2024-02-27
US20230349951A1
Physics

Cantilever probe card device and focusing probe thereof

#5 | 2023-11-02 ✅ Patent 11,879,912 granted on 2024-01-23
US20230349948A1
Physics

Cantilever probe card and carrier thereof

#6 | 2023-10-05 ✅ Patent 12,111,336 granted on 2024-10-08
US20230314481A1
Physics

Modular vertical probe card

#7 | 2023-10-05 ✅ Patent 12,203,961 granted on 2025-01-21
US20230314480A1
Physics

Vertical probe card device and fence-like probe thereof

#8 | 2023-10-05 ✅ Patent 11,988,686 granted on 2024-05-21
US20230314478A1
Physics

Vertical probe card and fence-like probe thereof

#9 | 2023-10-05 ✅ Patent 12,146,897 granted on 2024-11-19
US20230314477A1
Physics

Vertical probe card having different probes

#10 | 2023-02-02 ✅ Patent 11,933,817 granted on 2024-03-19
US20230033013A1
Physics

Probe card device and transmission structure

#11 | 2022-11-17 ✅ Patent 11,506,685 granted on 2022-11-22
US20220365110A1
Physics

Probe card device and disposable adjustment film thereof

#12 | 2022-10-20 ✅ Patent 11,460,486 granted on 2022-10-04
US20220334145A1
Physics

Probe card device and spring-like probe

#13 | 2022-06-02 ✅ Patent 11,536,744 granted on 2022-12-27
US20220170960A1
Physics

Probe card device and dual-arm probe

#14 | 2022-05-26 ✅ Patent 11,592,466 granted on 2023-02-28
US20220163565A1
Physics

Probe card device and self-aligned probe

#15 | 2022-05-05 ✅ Patent 11,699,871 granted on 2023-07-11
US20220140515A1
Electricity

Board-like connector, dual-arm bridge of board-like connector, and wafer testing assembly

#16 | 2022-05-05 ✅ Patent 11,747,395 granted on 2023-09-05
US20220137124A1
Physics

Board-like connector, single-arm bridge of board-like connector, and wafer testing assembly

#17 | 2022-05-05 ✅ Patent 11,561,244 granted on 2023-01-24
US20220137095A1
Physics

Board-like connector, dual-ring bridge of board-like connector, and wafer testing assembly

#18 | 2022-01-20 ✅ Patent 11,226,354 granted on 2022-01-18
US20220018876A1
Physics

Probe card device and fence-like probe thereof

#19 | 2021-11-11 ✅ Patent 11,175,313 granted on 2021-11-16
US20210349129A1
Physics

Thin-film probe card and test module thereof

#20 | 2021-10-21 ✅ Patent 11,287,446 granted on 2022-03-29
US20210325430A1
Physics

Split thin-film probe card

#21 | 2021-07-22 ✅ Patent 11,204,371 granted on 2021-12-21
US20210223291A1
Physics

Probe card device

#22 | 2021-07-22 ✅ Patent 11,209,461 granted on 2021-12-28
US20210223289A1
Physics

Probe card device and neck-like probe thereof

#23 | 2021-04-15 ✅ Patent 11,175,312 granted on 2021-11-16
US20210109129A1
Physics

Staggered probe card

#24 | 2021-01-14 ✅ Patent 11,119,139 granted on 2021-09-14
US20210011069A1
Physics

Integrated circuit with antenna in package testing apparatus

#25 | 2020-09-24 ✅ Patent 11,073,537 granted on 2021-07-27
US20200300893A1
Physics

Probe card device

#26 | 2020-09-17 ✅ Patent 10,779,407 granted on 2020-09-15
US20200296831A1
Electricity

Multilayer circuit board and manufacturing method thereof

#27 | 2020-07-23 ✅ Patent 11,009,524 granted on 2021-05-18
US20200233014A1
Physics

High speed probe card device and rectangular probe

#28 | 2020-05-28 ✅ Patent 10,845,388 granted on 2020-11-24
US20200166543A1
Physics

Probe card device and probe head thereof

#29 | 2020-05-21 ✅ Patent 10,845,387 granted on 2020-11-24
US20200158756A1
Physics

Probe card device and matching probe thereof

#30 | 2020-03-19 ✅ Patent 10,775,412 granted on 2020-09-15
US20200088764A1
Physics

Probe card testing device and testing device

#31 | 2019-12-12 ✅ Patent 11,009,526 granted on 2021-05-18
US20190377004A1
Physics

Probe card device and three-dimensional signal transfer structure thereof

#32 | 2019-12-12 ✅ Patent 10,845,385 granted on 2020-11-24
US20190377003A1
Physics

Probe card device

#33 | 2019-10-24 ✅ Patent 10,613,117 granted on 2020-04-07
US20190324057A1
Physics

Probe card device and rectangular probe thereof

#34 | 2019-10-17 ✅ Patent 11,041,883 granted on 2021-06-22
US20190317131A1
Physics

Probe card device and rectangular probe thereof

#35 | 2019-10-03 ✅ Patent 10,901,001 granted on 2021-01-26
US20190302147A1
Physics

Probe card device and probe head

#36 | 2019-08-29 ✅ Patent 10,718,791 granted on 2020-07-21
US20190265275A1
Physics

Probe assembly and probe structure thereof

#37 | 2019-08-29 ✅ Patent 10,705,117 granted on 2020-07-07
US20190265274A1
Physics

Probe assembly and probe structure thereof

#38 | 2019-07-25 ✅ Patent 10,670,630 granted on 2020-06-02
US20190227101A1
Physics

Probe card device and rectangular probe

#39 | 2019-07-11 ✅ Patent 10,605,830 granted on 2020-03-31
US20190212367A1
Physics

Probe card device and rectangular probe thereof having ring-shaped branch segment

#40 | 2019-04-04 ✅ Patent 10,615,768 granted on 2020-04-07
US20190103850A1
Electricity

Probe assembly and capacitive space transformer thereof

#41 | 2019-03-07 ✅ Patent 10,509,057 granted on 2019-12-17
US20190072586A1
Physics

Probe assembly and probe structure thereof

#42 | 2019-03-07 ✅ Patent 10,401,388 granted on 2019-09-03
US20190072584A1
Physics

Probe card device and rectangular probe thereof

#43 | 2018-11-15 ✅ Patent 10,149,384 granted on 2018-12-04
US20180332704A1
Electricity

Support structure and manufacture method thereof

#44 | 2018-03-22 ✅ Patent 10,317,429 granted on 2019-06-11
US20180080955A1
Physics

Bolt type probe

#45 | 2018-03-15 ✅ Patent 9,970,960 granted on 2018-05-15
US20180074095A1
Physics

Sliding rail type probe

#46 | 2018-03-01 ✅ Patent 10,060,949 granted on 2018-08-28
US20180059140A1
Physics

Probe device of vertical probe card

#47 | 2018-01-18 ✅ Patent 10,514,390 granted on 2019-12-24
US20180017593A1
Physics

Probe structure

#48 | 2017-11-16 ✅ Patent 10,021,783 granted on 2018-07-10
US20170332490A1
Electricity

Support structure and manufacture method thereof

Also check out CHUNGHWA PRECISION TEST TECH. CO., LTD.'s (Taoyuan, Taiwan) applicant profile with 48 patent applications submitted.

AssigneeID:

351592 ⎘